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2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE)最新文献

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On issues and effects of education using qualification exam measures in practical training programs for IT engineers 论IT工程师实训项目中资格考试教育的问题与效果
2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE) Pub Date : 2013-12-01 DOI: 10.1109/MITE.2013.6756348
K. Fukuoka, K. Ohtsuki
{"title":"On issues and effects of education using qualification exam measures in practical training programs for IT engineers","authors":"K. Fukuoka, K. Ohtsuki","doi":"10.1109/MITE.2013.6756348","DOIUrl":"https://doi.org/10.1109/MITE.2013.6756348","url":null,"abstract":"Motivated by the trend in industry to seek qualitative, not only quantitative, qualifications from applicants, we have investigated the training of IT professionals from the point of view of practical education. From experimental studies we have found that qualification exam scores do not reflect sufficiently practical abilities. Based on our findings, we propose some possibly effective ways to re-use some exam exam questions to more efficiently evaluate and train IT professionals.","PeriodicalId":284844,"journal":{"name":"2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124892550","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A new hybrid cryptosystem for Binding Update in NEMO 一种新的NEMO绑定更新混合密码系统
2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE) Pub Date : 2013-12-01 DOI: 10.1109/MITE.2013.6756360
R. Raju, A. Dahiya, K. Garg, Shashikant Maheshwari
{"title":"A new hybrid cryptosystem for Binding Update in NEMO","authors":"R. Raju, A. Dahiya, K. Garg, Shashikant Maheshwari","doi":"10.1109/MITE.2013.6756360","DOIUrl":"https://doi.org/10.1109/MITE.2013.6756360","url":null,"abstract":"Traditionally Mobile IP was meant for single mobile nodes, which was then extended to give mobility to networks. This is known as known as Network Mobility (NEMO). Here the Mobile Router (MR) has to intimate to the Home Agent (HA) about its location, using a Binding Update (BU). An acknowledgement is received by MR, during this exchange; an intruder may enter easily because of security lapses. Hence, a security mechanism is required to protect the BU. In this paper a new security method has been introduced to overcome this problem.","PeriodicalId":284844,"journal":{"name":"2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE)","volume":"454 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132945444","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluating research students' satisfaction based on supervisors' characteristics: A fuzzy approach 基于导师特征的研究生满意度评价:一种模糊方法
2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE) Pub Date : 2013-12-01 DOI: 10.1109/MITE.2013.6756332
Shilpi Gupta, Jaya Sharma
{"title":"Evaluating research students' satisfaction based on supervisors' characteristics: A fuzzy approach","authors":"Shilpi Gupta, Jaya Sharma","doi":"10.1109/MITE.2013.6756332","DOIUrl":"https://doi.org/10.1109/MITE.2013.6756332","url":null,"abstract":"In the perspective of growing demand for research accountability, every university is making it an objective to achieve optimum performance in terms of research and development. Successful completion of research depends on the kind of supervision received by students from their supervisors. As students' satisfaction directly affects the quality of research at the university level, there is an urgent need of an explicit system that evaluates students' satisfaction with their supervisors. This paper aims to examine the experiences and challenges of post graduate research students with their supervisors. For this, data were collected through face-to-face interviews and a questionnaire aimed at recording response from 100 post graduate students of a private university in north India. From the study we identified relevant parameters like supervisor's expertise, active listening, availability and self seeking behavior etc. As these parameters are imprecise and difficult to measure directly, these can be expressed in fuzzy context. A fuzzy based approach is used to propose a system that measures the overall student's satisfaction.","PeriodicalId":284844,"journal":{"name":"2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125511200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Test effort estimation in regression testing 回归测试中的测试工作量估计
2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE) Pub Date : 2013-12-01 DOI: 10.1109/MITE.2013.6756364
Ashish Sharma, Ashish Sharma
