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2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)最新文献

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Telecommunication Slot Antenna Based on a Low-Profile SIW Structure 基于低轮廓SIW结构的电信槽天线
2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech) Pub Date : 2018-10-01 DOI: 10.1109/EEXPOLYTECH.2018.8564367
Ekaterina Kiseleva, A. Sochava, A. Cherepanov
{"title":"Telecommunication Slot Antenna Based on a Low-Profile SIW Structure","authors":"Ekaterina Kiseleva, A. Sochava, A. Cherepanov","doi":"10.1109/EEXPOLYTECH.2018.8564367","DOIUrl":"https://doi.org/10.1109/EEXPOLYTECH.2018.8564367","url":null,"abstract":"A new slot antenna on a basis of SIW structure (Substrate Integrated Waveguide) has been proposed, which is compatible with PCB technology. Models of the antenna with two and four slots have been studied, using computer simulation.","PeriodicalId":296618,"journal":{"name":"2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123531789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
On Binarization of Images at the Pavement Defects Recognition 路面缺陷识别中图像二值化的研究
2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech) Pub Date : 2018-10-01 DOI: 10.1109/EEXPOLYTECH.2018.8564396
B. Shumilov, Yuliya Gerasimova, A. Makarov
{"title":"On Binarization of Images at the Pavement Defects Recognition","authors":"B. Shumilov, Yuliya Gerasimova, A. Makarov","doi":"10.1109/EEXPOLYTECH.2018.8564396","DOIUrl":"https://doi.org/10.1109/EEXPOLYTECH.2018.8564396","url":null,"abstract":"Allocation of object borders is the one of the most important tasks at pavement damages recognition. They contain exhaustive information on it's form, for the subsequent analysis. The method of binarization of the initial image copes with this task. But this process is characterized by existence of a large number of distortions: washing out, gaps and loss of objects integrity, emergence of noise in homogeneous areas. Demand of the mistakes elimination has led to emergence of a large count of binarization methods. The choice of a binarization method and search of the optimum (for some set of parameters) algorithm influences the algorithms applied further to the image analysis. In this article we consider the most popular and modern binarization methods concerning problems of recognition of pavement damages.","PeriodicalId":296618,"journal":{"name":"2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132002334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Design of the Ring Amplifier for Low-Power ADC 小功率ADC环形放大器的设计
2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech) Pub Date : 2018-10-01 DOI: 10.1109/EEXPOLYTECH.2018.8564368
A. Sidun, Mikhail Gaidukov, I. Piatak, Y. Belyaev
{"title":"Design of the Ring Amplifier for Low-Power ADC","authors":"A. Sidun, Mikhail Gaidukov, I. Piatak, Y. Belyaev","doi":"10.1109/EEXPOLYTECH.2018.8564368","DOIUrl":"https://doi.org/10.1109/EEXPOLYTECH.2018.8564368","url":null,"abstract":"In this paper two implementations of the ring amplifier for the low-power ADCs are discussed. Requirements for the DC gain of the operational amplifier depend on the resolution of the ADCs are determined. Estimated power consumption and main characteristics of the proposed ring amplifiers are evaluated. Schematic and topology of both self-biased and latch-based ring-amplifiers are presented.","PeriodicalId":296618,"journal":{"name":"2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130303204","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Total Internal Reflection Fluorescence Microscopy for Investigation of Dynamics of Single Molecules 全内反射荧光显微法研究单分子动力学
2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech) Pub Date : 2018-10-01 DOI: 10.1109/EEXPOLYTECH.2018.8564372
E. Savchenko, O. Kuznetsova
{"title":"Total Internal Reflection Fluorescence Microscopy for Investigation of Dynamics of Single Molecules","authors":"E. Savchenko, O. Kuznetsova","doi":"10.1109/EEXPOLYTECH.2018.8564372","DOIUrl":"https://doi.org/10.1109/EEXPOLYTECH.2018.8564372","url":null,"abstract":"In the work, the study of dynamics of single molecules by means of total internal reflection fluorescence microscopy is suggested. The fluorescence microscopy is directed to detect the single molecules in different fluids. We developed a new experimental scheme of fluorescence microscopy. The developed system based on total internal regime allows studying movements of single chlorophyll particles in the aquatic environment and opens a great prospect for single molecules investigation.","PeriodicalId":296618,"journal":{"name":"2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130537457","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
BiJFet Array Chip MH2XA030 — a Design Tool for Radiation-Hardened and Cryogenic Analog Integrated Circuits BiJFet阵列芯片MH2XA030 -一种抗辐射低温模拟集成电路的设计工具
2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech) Pub Date : 2018-10-01 DOI: 10.1109/EEXPOLYTECH.2018.8564415
O. Dvornikov, V. Dziatlau, V. Tchekhovski, N. N. Prokopenko, A. Bugakova
{"title":"BiJFet Array Chip MH2XA030 — a Design Tool for Radiation-Hardened and Cryogenic Analog Integrated Circuits","authors":"O. Dvornikov, V. Dziatlau, V. Tchekhovski, N. N. Prokopenko, A. Bugakova","doi":"10.1109/EEXPOLYTECH.2018.8564415","DOIUrl":"https://doi.org/10.1109/EEXPOLYTECH.2018.8564415","url":null,"abstract":"A new BiJFet array chip (AC) MH2XA030 designed to accelerate the creation of analog integrated circuits (ICs) that retain their performance under the influence of penetrating radiation (the flux of neutrons and fast electrons, the accumulated dose of radiation, the single effects from heavy charged particles) and extremely low temperatures (up to −197°C) is considered. The topology of the array chip and its macro cell is described. The schematic design features of radiation-hardened and cryogenic analog ICs based on the AC are indicated. The circuit simulation results of the main analog components of the AC - voltage comparator, two operational amplifiers and two differential difference operational amplifiers are given.","PeriodicalId":296618,"journal":{"name":"2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127274276","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Synthesis of the Backpropagation Error Algorithm for a Multilayer Neural Network with Nonlinear Synaptic Inputs 非线性突触输入多层神经网络反向传播误差算法的综合
