2021 IEEE Pulsed Power Conference (PPC)最新文献_第5页

Reliability of SiC MPS Diodes Under Non-Repetitive Forward Surge Current 非重复正向浪涌电流下SiC MPS二极管的可靠性

2021 IEEE Pulsed Power Conference (PPC) Pub Date : 2021-12-12 DOI: 10.1109/PPC40517.2021.9733135

Tsz Tsoi, Braydon Westmoreland, S. Bayne, Sumit Jadva

{"title":"Reliability of SiC MPS Diodes Under Non-Repetitive Forward Surge Current","authors":"Tsz Tsoi, Braydon Westmoreland, S. Bayne, Sumit Jadva","doi":"10.1109/PPC40517.2021.9733135","DOIUrl":"https://doi.org/10.1109/PPC40517.2021.9733135","url":null,"abstract":"Silicon Carbide (SiC) Merged PiN-Schottky (MPS) diodes have the benefit of conduction modulation under high current events while achieving low forward voltage and zero reverse-recovery under normal operations. Thus, the SiC MPS diodes can sustain surge currents several times larger than their average current rating, avoiding oversizing components and resulting in a more compact power electronic device. Two SiC MPS diodes were evaluated using a non-repetitive surge current testbed that delivers a square current pulse of 800 A. Five devices from each group were subjected to a ten µs current pulse every 20 seconds. The first device from each group started at lower current levels and was increased until device degradation occurred. Subsequent devices were then tested at the highest current level until degradation. Both groups have sustained currents up to 2.5 times their rated surge current rating. These devices were subjected to several thousand pulses, and their electrical characteristics, such as forward IV and reverse blocking voltage, were measured between testing intervals. Device degradation was observed as the reverse-blocking voltage has significantly decreased from preliminary measurements, but no degradation of the forward-IV curve was observed. The collected data demonstrate the device’s ability to operate under non-repetitive surge current events. Each device has sustained several hundred pulses above their rated surge current rating before any sign of degradation was detected. Device degradation becomes apparent when the leakage current increases as the MPS diode is blocking voltage. They eventually become prone to short-circuit failure due to a reduced reverse blocking voltage capability.","PeriodicalId":307571,"journal":{"name":"2021 IEEE Pulsed Power Conference (PPC)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123106910","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Combination of Skin-Effect Opening Switch and Auxiliary Opening Switches for Inductive Storages Application (Narrowband and Wideband Devices) 电感式存储应用(窄带和宽带器件)的肤效应开路开关和辅助开路开关组合

2021 IEEE Pulsed Power Conference (PPC) Pub Date : 2021-12-12 DOI: 10.1109/PPC40517.2021.9733144

O. Egorov

引用次数: 0

An Investigation of Energy Efficiency in Electrical Explosion of Aluminium Metallized Film: Particle Liberation 金属化铝膜电爆炸能量效率的研究:粒子释放

2021 IEEE Pulsed Power Conference (PPC) Pub Date : 2021-12-12 DOI: 10.1109/PPC40517.2021.9733148

B. Onyenucheya, M. Ashford, J. Zirnheld, K. Burke

引用次数: 0

Semiconductor Power Module Current Balancing Using Reinforcement Machine Learning 基于强化机器学习的半导体功率模块电流平衡

2021 IEEE Pulsed Power Conference (PPC) Pub Date : 2021-12-12 DOI: 10.1109/PPC40517.2021.9733124

B. Westmoreland, A. Bilbao, S. Bayne

引用次数: 0

Safe and Intelligent Wireless Power Transfer System 安全智能无线电力传输系统

2021 IEEE Pulsed Power Conference (PPC) Pub Date : 2021-12-12 DOI: 10.1109/PPC40517.2021.9733117

David Graves, A. Bilbao, S. Bayne

引用次数: 0

Electromagnetic Launcher 电磁弹射器

2021 IEEE Pulsed Power Conference (PPC) Pub Date : 2021-12-12 DOI: 10.1109/PPC40517.2021.9749836

P. Stone

{"title":"Electromagnetic Launcher","authors":"P. Stone","doi":"10.1109/PPC40517.2021.9749836","DOIUrl":"https://doi.org/10.1109/PPC40517.2021.9749836","url":null,"abstract":"Any Coilgun has many advantages over other electromagnetic launchers. Coilgun electric coils are placed along the channel through which a projectile moves without friction losses. The coils are switched on and off sequentially to accelerate the projectile and push it out of the channel. The projectile is also equipped with a cylindrical power coil to increase the accelerating force. For the same purpose, the inner diameter of the coil Dc is made slightly larger than the outer diameter of the projectile Dp. But this is the problem of the low energy intensity of all known coilguns. This is their bottleneck. Actually, the electromagnetic energy transferred to the inductance of the coil Lc is proportional to the square of the coil diameter Dc. At the same time, the mass of the accelerated projectile Mp is proportional to the square of the diameter of this cylindrical projectile Dp. Usually Dc = (1.1–1.3) Dp, and the hard connection between the transmitted energy and the mass of the projectile is trying to change by accelerating the ring. In this paper, a patented new type of coilgun is considered. The diameter of the coil Dc is much larger than the diameter of the projectile Dp, for example, 10 times. Ceteris paribus, this allows significantly increase the energy transferred to the coil, for the example under consideration, by 100 times. To immediately transfer this energy into the space occupied by the projectile with the diameter Dp, a non-magnetic, electrically conductive shield, for example, made of aluminum, is placed in the space Ac between the coil and the channel. The shield has a disc shape with a central hole and at least one radial cut, preventing eddy currents from closing around the coil axis. Eddy currents in the shield displace the magnetic flux from the Ac space into the coilgun channel, increasing the density of the magnetic field in comparison with the prototype hundreds of times, and the magnetic pressure on the projectile thousands of times. Similarly, with the help of a Bitter Magnet, pulsed magnetic fields with a density of thousands of Tesla are created.","PeriodicalId":307571,"journal":{"name":"2021 IEEE Pulsed Power Conference (PPC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131269753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Evaluation and Characterization of 15-kV, 4H-SiC N-Channel MOSFET for Power Conversion Applications 用于功率转换应用的15kv, 4H-SiC n沟道MOSFET的评估和特性