{"title":"Test effort estimation in regression testing","authors":"Ashish Sharma, Ashish Sharma","doi":"10.1109/MITE.2013.6756364","DOIUrl":"https://doi.org/10.1109/MITE.2013.6756364","url":null,"abstract":"Software test effort estimation has always been a challenge for the software practitioners, because it consumes approximately half of the overall development costs of any software project. In order to provide effective software maintenance it is necessary to carry out the regression testing of the software. Hence, this research work aims to propose a measure for the estimation of the software test effort in regression testing. Since, the effort required developing or test software shall depend on various major contributing factors like, therefore, the proposed measure first estimates the change type of any software, make test cases for any software, then calculate execution complexity of any software and tester rank. In general, the regression testing takes more time and cost to perform it. Therefore, the effort estimation in regression testing is utmost required in order to compute man-hour for any software. In order to analyze the validity of the proposed test effort estimation measure, the measure is compared for various ranges of problem from small, mid and large size program to real life software projects. The result obtained shows that, the proposed test measure is a comprehensive one and compares well with other prevalent measures proposed in the past.","PeriodicalId":284844,"journal":{"name":"2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126923886","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Indian higher education: A students' perspective 印度高等教育:学生的视角
2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE) Pub Date : 2013-12-01 DOI: 10.1109/MITE.2013.6756367
Ramanan Sivasubramanian, R. Sridharan, S. Siddhartha Saravanan
{"title":"Indian higher education: A students' perspective","authors":"Ramanan Sivasubramanian, R. Sridharan, S. Siddhartha Saravanan","doi":"10.1109/MITE.2013.6756367","DOIUrl":"https://doi.org/10.1109/MITE.2013.6756367","url":null,"abstract":"India is purging towards becoming a developed nation by delving in technological advancement. To achieve this vision, having very high student potential, proper utilization of human resource is critical. The students' perception of education (learning process) is as vital as the teachers' ability to teach. A survey of 575 students is conducted to successfully reveal the students' perspective of the Indian higher education system. The plausible reason for the deteriorating education quality is discussed in dept. Problems faced by the students throughout the education process have been discussed.","PeriodicalId":284844,"journal":{"name":"2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123194144","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Detection and mitigation of node replication with pulse delay attacks in wireless sensor network 无线传感器网络中节点复制脉冲延迟攻击的检测与缓解
2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE) Pub Date : 2013-12-01 DOI: 10.1109/MITE.2013.6756374
S. Umrao, Deeksha Verma, A. Tripathi
{"title":"Detection and mitigation of node replication with pulse delay attacks in wireless sensor network","authors":"S. Umrao, Deeksha Verma, A. Tripathi","doi":"10.1109/MITE.2013.6756374","DOIUrl":"https://doi.org/10.1109/MITE.2013.6756374","url":null,"abstract":"Wireless sensor network (WSN) is made up two or more interconnected sensor nodes wirelessly. These nodes may be deployed either in open or closed environment. As these nodes communicates wirelessly and deployed in open environment there are always threat of security of nodes as well as data communicated. In order to making secure communication over WSN there should be some security mechanism. In this paper a common security mechanism is proposed to mitigate pulse delay attack and node replication. This mechanism includes detection and then mitigation.","PeriodicalId":284844,"journal":{"name":"2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE)","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126516016","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Design of broadband microstrip antenna using parasitic patches with band-notch characteristic for wireless communication 利用带陷波特性的寄生贴片设计无线通信宽带微带天线
2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE) Pub Date : 2013-12-01 DOI: 10.1109/MITE.2013.6756326
Mukesh Arora, R. Agarwal, K. Ray
{"title":"Design of broadband microstrip antenna using parasitic patches with band-notch characteristic for wireless communication","authors":"Mukesh Arora, R. Agarwal, K. Ray","doi":"10.1109/MITE.2013.6756326","DOIUrl":"https://doi.org/10.1109/MITE.2013.6756326","url":null,"abstract":"In this paper a Square patch microstrip antenna is designed with band notched characteristic of size 30 mm × 35 mm. The proposed antenna has wide frequency spectrum from 1.12 GHz to 9.75 GHz with VSWR less than 2, WLAN (wireless local area network) rejection for the frequency band 5.15 GHz-5.83 GHz is made possible by placing three parasitic patches on the bottom of the substrate. In this design no modification in radiating patch is required. Ansoft HFSS simulation software is used to obtain results of radiation parameters such as return loss, VSWR, radiation pattern and have satisfactory values within range.","PeriodicalId":284844,"journal":{"name":"2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126528791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A group expert evaluation for teachers by integrating fuzzy AHP and TOPSIS models 基于模糊层次分析法和TOPSIS模型的教师群体专家评价
