2007 IEEE Design and Diagnostics of Electronic Circuits and Systems最新文献

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Cost-Efficient Synthesis for Sequential Circuits Implemented Using Embedded Memory Blocks of FPGA's 利用FPGA的嵌入式存储块实现顺序电路的低成本综合
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems Pub Date : 2007-04-11 DOI: 10.1109/DDECS.2007.4295261
G. Borowik, B. Falkowski, T. Luba
{"title":"Cost-Efficient Synthesis for Sequential Circuits Implemented Using Embedded Memory Blocks of FPGA's","authors":"G. Borowik, B. Falkowski, T. Luba","doi":"10.1109/DDECS.2007.4295261","DOIUrl":"https://doi.org/10.1109/DDECS.2007.4295261","url":null,"abstract":"Modern FPLD devices have a very complex structure. They combine PLA-like structures as well as FPGA's and even memory-based structures. However, the lack of an appropriate synthesis method does not allow the features of the modern FPLD's to be fully exploited. In this paper, an important problem of state assignment for an FSM as an extension of the previous research on ROM-based FSM implementation is presented. We pinpoint the sources of additional optimization of the functional decomposition and relate them to the state encoding conditions. The method is based on a reduction of a state assignment problem to a graph coloring problem. To this end, the so called multi-graph of incompatibility of memory T-words is applied. As a result, a new design technique for implementation of sequential circuits using embedded memory blocks of FPGA's has been developed. Preliminary experimental results are extremely encouraging.","PeriodicalId":274042,"journal":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127370087","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
Redundancy and Test-Pattern Generation for Asynchronous Quasi-Delay-Insensitive Combinational Circuits 异步准延迟不敏感组合电路的冗余和测试模式生成
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems Pub Date : 2007-04-11 DOI: 10.1109/DDECS.2007.4295316
A. Efthymiou
{"title":"Redundancy and Test-Pattern Generation for Asynchronous Quasi-Delay-Insensitive Combinational Circuits","authors":"A. Efthymiou","doi":"10.1109/DDECS.2007.4295316","DOIUrl":"https://doi.org/10.1109/DDECS.2007.4295316","url":null,"abstract":"Most of the early work on testing asynchronous combinational circuits ignored faults inside C elements, a common building block in these circuits. Using a standard cell based design, where C elements are built using majority gates, we show that a number of faults are untestable in some implementations, while others are undetected by previously proposed tests, which yield a fault coverage of only 70-80% even in the small circuits examined here. We present a novel test pattern generation algorithm based on the D algorithm and time-frame expansion that can automatically detect all testable stuck-at faults in these families of combinational asynchronous circuits. Finally we present a comparison of the test pattern lengths achieved by this method with previously published full-scan based methods.","PeriodicalId":274042,"journal":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125259295","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Debug Patterns for Efficient High-level SystemC Debugging 高效的高级SystemC调试模式
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems Pub Date : 2007-04-11 DOI: 10.1109/DDECS.2007.4295320
Frank Rogin, Erhard Fehlauer, Christian Haufe, Sebastian Ohnewald
{"title":"Debug Patterns for Efficient High-level SystemC Debugging","authors":"Frank Rogin, Erhard Fehlauer, Christian Haufe, Sebastian Ohnewald","doi":"10.1109/DDECS.2007.4295320","DOIUrl":"https://doi.org/10.1109/DDECS.2007.4295320","url":null,"abstract":"This paper proposes debug patterns combined with an intuitive flow to accelerate and simplify the debugging of SystemC designs. A debug pattern provides a formalized procedure to fix a defect (also colloquial bug) that is notified by an always recurring failure symptom. It helps to focus the user's attention on a higher level of abstraction joined with minimal learning effort. The presented methodology is based upon a non-intrusive high-level SystemC debugging environment and the GNU debugger GDB. The usability of each pattern is demonstrated by practical examples.","PeriodicalId":274042,"journal":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126668361","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
ESD Failures of Integrated Circuits and Their Diagnostics Using Transmission Line Pulsing 集成电路ESD故障及其传输线脉冲诊断
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems Pub Date : 2007-04-11 DOI: 10.1109/DDECS.2007.4295323
Z. Piatek, J. Kolodziejski, W. Pleskacz
