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2007 Design, Automation & Test in Europe Conference & Exhibition最新文献

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An Efficient Methodology for Hierarchical Synthesis of Mixed-Signal Systems with Fully Integrated Building Block Topology Selection 一种具有完全集成构建块拓扑选择的混合信号系统分层综合的有效方法
2007 Design, Automation & Test in Europe Conference & Exhibition Pub Date : 2007-04-16 DOI: 10.1109/DATE.2007.364571
T. Eeckelaert, R. Schoofs, G. Gielen, M. Steyaert, W. Sansen
{"title":"An Efficient Methodology for Hierarchical Synthesis of Mixed-Signal Systems with Fully Integrated Building Block Topology Selection","authors":"T. Eeckelaert, R. Schoofs, G. Gielen, M. Steyaert, W. Sansen","doi":"10.1109/DATE.2007.364571","DOIUrl":"https://doi.org/10.1109/DATE.2007.364571","url":null,"abstract":"A hierarchical synthesis methodology for analog and mixed-signal systems is presented that fully in a novel way integrates topology selection at all levels. A hierarchical system optimizer takes multiple topologies for all the building blocks at each hierarchical abstraction level, and generates optimal topology combinations using multi-objective evolutionary optimization techniques. With the presented methodology, system-level performance trade-offs can be generated where each design point contains valuable information on how the systems performances are influenced by different combinations of lower-level building block topologies. The generated system designs can contain all kinds of topology combinations as long as critical inter-block constraints are met. Different topologies can be assigned to building blocks with the same functional behavior, leading to more optimal hybrid designs than typically obtained in manual designs. In the experimental results, three different integrator topologies are used to generate an optimal system-level exploration trade-off for a complex high-speed DeltaSigma A/D modulator","PeriodicalId":298961,"journal":{"name":"2007 Design, Automation & Test in Europe Conference & Exhibition","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123111812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Random Sampling of Moment Graph: A Stochastic Krylov-Reduction Algorithm 矩图的随机抽样:一种随机krylov约简算法
2007 Design, Automation & Test in Europe Conference & Exhibition Pub Date : 2007-04-16 DOI: 10.1145/1266366.1266696
Zhenhai Zhu, J. Phillips
{"title":"Random Sampling of Moment Graph: A Stochastic Krylov-Reduction Algorithm","authors":"Zhenhai Zhu, J. Phillips","doi":"10.1145/1266366.1266696","DOIUrl":"https://doi.org/10.1145/1266366.1266696","url":null,"abstract":"In this paper we introduce a new algorithm for model order reduction in the presence of parameter or process variation. Our analysis is performed using a graph interpretation of the multi-parameter moment matching approach, leading to a computational technique based on random sampling of moment graph (RSMG). Using this technique, we have developed a new algorithm that combines the best aspects of recently proposed parameterized moment-matching and approximate TBR procedures. RSMG attempts to avoid both exponential growth of computational complexity and multiple matrix factorizations, the primary drawbacks of existing methods, and illustrates good ability to tailor algorithms to apply computational effort where needed. Industry examples are used to verify our new algorithms","PeriodicalId":298961,"journal":{"name":"2007 Design, Automation & Test in Europe Conference & Exhibition","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116768100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 21
Formal Verification of a Pervasive Interconnect Bus System in a High-Performance Microprocessor 高性能微处理器中普适互连总线系统的形式化验证
2007 Design, Automation & Test in Europe Conference & Exhibition Pub Date : 2007-04-16 DOI: 10.1109/DATE.2007.364594
T. Le, Tilman Glökler, J. Baumgartner
{"title":"Formal Verification of a Pervasive Interconnect Bus System in a High-Performance Microprocessor","authors":"T. Le, Tilman Glökler, J. Baumgartner","doi":"10.1109/DATE.2007.364594","DOIUrl":"https://doi.org/10.1109/DATE.2007.364594","url":null,"abstract":"In our high-performance powerPC* processor, the correctness of the so-called pervasive interconnect bus system, which provides, among others, test and debug access via external interfaces like JTAG, is of utmost importance. In this paper, we describe our approach informally verifying the correctness of this bus system to combat the coverage problem of simulation-based techniques. The bus system and the associated arbitration logic support several functionalities such as deadlock detection and resolution. In order to efficiently complete all of the required formal analysis for verification, we needed to leverage a variety of proof and semi-formal algorithms, as well as reduction and abstraction algorithms. Experimental results are provided to show the efficiency of this approach","PeriodicalId":298961,"journal":{"name":"2007 Design, Automation & Test in Europe Conference & Exhibition","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127449617","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Improve CAM Power Efficiency Using Decoupled Match Line Scheme 采用解耦匹配线方案提高凸轮功率效率
2007 Design, Automation & Test in Europe Conference & Exhibition Pub Date : 2007-04-16 DOI: 10.1109/DATE.2007.364585
