发布求助
文献互助 智能选刊 最新文献

1988 Conference on Precision Electromagnetic Measurements最新文献

筛选
英文 中文
Precision Determination of the SI Volt at the PTB PTB处SI伏特的精确测定
1988 Conference on Precision Electromagnetic Measurements Pub Date : 1988-06-07 DOI: 10.1109/CPEM.1988.671333
V. Sienknecht, T. Funck
{"title":"Precision Determination of the SI Volt at the PTB","authors":"V. Sienknecht, T. Funck","doi":"10.1109/CPEM.1988.671333","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671333","url":null,"abstract":"The measuring system for the determination of the SI volt has been set up and first evaluations of the conversion factor of the volt have been carried out. The voltage balance and all peripheral devices perform as expected, and the applied new measuring method has proved to be suitable. Measuring results with an expected uncertainty of few parts in 10/sup 7/ will be given at the conference.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130832061","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Measurement of Nanometer Topography by Scanning Tunneling Microscope 纳米形貌的扫描隧道显微镜测量
1988 Conference on Precision Electromagnetic Measurements Pub Date : 1988-06-07 DOI: 10.1109/CPEM.1988.671326
Y. Kobayashi, S. Okayama, M. Komuro, M. Okano, S. Watanabe, A. Homma
{"title":"Measurement of Nanometer Topography by Scanning Tunneling Microscope","authors":"Y. Kobayashi, S. Okayama, M. Komuro, M. Okano, S. Watanabe, A. Homma","doi":"10.1109/CPEM.1988.671326","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671326","url":null,"abstract":"Scanning tunneling microscopes (STM) of two different types were developed for measurement of nanometer order three-dimensional topography. Topographic maps of fine grid patterns on Si substrate fabricated by focused ion-beam lithography, optical grating and a compact disk stamper were obtained with resolution of around 10 nm by using electrochemically formed tips.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126428952","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Improvements in the Absolute Determination of the Farad and the OHM at LCIE LCIE中法拉和欧姆绝对测定的改进
1988 Conference on Precision Electromagnetic Measurements Pub Date : 1988-06-07 DOI: 10.1109/CPEM.1988.671303
M. Bellon, A. Fau, L. Erard
{"title":"Improvements in the Absolute Determination of the Farad and the OHM at LCIE","authors":"M. Bellon, A. Fau, L. Erard","doi":"10.1109/CPEM.1988.671303","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671303","url":null,"abstract":"Following the 1986 experiments performed at LCIE concerning the absolute determination of the Farad and the Ohm, some improvements were made on the main parts, the calculable cylindrical capacitor, the capacitance bridges and the quadrature bridge.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"92 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126079388","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Josephon Array Voltage Calibration System: Operational Use and Verification 约瑟夫阵列电压校准系统:操作使用和验证
1988 Conference on Precision Electromagnetic Measurements Pub Date : 1988-06-07 DOI: 10.1109/CPEM.1988.671140
R. Steiner, B. Field
{"title":"Josephon Array Voltage Calibration System: Operational Use and Verification","authors":"R. Steiner, B. Field","doi":"10.1109/CPEM.1988.671140","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671140","url":null,"abstract":"A New Josephson Array System Now Maintains The U. S. Legal Volt On A Weekly Basis. The Accuracy Of The I-volt Level Of This System Was Verified To Within 0.03 Ppm In Multiple Tests Against Two Independent Resistive Dividers. The Precision In The Verification Was -limited By Uncertainties In The Divider Instruments.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116223488","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Quantized Hall Resistance Measurements 量子化霍尔电阻测量
1988 Conference on Precision Electromagnetic Measurements Pub Date : 1988-06-07 DOI: 10.1109/CPEM.1988.671305
S. Kawaji, N. Nagashima, N. Kikuchi, J. Wakabayashi, K. Inagaki, J. Kinoshita, K. Yoshihiro, C. Yamanouchi
{"title":"Quantized Hall Resistance Measurements","authors":"S. Kawaji, N. Nagashima, N. Kikuchi, J. Wakabayashi, K. Inagaki, J. Kinoshita, K. Yoshihiro, C. Yamanouchi","doi":"10.1109/CPEM.1988.671305","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671305","url":null,"abstract":"The quantized Hall resistances, R/sub H/(4), of Si MOSFETs were measured at approximately=0.5 K in a magnetic field of 15 T. The value of R/sub H/(4) was determined in terms of the Commonwealth Scientific and Industrial Research Organization (CSIRO) realization of the SI ohm. A weighted mean of three determinations gave a value for the quantity R/sub H/(4) of (6453.203,36(52)) Omega /sub SI-NML/ which can also be expressed as 6453.2(1.000,000,52(8)) Omega /sub SI-NML/. This R/sub H/(4) value gives a value for h/e/sup 2/ which is about 0.3 p.p.m. larger than the value for h/e/sup 2/ derived from the anomalous moment of the electron, using the quantum electrodynamics (QED) theory. >","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116620788","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
