The 16th North-East Asia Symposium on Nano, Information Technology and Reliability最新文献_第4页

Agent-based modeling of knowledge sharing and used-car market 基于agent的知识共享与二手车市场建模

The 16th North-East Asia Symposium on Nano, Information Technology and Reliability Pub Date : 2011-12-22 DOI: 10.1109/NASNIT.2011.6111126

Hengdong Yang, August F. Y. Chao

引用次数: 0

A new medical training platform based on PBL method 基于PBL方法的新型医学培训平台

The 16th North-East Asia Symposium on Nano, Information Technology and Reliability Pub Date : 2011-12-22 DOI: 10.1109/NASNIT.2011.6111123

Lun-Ping Hung, Wen-Chih Chang, Lai Yi Chun, Chia-Ling Ho

引用次数: 0

FGTMR - Fine grain redundancy method for reconfigurable architectures under high failure rates 高故障率下可重构架构的细粒度冗余方法

The 16th North-East Asia Symposium on Nano, Information Technology and Reliability Pub Date : 2011-12-22 DOI: 10.1109/NASNIT.2011.6111144

Mahtab Niknahad, O. Sander, J. Becker

{"title":"FGTMR - Fine grain redundancy method for reconfigurable architectures under high failure rates","authors":"Mahtab Niknahad, O. Sander, J. Becker","doi":"10.1109/NASNIT.2011.6111144","DOIUrl":"https://doi.org/10.1109/NASNIT.2011.6111144","url":null,"abstract":"For each new device generation based on smaller structures Single Event Errors (SEE) and intrinsic device faults gain more and more importance as device sensitivity increases. Triple Modular Redundancy (TMR) is a common reliability methodology for mitigating upsets and failures in architectures like modern Field Programmable Gate Arrays (FPGA). However for new device generations simply replicating complete systems may not be su#cient anymore especially in harsh environments, such as space applications, as higher failure rates may disturb a second instance before the faulty first one recovers. In this paper we focus on the Single Event Upset(SEU) mitigation challenges in nano scale architectures which can result in crucial situations. Our approach transforms the classical idea of TMR on module level down to a technological view based on FPGA architecture primitives. Such a fine grain approach allows to cope with several of the challenges caused by shrinking devices. This way the design can especially recover from multiple failures including Multiple Bit Upsets(MBUs). Moreover, we show how our approach can be integrated into standard tool flows thereby introducing TMR automatically. Finally we extend our idea to MBU tolerance by experiments.","PeriodicalId":307170,"journal":{"name":"The 16th North-East Asia Symposium on Nano, Information Technology and Reliability","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122212347","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

Business-rating based SLA model for SOA quality 基于业务等级的SOA质量SLA模型

The 16th North-East Asia Symposium on Nano, Information Technology and Reliability Pub Date : 2011-12-22 DOI: 10.1007/978-3-642-27210-3_6

Youngkon Lee

引用次数: 0