2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE) Pub Date : 2013-12-01 DOI: 10.1109/MITE.2013.6756311
S. Pavani, L. Sharma, H. Hota
{"title":"A group expert evaluation for teachers by integrating fuzzy AHP and TOPSIS models","authors":"S. Pavani, L. Sharma, H. Hota","doi":"10.1109/MITE.2013.6756311","DOIUrl":"https://doi.org/10.1109/MITE.2013.6756311","url":null,"abstract":"Teachers are an essential pillar of any educational institute. The selection of eminence teacher is a very important process to sustain the quality education. Selection of teachers depends on performance for selection criteria to generate a final ranking. The performance criteria of teacher's are evaluated by experts and it is always ambiguous. This ambiguity of human decision-making can be deal with the fuzzy decision support model. This work is an attempt to construct a fuzzy AHP and TOPSIS model to assess different teachers and select quality teachers for educational intuitions. The proposed method enables decision analysts to better understand the complete evaluation process and provide a more precise, valuable, and systematic decision support tool.","PeriodicalId":284844,"journal":{"name":"2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124928227","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Laboratory implementation of some analog and digital modulation schemes using single circuit 实验室采用单电路实现了一些模拟和数字调制方案
2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE) Pub Date : 2013-12-01 DOI: 10.1109/MITE.2013.6756376
B. Kanmani
{"title":"Laboratory implementation of some analog and digital modulation schemes using single circuit","authors":"B. Kanmani","doi":"10.1109/MITE.2013.6756376","DOIUrl":"https://doi.org/10.1109/MITE.2013.6756376","url":null,"abstract":"In this work we present laboratory implementation of some experiments in the domain of Analog and Digital Communication. Usually different circuits are used for each experiment, and sometimes, `plug-in' modules are used to connect and observe waveforms at different stages of the modulator. The single circuit proposed can be used to generate the three forms of amplitude modulation: standard amplitude modulation (DSB); double side band suppressed carrier (DSB-SC); single side band (SSB); and three forms of digital modulation like the amplitude shift keying (ASK); binary phase shift keying (BPSK); frequency shift keying (FSK). In addition, the same circuit is used to generate natural sampled waveform and the two-channel time division multiplexed waveform. We discuss the method and then present the experimental results.","PeriodicalId":284844,"journal":{"name":"2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115574486","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Analysis of timing constraint on combined SVM-HMM classifier and SVM classifier SVM- hmm联合分类器与SVM分类器的时序约束分析
2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE) Pub Date : 2013-12-01 DOI: 10.1109/MITE.2013.6756337
A. K. Kumawat, Sarika Khandelwal
{"title":"Analysis of timing constraint on combined SVM-HMM classifier and SVM classifier","authors":"A. K. Kumawat, Sarika Khandelwal","doi":"10.1109/MITE.2013.6756337","DOIUrl":"https://doi.org/10.1109/MITE.2013.6756337","url":null,"abstract":"In Handwriting Verifier Timing constraint is very crucial part which have used in the SVM Classifier, these have using the more time for the large number of sample and get the less accuracy. When there is used the Combined SVM-HMM so that has taken less time for the analysis the large sample and give better accuracy than SVM. That all time has evaluated with the curvelet transform and make a digital clock pulse in form of 1's and 0's. Which have calculate in the invariant movement with the wavelength from the trained data image and replace them, on the place of selected writing image, than make an metric of binary number and calculate them with the method of invariant curve let, thereafter compare the character on the time of the calculate image binary code and make an metrics on the striate line of SVM-HMM in terms of 1's and 0's.","PeriodicalId":284844,"journal":{"name":"2013 IEEE International Conference in MOOC, Innovation and Technology in Education (MITE)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114297155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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