Yen-Jen Chang, Yuan-Hong Liao, S. Ruan
{"title":"Improve CAM Power Efficiency Using Decoupled Match Line Scheme","authors":"Yen-Jen Chang, Yuan-Hong Liao, S. Ruan","doi":"10.1109/DATE.2007.364585","DOIUrl":"https://doi.org/10.1109/DATE.2007.364585","url":null,"abstract":"Content addressable memory (CAM) is widely used in many applications that require fast table lookup. Due to the parallel comparison feature and high frequency of lookup, however, the power consumption of CAM is usually significant. In this paper we propose a decoupled match line scheme which combines the performance advantage of the traditional NOR-type CAM and the power efficiency of the traditional NAND-type CAM. In our design, a CAM word is divided into two segments, and then all the CAM cells are decoupled from the match line. By minimizing both the match line capacitances and switching activities, our design can largely reduce the CAM power dissipated in search operations. The results measured from the fabricated chip show that without any performance penalty our design can reduce the search energy consumption of the CAM by 89% compared to the traditional NOR-type CAM design","PeriodicalId":298961,"journal":{"name":"2007 Design, Automation & Test in Europe Conference & Exhibition","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124836383","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Scratchpad memories vs locked caches in hard real-time systems: a quantitative comparison 硬实时系统中的刮板存储器与锁定缓存:定量比较
2007 Design, Automation & Test in Europe Conference & Exhibition Pub Date : 2007-04-16 DOI: 10.1145/1266366.1266692
I. Puaut, Christophe Pais
{"title":"Scratchpad memories vs locked caches in hard real-time systems: a quantitative comparison","authors":"I. Puaut, Christophe Pais","doi":"10.1145/1266366.1266692","DOIUrl":"https://doi.org/10.1145/1266366.1266692","url":null,"abstract":"We propose in this paper an algorithm for off-line selection of the contents of on-chip memories. The algorithm supports two types of on-chip memories, namely locked caches and scratchpad memories. The contents of on-chip memory, although selected off-line, is changed at run-time, for the sake of scalability with respect to task size. Experimental results show that the algorithm yields to good ratios of on-chip memory accesses on the worst-case execution path, with a tolerable reload overhead, for both types of on-chip memories. Furthermore, we highlight the circumstances under which one type of on-chip memory is more appropriate than the other depending of architectural parameters (cache block size) and application characteristics (basic block size)","PeriodicalId":298961,"journal":{"name":"2007 Design, Automation & Test in Europe Conference & Exhibition","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126179809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 146
A Novel Technique to Use Scratch-pad Memory for Stack Management 一种利用刮刮板存储器进行堆栈管理的新技术
2007 Design, Automation & Test in Europe Conference & Exhibition Pub Date : 2007-04-16 DOI: 10.1145/1266366.1266691
Soyoung Park, Hae-woo Park, S. Ha
{"title":"A Novel Technique to Use Scratch-pad Memory for Stack Management","authors":"Soyoung Park, Hae-woo Park, S. Ha","doi":"10.1145/1266366.1266691","DOIUrl":"https://doi.org/10.1145/1266366.1266691","url":null,"abstract":"Extensive work has been done for optimal management of scratch-pad memory (SPM) all assuming that the SPM is assigned a fixed address space. The main target objects to be placed on the SPM have been code and global memory since their sizes and locations are not changed dynamically. We propose a novel idea of dynamic address mapping of SPM with the assistance of memory management unit (MMU). It allows us to use SPM for stack management without architecture modification and complier assistance. The proposed technique is orthogonal to the previous works so can be used at the same time. Experiments results show that the proposed technique results in average performance improvement of 13% and energy savings of 12% observed compared to using only external DRAM. And it also gives noticeable speed up and energy saving against a typical cache solution for stack data","PeriodicalId":298961,"journal":{"name":"2007 Design, Automation & Test in Europe Conference & Exhibition","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123316477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 34
Overcoming Glitches and Dissipation Timing Skews in Design of DPA-Resistant Cryptographic Hardware 抗dpa密码硬件设计中克服故障和耗散时序偏差
2007 Design, Automation & Test in Europe Conference & Exhibition Pub Date : 2007-04-16 DOI: 10.1145/1266366.1266643
K. Lin, Shan-Chien Fang, Shih Hsien Yang, C. Lo
