2015 10th International Design & Test Symposium (IDT)最新文献

筛选
英文 中文
SoC verification platforms using HW emulation and co-modeling Testbench technologies SoC验证平台采用硬件仿真和协同建模测试平台技术
2015 10th International Design & Test Symposium (IDT) Pub Date : 2014-05-01 DOI: 10.1109/IDT.2015.7396729
Mohamed Abdelsalam, A. Salem
{"title":"SoC verification platforms using HW emulation and co-modeling Testbench technologies","authors":"Mohamed Abdelsalam, A. Salem","doi":"10.1109/IDT.2015.7396729","DOIUrl":"https://doi.org/10.1109/IDT.2015.7396729","url":null,"abstract":"Hardware-assisted verification, or emulation, delivers the capacity and performance for extremely fast, full System-on-Chip (SoC) testing. Emulation enables longer test cases and more tests to be run in less time. In doing so, it allows more design requirements to be covered while more bugs are uncovered. However, emulation is no longer only about performance and capacity. The landscape is shifting beyond these two fundamental benefits in terms of all that can be accomplished virtually with an emulator. As a result, leading electronic-design companies want to take advantage of the benefits of both megahertz verification and a fully virtual, block to SoC level accelerated verification flow. In this paper, we survey different solution methodologies that are built so far and present our SoC verification platform using HW emulation & Co-modeling Testbench technologies. High-performance, high-capacity hardware-assisted emulators and co-modeling Testbench technology can speed up to 10,000x the verification of any System-On-Chip.","PeriodicalId":321810,"journal":{"name":"2015 10th International Design & Test Symposium (IDT)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127704294","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信