2021 IEEE Pulsed Power Conference (PPC) Pub Date : 2021-12-12 DOI: 10.1109/PPC40517.2021.9733055

A. Ogunniyi, M. Hinojosa, H. O’Brien, S. Ryu, Edward VanBrunt

引用次数: 0

Design and Optimization of Pulse Forming Networks for Electromagnetic Manufacturing Systems 电磁制造系统脉冲成形网络的设计与优化

2021 IEEE Pulsed Power Conference (PPC) Pub Date : 2021-12-12 DOI: 10.1109/PPC40517.2021.9733130

D. Kaushik, M. J. Thomas

{"title":"Design and Optimization of Pulse Forming Networks for Electromagnetic Manufacturing Systems","authors":"D. Kaushik, M. J. Thomas","doi":"10.1109/PPC40517.2021.9733130","DOIUrl":"https://doi.org/10.1109/PPC40517.2021.9733130","url":null,"abstract":"Electromagnetic manufacturing systems utilize an intense transient electromagnetic current pulse generated from the discharge of a pulsed power source into the tooling coil (actuator coil). The most widely used pulsed power source is a series of capacitor banks. The magnetic field produced by the pulsed current induces a large current in the workpiece to generate very high electromagnetic pressure, which is then used to achieve the required objectives. The intensity of the electromagnetic pressure on the workpiece is entirely determined by the characteristics of the pulsed power system. This system, however, has very low efficiency due to poor magnetic coupling between the tooling coil and the workpiece.The induced current in the workpiece is a strong function of the current waveform in the tooling coil (actuator coil). The quality of deformation of the workpiece depends on the magnitude and spatial distribution of the electromagnetic pressure. Therefore, we need to optimize the pulse parameters to maximize the efficiency of the manufacturing process. It requires identifying important pulse parameters such as rise time, fall time, magnitude of the current etc., and relevant control variables to achieve the required deformation during the manufacturing process.In this paper we have analyzed the forming characteristics of the workpiece with respect to the temporal variation in the magnetic pressure being applied on the workpiece. The studies are performed for a free forming experiment using a uniform pressure tooling coil.","PeriodicalId":307571,"journal":{"name":"2021 IEEE Pulsed Power Conference (PPC)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133067974","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Scrutinize of X-rays Compton Scattering Through the Classical Hartemann-Kerman Model and Dalitz-like Plots Technique 用经典hartemman - kerman模型和dalitz样图技术研究x射线的康普顿散射

2021 IEEE Pulsed Power Conference (PPC) Pub Date : 2021-12-12 DOI: 10.1109/PPC40517.2021.9733128

H. Nieto-Chaupis

引用次数: 0

Surface Charge Distribution Mapping Using an Electrostatic Probe 利用静电探针绘制表面电荷分布图

2021 IEEE Pulsed Power Conference (PPC) Pub Date : 2021-12-12 DOI: 10.2172/1845023

Micah Lapointe, B. Esser, I. Aponte, Zachary Cardenas, J. Dickens, J. Mankowski, J. Stephens, Donald Friesen, Crystal Nelson, N. Koone, D. Hattz, A. Neuber

{"title":"Surface Charge Distribution Mapping Using an Electrostatic Probe","authors":"Micah Lapointe, B. Esser, I. Aponte, Zachary Cardenas, J. Dickens, J. Mankowski, J. Stephens, Donald Friesen, Crystal Nelson, N. Koone, D. Hattz, A. Neuber","doi":"10.2172/1845023","DOIUrl":"https://doi.org/10.2172/1845023","url":null,"abstract":"Undesired accumulation of charge on dielectric materials causing electrostatic discharges can be an issue in pulsed power systems and electrical systems in general. As such, an understanding of surface charge distribution, charge accumulation, and decay is required. An in-house no-contact electrostatic probe designed with a 2 mm resolution was fabricated to measure and map surface charge distribution. Designed as a contactless instrument, the probe consisting of a metal rod and low leakage amplifier circuit probes the electric potential near the surface. A scan of the surface then provides the raw data, a potential distribution. The actual probe response - i.e., the surface charge to voltage transfer function, is accounted for in post-processing. This is accomplished via an Inverse Wien Filter - a technique often applied in image processing - to deconvolve the probe response from the measured data. A commercially available electrostatic probe, the Trek 341B meter with a 3455ET probe, capable of measuring +/- 20 kV was compared to the in-house probe that is designed to cover a wider range from +/- 35 kV. A resolution better than the simple probe resolution is achieved through the distribution’s scanning voltage method and deconvolution. Applying repeated scans, surface charge decay was tracked on various polymer materials to determine the material and environment dependence; materials included were PA6, PTFE, and others. As an example of material dependence, samples charged to 20 kV at 65% humidity experience full charge decay in approximately 45 seconds for PA5 (152 mm dia.), while it took about 100 times longer for PTFE (51 mm dia.) to observe the same decay/redistribution of charge.","PeriodicalId":307571,"journal":{"name":"2021 IEEE Pulsed Power Conference (PPC)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133625713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0