一种有效的防止IC盗版的安全分离测试

Md. Tauhidur Rahman, Domenic Forte, Quihang Shi, Gustavo K. Contreras, M. Tehranipoor
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引用次数: 18

摘要

由于与现代集成电路制造相关的高成本,大多数半导体公司已经无晶圆厂,即他们将设计制造外包给合同代工厂。这种横向商业模式导致了许多与不受信任的代工厂相关的问题,包括IC生产过剩和出货不当或测试不足的芯片。这种芯片进入供应链对关键应用来说可能是灾难性的。我们提出了一种新的安全分离测试,将测试控制权交还给IP所有者。每个芯片在测试期间被锁定。IP所有者是唯一能够解读锁定测试结果并解锁通过测试芯片的实体。通过这种方式,SST可以防止运输生产过剩和有缺陷的芯片到达供应链。与原始版本的安全分离测试相比,所提出的方法大大简化了铸造厂和IP所有者之间所需的通信。结果表明,我们的新技术比原来的技术更安全,并且通信障碍更少。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CSST: An Efficient Secure Split-Test for Preventing IC Piracy
With the high costs associated with modern IC fabrication, most semiconductor companies have gone fabless, i.e., they outsource manufacturing of their designs to contract foundries. This horizontal business model has led to many well documented issues associated with untrusted foundries including IC overproduction and shipping improperly or insufficiently tested chips. Entering such chips in the supply chain can be catastrophic for critical applications. We propose a new Secure Split-Test to give control over testing back to the IP owner. Each chip is locked during test. The IP owner is the only entity who can interpret the locked test results and unlock passing chips. In this way, SST can prevent shipping overproduction and defective chips from reaching the supply chain. The proposed method considerably simplifies the communication required between the foundry and IP owner compared to the original version of the secure split test. The results demonstrate that our new technique is more secure than the original and with less communication barriers.
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