2014 IEEE 23rd North Atlantic Test Workshop最新文献_第2页

A New Test Vector Search Algorithm for a Single Stuck-at Fault Using Probabilistic Correlation 基于概率相关的单卡故障测试向量搜索算法

2014 IEEE 23rd North Atlantic Test Workshop Pub Date : 2014-05-14 DOI: 10.1109/NATW.2014.20

M. Venkatasubramanian, V. Agrawal

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引用次数: 8

Power System Fault Modeling/Simulation Protective Relay Testing and Simulation 电力系统故障建模/仿真保护继电器测试与仿真

2014 IEEE 23rd North Atlantic Test Workshop Pub Date : 2014-05-14 DOI: 10.1109/NATW.2014.16

G. Tang

引用次数: 0

Delay Test of Embedded Memories 嵌入式存储器的延迟测试

2014 IEEE 23rd North Atlantic Test Workshop Pub Date : 2014-05-14 DOI: 10.1109/NATW.2014.22

Yukun Gao, Tengteng Zhang, Swati Chakraborty, D. Walker

引用次数: 0

When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG 当优化的n -检测测试集有偏差时:细胞感知型故障和n -检测卡在ATPG的研究

2014 IEEE 23rd North Atlantic Test Workshop Pub Date : 2014-05-14 DOI: 10.1109/NATW.2014.15

Fanchen Zhang, Micah Thornton, Jennifer Dworak

引用次数: 7

CSST: An Efficient Secure Split-Test for Preventing IC Piracy 一种有效的防止IC盗版的安全分离测试

2014 IEEE 23rd North Atlantic Test Workshop Pub Date : 2014-05-01 DOI: 10.1109/NATW.2014.17

Md. Tauhidur Rahman, Domenic Forte, Quihang Shi, Gustavo K. Contreras, M. Tehranipoor

引用次数: 18