2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE)最新文献_第4页

Lighting Fixtures with Effect of Compensation of Jet Power 射流功率补偿效果的照明装置

2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE) Pub Date : 2018-09-01 DOI: 10.1109/APEDE.2018.8542269

V. Galushchak, S. V. Havronichev, K. Bakhtiarov

引用次数: 0

RFID Smart Shelf RFID智能货架

2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE) Pub Date : 2018-09-01 DOI: 10.1109/APEDE.2018.8542363

Y. Gimpilevich, Y. Mickhayluck, A. Savochkin, A. Schekaturin, V. Iskiv, A. Lukyanchikov, E. Levin

引用次数: 0

Electronic Analog Front End for Brain-Computer Interface 脑机接口电子模拟前端

2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE) Pub Date : 2018-09-01 DOI: 10.1109/APEDE.2018.8542263

A. Karavaev, A. Runnova, S. Kurkin, A. Hramov

引用次数: 1

Conference Proceedings 2018 2018年会议纪要

2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE) Pub Date : 2018-09-01 DOI: 10.1109/apede.2018.8542458

引用次数: 0

A Testing Device for Thin Film Electroluminescent Indicators 一种薄膜电致发光指示器测试装置

2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE) Pub Date : 2018-09-01 DOI: 10.1109/APEDE.2018.8542353

O. Maksimova, P. Nikolaev

引用次数: 0

Influence of Plasmochemical Modification of a Surface on Field Emission of Electrons of the Nanostructured Silicon Cathodic Matrixes 表面等离子体化学修饰对纳米结构硅阴极基体电子场发射的影响

2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE) Pub Date : 2018-09-01 DOI: 10.1109/APEDE.2018.8542244

R. Yafarov, V. Shanygin

引用次数: 0

Non-Standard Waveguide Calibration with the Use of LRT-Method 用lrt法标定非标准波导

2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE) Pub Date : 2018-09-01 DOI: 10.1109/APEDE.2018.8542274

A. Danilov, O. V. Lavrichev, S. Nikulin, A. I. Torgovanov

{"title":"Non-Standard Waveguide Calibration with the Use of LRT-Method","authors":"A. Danilov, O. V. Lavrichev, S. Nikulin, A. I. Torgovanov","doi":"10.1109/APEDE.2018.8542274","DOIUrl":"https://doi.org/10.1109/APEDE.2018.8542274","url":null,"abstract":"The usage of non-standard waveguides, e.g. single or double ridge waveguides, can give us big technical advantages relative to conventional solutions. The bottleneck of using such waveguides is that estimation of the measurement uncertainty is a formidable task. The most popular VNA calibration method TOSM (SOLT) uses match standard, which cannot be characterized by standard approach. The usage of TRL-method is restricted because characteristic impedance and wave propagation constant cannot be directly calculated form the geometry of some non-standard waveguide types. The authors offer LRT-method as an alternative solution for VNA calibration. New method uses minimal calibration kit like the already known TRL-method: electrically long line as match, direct waveguides connection as through, short or open as reflect standard and iterative procedure to calculate 8- or 12- error terms models. Since standard-to-non-standard waveguide adapters are used with serial produced VNAs, authors suggest to estimate uncertainty in reference to results, which were estimated in standard coaxial or rectangular waveguide with TOSM calibration.","PeriodicalId":311577,"journal":{"name":"2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133801524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Microwave Method of Heat Treatment of Parabolic Antennas 抛物面天线的微波热处理方法

2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE) Pub Date : 2018-09-01 DOI: 10.1109/APEDE.2018.8542296

V. Nefedov, D.K. Banov, V. D. Bushuev

引用次数: 0

Modeling and Dynamic Analysis of the Structure Parameters of Radio-Electronic Modules Based on the Method of Autonomous Blocks 基于自治块法的无线电电子模块结构参数建模与动态分析

2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE) Pub Date : 2018-09-01 DOI: 10.1109/APEDE.2018.8542289

D. Artamonov, A. Grishko, A. N. Litvinov, I. Kochegarov, N. V. Goryachev

{"title":"Modeling and Dynamic Analysis of the Structure Parameters of Radio-Electronic Modules Based on the Method of Autonomous Blocks","authors":"D. Artamonov, A. Grishko, A. N. Litvinov, I. Kochegarov, N. V. Goryachev","doi":"10.1109/APEDE.2018.8542289","DOIUrl":"https://doi.org/10.1109/APEDE.2018.8542289","url":null,"abstract":"In the article the technique for application of autonomous blocks for the research of dynamic processes in heterogeneous structures of radio-electronic modules under applied shock is considered. The modeling of the state dynamics of radio-electronic modules is carried out on the basis of their presentation in the form of some heterogeneous structure. As a result, a mathematical model for research of the dynamics of a heterostructure of the radio-electronic module is obtained, and an analysis of the spectral density of shock acceleration and the spectrum of natural frequencies for various pouring materials is conducted. In the process of research, it was proved that an increase in stiffness of the pouring material of the electronic module leads to a decrease in the number of natural frequencies of longitudinal vibrations in a given frequency range of external disturbances. The derivation of natural frequencies from the operating frequency range of the radio-electronic module will increase its vibration and shock resistance and, consequently, the reliability of the entire product.","PeriodicalId":311577,"journal":{"name":"2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116142739","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Dependence of the Resource of Batteries from the Inequality of the Original Electrotechnical Properties of Their Elements 从电池元素原始电工性能的不平等看电池资源的依赖性

2018 International Conference on Actual Problems of Electron Devices Engineering (APEDE) Pub Date : 2018-09-01 DOI: 10.1109/APEDE.2018.8542317

S. Grebennikov, A. Grebennikov, E. Gromova, N. Orlov

引用次数: 0