{"title":"A SAW resonator filter using longitudinal and transverse modes","authors":"G. Martin, B. Wall","doi":"10.1109/ULTSYM.1996.583788","DOIUrl":"https://doi.org/10.1109/ULTSYM.1996.583788","url":null,"abstract":"A SAW resonator filter using not only transverse but also longitudinal modes is presented. The design principle permits to construct four-pole filters without cascading or parallel connection. The input and output transducers arranged side by side have equal construction characterized by unsymmetrical withdrawing weighting. Neighboring disturbing longitudinal modes are suppressed due to weighting determined by an iterative procedure. The successful application of the principle to a device is demonstrated by experimental measurements.","PeriodicalId":278111,"journal":{"name":"1996 IEEE Ultrasonics Symposium. Proceedings","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132230305","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Experimental investigation on the operation of SAW devices at harmonic frequencies with stepped-finger interdigital transducer","authors":"T. Sato, S. Otsuka, H. Okajima, R. Motegi","doi":"10.1109/ULTSYM.1996.583971","DOIUrl":"https://doi.org/10.1109/ULTSYM.1996.583971","url":null,"abstract":"Stepped-finger IDTs operate at one desired harmonic, while suppressing fundamental and all other harmonics. However, if the IDT is used at microwave frequencies, a proper experimental study of some structural problems which may potentially have an affect on the response would be needed. This paper describes the feasibility of using the stepped-finger IDT at microwave frequencies. SAW delay lines operating at the 5th harmonic frequencies of 2.3, 3.4 and 4.6 GHz are studied. As a result, it is found that the degree of suppression of fundamental decreases as the 5th harmonic frequency is raised. This paper also describes the application of the stepped-finger IDT except for filters and delay lines. A 2-port SAW resonator operating at the 5th harmonic frequency of 1 GHz is studied and the resonator which has a loaded Q of 5000 is obtained.","PeriodicalId":278111,"journal":{"name":"1996 IEEE Ultrasonics Symposium. Proceedings","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130247985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Measurement of shear impedances of viscoelastic fluids","authors":"S. Sheen, H. Chien, A. C. Raptis","doi":"10.1109/ULTSYM.1996.584010","DOIUrl":"https://doi.org/10.1109/ULTSYM.1996.584010","url":null,"abstract":"Shear-wave reflection coefficients from a solid/fluid interface are derived for non-Newtonian fluids that can be described by Maxwell, Voigt, and power-law fluid models. Based on model calculations, we have identified the measurable effects on the reflection coefficients due to fluid non-Newtonian behavior. The models are used to interpret the viscosity data obtained by a technique based on shear impedance measurement.","PeriodicalId":278111,"journal":{"name":"1996 IEEE Ultrasonics Symposium. Proceedings","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134014535","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Ultrasound image compression exploiting image formation models","authors":"R. M. Cramblitt, K. Parker","doi":"10.1109/ULTSYM.1996.584302","DOIUrl":"https://doi.org/10.1109/ULTSYM.1996.584302","url":null,"abstract":"The diagnostic benefits of teleradiology may not be available in locations which lack high-bandwidth transmission channels. In these cases, data compression is required in order to use low bit-rate digital channels. Standard compression algorithms, such as JPEG, are not ideally suited to ultrasound images, in which speckle structure plays an important role. We have developed an algorithm for progressively encoding ultrasound images which incorporates knowledge of both the system parameters and the image formation process, and which preserves the speckle structure in the image. The algorithm operates on the digitized RF output of an ultrasound scanner and identifies pixels in the image giving rise to the largest output in a local neighborhood. It iteratively allocates point scatterers to these pixels and transmits their amplitudes and locations using Huffman encoding. The image is reconstructed by convolving an RF pulse with the received sparse scatterer matrix. We describe the basic algorithm and compare its performance, using rate-distortion curves, to the JPEG standard. Distortion is measured by both simple root-mean-squared (RMS) error and human visual system (HVS)-weighted RMS