2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech) Pub Date : 2018-10-01 DOI: 10.1109/EEXPOLYTECH.2018.8564433
Z. Musakulova, E. Mirkin, E. Savchenko
{"title":"Synthesis of the Backpropagation Error Algorithm for a Multilayer Neural Network with Nonlinear Synaptic Inputs","authors":"Z. Musakulova, E. Mirkin, E. Savchenko","doi":"10.1109/EEXPOLYTECH.2018.8564433","DOIUrl":"https://doi.org/10.1109/EEXPOLYTECH.2018.8564433","url":null,"abstract":"The application of the backpropagation error algorithm for learning a two-layer neural network using neurons with nonlinear inputs is considered. The proposed algorithm is used to solve the XOR problem. The results of modeling are presented.","PeriodicalId":296618,"journal":{"name":"2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131156230","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
The Application of Digital Filtration for the Active Power Measurement 数字滤波在有功功率测量中的应用
2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech) Pub Date : 2018-10-01 DOI: 10.1109/EEXPOLYTECH.2018.8564414
A. Serov, N. Serov, A. Lupachev
{"title":"The Application of Digital Filtration for the Active Power Measurement","authors":"A. Serov, N. Serov, A. Lupachev","doi":"10.1109/EEXPOLYTECH.2018.8564414","DOIUrl":"https://doi.org/10.1109/EEXPOLYTECH.2018.8564414","url":null,"abstract":"To measure the active power in a given frequency band, a method based on low-pass filtration of the instantaneous power signal can be applied. For active power digital meters, the low-pass filter is implemented digitally. At the same time, infinite impulse response (IIR) digital filters, finite impulse response (FIR) digital filters can be used to perform low-frequency filtering. The article shows that the parameters of the applied digital filter are significantly affected to the measurement error. The application of cascaded integrator-comb (CIC) filters plays an important role. The article shows that when using a complex circuit containing a CIC-filter and a IIR-filter, the smallest measurement error (among the considered digital filters) is shown. Analytical expressions are obtained, which allows to contact the measurement error of active power and the parameters of the applied digital filter. To verify the reliability of the obtained analytical expressions, simulations were performed in the Simulink software package.","PeriodicalId":296618,"journal":{"name":"2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121231921","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Dispersity and Surface Characterization of Yttrium Vanadate and Phosphate Based Luminescent Phosphors 钒酸钇和磷酸盐基发光荧光粉的分散性和表面表征
2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech) Pub Date : 2018-10-01 DOI: 10.1109/EEXPOLYTECH.2018.8564374
T. Minakova, N. Eremina, S. Mjakin, V. Bakhmetyev, M. Sychov, L. Svatovskaya, Dmitry I. Dolzhenko, A. Sychova
{"title":"Dispersity and Surface Characterization of Yttrium Vanadate and Phosphate Based Luminescent Phosphors","authors":"T. Minakova, N. Eremina, S. Mjakin, V. Bakhmetyev, M. Sychov, L. Svatovskaya, Dmitry I. Dolzhenko, A. Sychova","doi":"10.1109/EEXPOLYTECH.2018.8564374","DOIUrl":"https://doi.org/10.1109/EEXPOLYTECH.2018.8564374","url":null,"abstract":"The surface properties of Eu(III)-activated yttrium vanadate, yttrium phosphate and mixed yttrium vanadate-phosphate phosphors with different europium content synthesized via self-propagating high temperature synthesis are studied by low temperature nitrogen adsorption, scanning electron microscopy, aqueous slurry pH measurements and adsorption of acid-base indicators. Among the materials synthesized under similar conditions, phosphate based phosphors possess with a significantly more acidic surface (due to the presence of Lewis acidic centers probably corresponding to phosphorous atoms) and coarse dispersity compared with vanadate analogs, while mixed vanadate-phosphate compounds feature with the most fine dispersity.","PeriodicalId":296618,"journal":{"name":"2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)","volume":"218 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124310816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Computer Simulation of Metal Ablation by Single and Multiple Ultrashort Laser Pulses 单脉冲和多脉冲超短激光烧蚀金属的计算机模拟
2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech) Pub Date : 2018-10-01 DOI: 10.1109/EEXPOLYTECH.2018.8564378
R. Davydov, V. Antonov, Moroz Angelina
{"title":"Computer Simulation of Metal Ablation by Single and Multiple Ultrashort Laser Pulses","authors":"R. Davydov, V. Antonov, Moroz Angelina","doi":"10.1109/EEXPOLYTECH.2018.8564378","DOIUrl":"https://doi.org/10.1109/EEXPOLYTECH.2018.8564378","url":null,"abstract":"In this work an improved mathematical model for a metal ablation by femtosecond laser pulses is proposed. This model is constructed relying on two-temperature hydrodynamic model for electrons and ions and wide-range equation of state for metals. Results of the simulation for several metals are compared with experimental data at different laser fluence and duration of pulses for ablation depth. A good agreement with them and the experiment is received.","PeriodicalId":296618,"journal":{"name":"2018 IEEE International Conference on Electrical Engineering and Photonics (EExPolytech)","volume":"92 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116909643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
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