2021 35th Symposium on Microelectronics Technology and Devices (SBMicro)最新文献

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Analysis of Fin Width Influence on the Carrier´s Mobility of Nanowire MOSFETs 翅片宽度对纳米线mosfet载流子迁移率的影响分析
2021 35th Symposium on Microelectronics Technology and Devices (SBMicro) Pub Date : 2021-08-23 DOI: 10.1109/SBMicro50945.2021.9585753
C. U. C. Ccoto, F. Bergamaschi, M. Pavanello
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