error. The HVS distortions are included to better account for the perceived differences in image quality seen by the diagnostician.","PeriodicalId":278111,"journal":{"name":"1996 IEEE Ultrasonics Symposium. Proceedings","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134296122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Singularities of the planar Green function in the spectral domain","authors":"E. Danicki, W. Laprus","doi":"10.1109/ULTSYM.1996.583964","DOIUrl":"https://doi.org/10.1109/ULTSYM.1996.583964","url":null,"abstract":"The electro-acoustic field amplitudes at the boundary of a piezoelectric half-space satisfy a matrix relation which is characteristic of the medium. The elements of the matrix are functions of slowness. In the paper, the singularities of the matrix are investigated at cutoff points of bulk waves. An approximated formula is derived for the matrix in the neighborhood of the greatest cutoff point, which takes into account also the singularity related to the Rayleigh wave. The results of numerical calculations are presented for several piezoelectrics.","PeriodicalId":278111,"journal":{"name":"1996 IEEE Ultrasonics Symposium. Proceedings","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131215972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
W. Li, C. Lancée, A. V. D. van der Steen, E. Gussenhoven, N. Bom
{"title":"Blood velocity estimation with high frequency intravascular ultrasound","authors":"W. Li, C. Lancée, A. V. D. van der Steen, E. Gussenhoven, N. Bom","doi":"10.1109/ULTSYM.1996.584350","DOIUrl":"https://doi.org/10.1109/ULTSYM.1996.584350","url":null,"abstract":"When a cluster of randomly distributed blood particles moves across the ultrasound beam, the received echo signals decorrelate as a function of time. This phenomenon may be used to estimate the flow velocity by measuring the decorrelation rate from a sequence of blood scattering signals. A computer model based on the impulse response method was used to study the lateral decorrelation properties of an IVUS transducer from the extreme near-field up to the far-field. An RF decorrelation-based method for measuring local blood velocity and quantifying volume flow from cross-sectional RF IVUS data was developed and tested in vitro with a flow phantom and in vivo in pig experiments. Preliminary results of this study indicate that the proposed decorrelation method is able to extract 2D velocity profiles and volumetric flow.","PeriodicalId":278111,"journal":{"name":"1996 IEEE Ultrasonics Symposium. Proceedings","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133599828","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Degenerated coupled resonator filters","authors":"V. Plessky, T. Thorvaldsson, S. Kondratiev","doi":"10.1109/ULTSYM.1996.583775","DOIUrl":"https://doi.org/10.1109/ULTSYM.1996.583775","url":null,"abstract":"A new class of filter is presented which works in a mode where there is a kind of mixture between Coupled Resonator Filters (CRFs) and ladder type SAW Impedance Element filters (IEFs). Long IDTs, working basically like resonators are used in a CRF type of operational mode. On substrates with high coupling coefficient and high finger reflectivity (as for example 36/spl deg/-LiTaO/sub 3/) a resonance condition imposed on the gap between long transducers must be satisfied in order to provide sufficient transfer of energy from one (input) transducer to another (output) transducer. Further, the relation between the transduction and reflection properties on strong coupling materials are such that unwanted longitudinal modes are strongly suppressed, and simulation shows that a nice flat passband can be realized. The bandwidth for this kind of filter is typically narrower than for conventional CRFs, but this is not a big disadvantage, because there are a lot of potential applications where these filters can be used and they are easy to design.","PeriodicalId":278111,"journal":{"name":"1996 IEEE Ultrasonics Symposium. Proceedings","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133448942","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Estimation of shell characteristics using time-frequency patterns and neural network","authors":"M. Zakharia, P. Chevret, F. Magand","doi":"10.1109/ULTSYM.1996.584074","DOIUrl":"https://doi.org/10.1109/ULTSYM.1996.584074","url":null,"abstract":"Surface acoustic waves circumnavigating around an elastic shell carry out very valuable information on its mechanical and geometrical properties and can be used for ultrasonic