{"title":"Overcoming Glitches and Dissipation Timing Skews in Design of DPA-Resistant Cryptographic Hardware","authors":"K. Lin, Shan-Chien Fang, Shih Hsien Yang, C. Lo","doi":"10.1145/1266366.1266643","DOIUrl":"https://doi.org/10.1145/1266366.1266643","url":null,"abstract":"Cryptographic embedded systems are vulnerable to differential power analysis (DPA) attacks. This paper propose a logic design style, called as pre-charge masked Reed-Muller logic (PMRML) to overcome the glitch and dissipation timing skew (DTS) problems in design of DPA-resistant cryptographic hardware. Both problems can significantly reduce the DPA-resistance. To our knowledge, the DTS problem and its countermeasure have not been reported. The PMRML design can be fully realized using common CMOS standard cell libraries. Furthermore, it can be used to implement universal functions since any Boolean function can be represented as the Reed-Muller form. An AES encryption module was implemented with multi-stage PMRML. The results show the efficiency and effectiveness of the PMRML design methodology","PeriodicalId":298961,"journal":{"name":"2007 Design, Automation & Test in Europe Conference & Exhibition","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123467020","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Event Driven Data Processing Architecture 事件驱动数据处理体系结构
2007 Design, Automation & Test in Europe Conference & Exhibition Pub Date : 2007-04-16 DOI: 10.1109/DATE.2007.364419
I. Soderquist
{"title":"Event Driven Data Processing Architecture","authors":"I. Soderquist","doi":"10.1109/DATE.2007.364419","DOIUrl":"https://doi.org/10.1109/DATE.2007.364419","url":null,"abstract":"This paper describes a data processing architecture where events and time are in focus. This differs from traditional von Neumann and data flow architectures. New instruction codes are defined and special circuitry is introduced to express and execute event and time operations. This results in reconfigurable software controlled functionality together with real-time performance comparable to dedicated VLSI solutions. The architecture is demonstrated in a real-time radar jammer application. The architecture is promising also for applications as routers and network processors. A prototype system on silicon (SoC), complete with signal memory, instruction memory, four processing units in parallel and interfaces for digitized signals and host computer, is fabricated in 0.35 mum standard CMOS. Time events of signal data on two simultaneous 8-bit links can be programmed with a time resolution of one clock period. Measurements verified correct function and performance above 400 MHz clock frequency at 3.3 Volt supply. Power consumption is 3.6-Watt @320 MHz","PeriodicalId":298961,"journal":{"name":"2007 Design, Automation & Test in Europe Conference & Exhibition","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114960012","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Low-SER Efficient Core Processor Architecture for Future Technologies 面向未来技术的低ser高效核心处理器架构
2007 Design, Automation & Test in Europe Conference & Exhibition Pub Date : 2007-04-16 DOI: 10.1145/1266366.1266682
E. Rhod, C. Lisbôa, L. Carro
{"title":"A Low-SER Efficient Core Processor Architecture for Future Technologies","authors":"E. Rhod, C. Lisbôa, L. Carro","doi":"10.1145/1266366.1266682","DOIUrl":"https://doi.org/10.1145/1266366.1266682","url":null,"abstract":"Device scaling in new and future technologies brings along severe increase in the soft error rate of circuits, for combinational and sequential logic. Although potential solutions have started to be investigated by the community, the full use of future resources in circuits tolerant to SETs, without performance, area or power penalties, is still an open research issue. This paper introduces MemProc, an embedded core processor with extra low SER sensitivity, and with no performance or area penalty when compared to its RISC counterpart. Central to the SER reduction are the use of new magnetic memories (MRAM and FRAM) and the minimization of the combinational logic area in the core. This paper shows the results of fault injection in the MemProc core processor and in a RISC machine, and compares performance and area of both approaches. Experimental results show a 29 times increase in fault tolerance, with up to 3.75 times in performance gains and 14 times less sensible area","PeriodicalId":298961,"journal":{"name":"2007 Design, Automation & Test in Europe Conference & Exhibition","volume":"136 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116391266","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
An ADC-BiST Scheme Using Sequential Code Analysis 基于顺序码分析的ADC-BiST方案
2007 Design, Automation & Test in Europe Conference & Exhibition Pub Date : 2007-04-16 DOI: 10.1109/DATE.2007.364679
E. Erdogan, S. Ozev
{"title":"An ADC-BiST Scheme Using Sequential Code Analysis","authors":"E. Erdogan, S. Ozev","doi":"10.1109/DATE.2007.364679","DOIUrl":"https://doi.org/10.1109/DATE.2007.364679","url":null,"abstract":"This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysis method is an alternative to histogram based analysis techniques to provide test time improvements, especially when the resources are scarce. In addition to the measurement of DNL and INL, non-monotonic behavior can also be detected with the proposed technique. We present two implementation options based on how much on-chip resources are available. The ramp generator has a high linearity over a full-scale range of IV and the generated ramp signal is capable of testing 13-bit ADCs. The circuit implementation of the ramp generator utilizes a feedback configuration to improve the linearity having an area of 0.017mm2 in 0.5mum process","PeriodicalId":298961,"journal":{"name":"2007 Design, Automation & Test in Europe Conference & Exhibition","volume":"146 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116436713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 28
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