A New Isothermal Multijunction Differential Thermal Element Provides Fast Settling AC to DC Converters 一种新的等温多结差分热元件提供了快速解决交流到直流转换器
1988 Conference on Precision Electromagnetic Measurements Pub Date : 1988-06-07 DOI: 10.1109/CPEM.1988.671263
F. L. Katzmann
{"title":"A New Isothermal Multijunction Differential Thermal Element Provides Fast Settling AC to DC Converters","authors":"F. L. Katzmann","doi":"10.1109/CPEM.1988.671263","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671263","url":null,"abstract":"A new isothermal AC-DC transfer element has been reduced to practice. Constructed as a dual heater hot wire device it maintains high precision, with usable frequency capability beyond 100 MHz while settling to final value in several hundred milliseconds. The fast response substantially speeds operation of automated ac-dc transfer standards and precison ac digital voltmeters.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122507833","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Performance And Its Evaluation Of Optical Tracking Generator/ Optical Frequengy Synthesizer By Semiconductor Lasers 半导体激光器光跟踪发生器/光频率合成器的性能及评价
1988 Conference on Precision Electromagnetic Measurements Pub Date : 1988-06-07 DOI: 10.1109/CPEM.1988.671153
K. Kuboki, G. Shin, T. Kato, M. Ohtsu
{"title":"Performance And Its Evaluation Of Optical Tracking Generator/ Optical Frequengy Synthesizer By Semiconductor Lasers","authors":"K. Kuboki, G. Shin, T. Kato, M. Ohtsu","doi":"10.1109/CPEM.1988.671153","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671153","url":null,"abstract":"Optical tracking generator/ Optical frequency synthesizer by semiconductor lasers was developed. Residual frequency fluctuations of the heterodyne signal were 3.7(Hz) at T = 100s. Frequency of the heterodyne signal could be swept for 0.02 GHz I, B < 2.03 GHz, and overall frequency tunable range of the slave laser was 6L.3 GHz.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122589562","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
30MHz Attenuation Standard Using Binary Phase Modulation Method 使用二进制相位调制方法的30MHz衰减标准
1988 Conference on Precision Electromagnetic Measurements Pub Date : 1988-06-07 DOI: 10.1109/CPEM.1988.671245
T. Kawakami, A. Nagatsuka, I. Yokoshima
{"title":"30MHz Attenuation Standard Using Binary Phase Modulation Method","authors":"T. Kawakami, A. Nagatsuka, I. Yokoshima","doi":"10.1109/CPEM.1988.671245","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671245","url":null,"abstract":"30MHz attenuation measurement system which uses a ratio transformer as the standard attenuator instead of a piston attenuator is designed and examined. Higher accuracy at low attenuations and easier maintenance are expected in the system than in the conventional one. Homodyne detection for the binary phase modulation method and heterodyne detection for the intermediate frequency substitution method are examined for 30MHz-1KHz attenuation conversion.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122718511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Experiment on the Absolute Measurement of A Silicon Lattice Spacing at the NRLM 在NRLM上绝对测量硅晶格间距的实验
1988 Conference on Precision Electromagnetic Measurements Pub Date : 1988-06-07 DOI: 10.1109/CPEM.1988.671382
K. Nakayama, M. Tanaka, K. Kuroda
{"title":"Experiment on the Absolute Measurement of A Silicon Lattice Spacing at the NRLM","authors":"K. Nakayama, M. Tanaka, K. Kuroda","doi":"10.1109/CPEM.1988.671382","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671382","url":null,"abstract":"An improvement of the x-ray and optical interferometer system is in progress for the absolute determination of the silicon","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"392 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133545735","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
A Precision 60 GHz Open Resonator System for Permittivity and Loss Tangent Measurement of Low Absorbing Materials 用于低吸波材料介电常数和损耗正切测量的精密60 GHz开式谐振系统
1988 Conference on Precision Electromagnetic Measurements Pub Date : 1988-06-07 DOI: 10.1109/CPEM.1988.671223
M. Afsar, T. Matsui, H. Chi
{"title":"A Precision 60 GHz Open Resonator System for Permittivity and Loss Tangent Measurement of Low Absorbing Materials","authors":"M. Afsar, T. Matsui, H. Chi","doi":"10.1109/CPEM.1988.671223","DOIUrl":"https://doi.org/10.1109/CPEM.1988.671223","url":null,"abstract":"An automated open resonator system is designed and constructed to operate at 60 GHz for loss tangent and permittivity measurement of materials with loss tangent value as low as 10 micro-radians. This is accomplished by the use of a high Q cavity together with a synthesized 60 GHz Gunn oscillator source, a 56 GHz Gunn local oscillator both phase locked to a frequency standard and the heterodyne detection.","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133958065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信