inspection and non destructive evaluation as well as sonar classification. This information can be decomposed into several elementary components associated to various physical phenomena. Time-frequency representations (and, in particular, the Smoothed Pseudo Wigner-Ville Distribution) have been shown to be very relevant tools for describing these phenomena. Several experiments and simulations have shown, in the time-frequency plane, the importance of a frequency range associated to the so-called \"coincidence frequency\" (interaction between a Lamb wave and a Stoneley type wave). This pattern has been extracted from the time-frequency image for a great variety of shells in order to describe the direct problem with a reduced set of characteristics parameters. The inverse problem consists in estimating the mechanical and geometrical properties of the shell from these parameters. An innovative neural network approach has been developed for estimating these properties and has been applied to both simulated and experimental data. The method shows a very good accuracy (error less than a few percents on the estimation of the shell characteristics: thickness, density and shear wave velocity).","PeriodicalId":278111,"journal":{"name":"1996 IEEE Ultrasonics Symposium. Proceedings","volume":"245 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115603181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Development of analysis techniques for SAW transverse-coupled waveguide resonator filters","authors":"D. P. Morgan, S. Richards, A. Staples","doi":"10.1109/ULTSYM.1996.583954","DOIUrl":"https://doi.org/10.1109/ULTSYM.1996.583954","url":null,"abstract":"This paper describes an effective analysis method for the transverse-coupled SAW filter (TCF), which comprises two adjacent one-port resonators close enough to have useful acoustic coupling. Waveguiding is an essential feature of this device, and here waveguiding is analysed by a novel technique which has the versatility of the well-known stack matrix method but is simpler to apply. To obtain good agreement with experiment, it is found that it is essential to include anisotropy in the waveguide analysis. For each of the two waveguide modes (symmetric, antisymmetric), the device is analysed as if it were a conventional one-port, one-track resonator, using coupled mode (COM) analysis. The resulting admittances are combined to give the device Y-matrix, from which the scattering matrix S is easily found. The parameters required for the COM analysis (velocities etc.) are deduced from plane-wave data given in the literature. Theoretical results agree well with experiment, for 190 MHz devices using ST-cut quartz.","PeriodicalId":278111,"journal":{"name":"1996 IEEE Ultrasonics Symposium. Proceedings","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124178599","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Pei, B. Khuri-Yakub, F. Degertekin, B. Honein, F. Stanke, K. Saraswat
{"title":"In situ simultaneous measurement of temperature and thin film thickness with ultrasonic techniques","authors":"J. Pei, B. Khuri-Yakub, F. Degertekin, B. Honein, F. Stanke, K. Saraswat","doi":"10.1109/ULTSYM.1996.584169","DOIUrl":"https://doi.org/10.1109/ULTSYM.1996.584169","url":null,"abstract":"A novel technique to measure in situ, simultaneously, temperature and thin film thickness during semiconductor processing is described in this paper. The measurement technique is based on the principle that the velocity of an ultrasonic Lamb wave propagating in a silicon wafer is a function of both the wafer temperature and the thin film coating on the wafer surface. We are able to obtain the processing temperature and film thickness simultaneously with two sets of sensors operating at two distinct frequencies, 0.5 MHz and 1.5 MHz. This technique is demonstrated in an aluminum sputtering system. We have achieved a temperature measurement accuracy of /spl plusmn/0.15/spl deg/C and an aluminum film thickness resolution of /spl plusmn/170 /spl Aring/. The measurement does not depend on the optical or the electrical properties of either the wafer or the film material, and is insensitive to the processing environment. With its high measurement accuracy and setup simplicity, this sensor system carries great potential in semiconductor process monitoring and control.","PeriodicalId":278111,"journal":{"name":"1996 IEEE Ultrasonics Symposium. Proceedings","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124413376","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}