{"title":"ESD Failures of Integrated Circuits and Their Diagnostics Using Transmission Line Pulsing","authors":"Z. Piatek, J. Kolodziejski, W. Pleskacz","doi":"10.1109/DDECS.2007.4295323","DOIUrl":"https://doi.org/10.1109/DDECS.2007.4295323","url":null,"abstract":"In the work typical ESD failures of integrated circuits and ESD testing methods are presented. Authors describe dependencies between ESD models and different ESD failures. In order to allow more advanced ESD testing of integrated circuits, transmission line pulsing is proposed and its correlation to HBM method described. Finally conclusions based on up-to-date research and test results obtained with the help of the assembled TLP tester are provided.","PeriodicalId":274042,"journal":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","volume":"139 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127469875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Design of Addition and Multiplication Units for High Performance Interval Arithmetic Processor 高性能区间算术处理机加乘单元的设计
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems Pub Date : 2007-04-11 DOI: 10.1109/DDECS.2007.4295285
A. Amaricai, M. Vladutiu, L. Prodan, M. Udrescu, O. Boncalo
{"title":"Design of Addition and Multiplication Units for High Performance Interval Arithmetic Processor","authors":"A. Amaricai, M. Vladutiu, L. Prodan, M. Udrescu, O. Boncalo","doi":"10.1109/DDECS.2007.4295285","DOIUrl":"https://doi.org/10.1109/DDECS.2007.4295285","url":null,"abstract":"This paper proposes a new approach for the optimization process of the interval addition and multiplication floating point units. For the interval addition/subtraction, an adder exploiting the parallelism of the double path adder structure is used. The two floating point additions needed are performed simultaneously on different data paths. Therefore, the performance of the proposed adder can be the same as that of two individual floating point adders, but with a much reduced cost overhead. Regarding the interval multiplication, a multiplier architecture was designed, in order to be suitable for pipelined structures. It consists of a floating point multiplier which computes two results for the same operation (rounded differently), and of two floating point comparators. In terms of performance, the proposed multiplier unit presents half of the performance of a conventional floating point multiplier. This is not a drawback, if we consider the fact that interval multiplication requires four floating point operations and six comparisons. This paper shows that interval arithmetic can be efficiently implemented in terms of performance and cost.","PeriodicalId":274042,"journal":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124958491","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Proposal of VLIW Architecture for Application Specific Processors with Built-in-Self-Repair facility via Variable Accuracy Arithmetic 基于变精度算法的嵌入式自修复专用处理器VLIW体系结构的提出
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems Pub Date : 2007-04-11 DOI: 10.1109/DDECS.2007.4295302
P. Pawlowski, A. Dabrowski, Mario Schölzel
{"title":"Proposal of VLIW Architecture for Application Specific Processors with Built-in-Self-Repair facility via Variable Accuracy Arithmetic","authors":"P. Pawlowski, A. Dabrowski, Mario Schölzel","doi":"10.1109/DDECS.2007.4295302","DOIUrl":"https://doi.org/10.1109/DDECS.2007.4295302","url":null,"abstract":"A new proposal of a very long instruction word (VLIW) architecture for application specific processors with the built-in-self-repair (BISR) facility realized by means of the variable accuracy arithmetic has been described in this paper. The proposed idea, which is particularly interesting for the portable embedded systems, is based on a novel two accumulator model, which is used in order to obtain high accuracy of the result of a series of floating-point additions. The goal of the proposed approach consists in ensuring the functionality of the system even in case of permanent faults of particular building blocks, e.g., of one of the floating point adders. Instead of decreasing the performance of the system or providing redundant hardware, as it is typically done in other approaches, in our present concept merely the accuracy of the floating point accumulation is reduced. Therefore, although the quality of service is reduced, the performance and the overall functionality of the system may remain unchanged. By this means we can also control the power consumption, saving the power with the cost of the somehow reduced signal processing accuracy.","PeriodicalId":274042,"journal":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121588631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Parts Obsolescence Challenges for the Electronics Industry 电子工业零件过时的挑战
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems Pub Date : 2007-04-11 DOI: 10.1109/DDECS.2007.4295267
J. Tørresen, T. Lovland
{"title":"Parts Obsolescence Challenges for the Electronics Industry","authors":"J. Tørresen, T. Lovland","doi":"10.1109/DDECS.2007.4295267","DOIUrl":"https://doi.org/10.1109/DDECS.2007.4295267","url":null,"abstract":"The lifetime of electronic parts has decreased over the years. The result is that companies designing embedded systems with long life-time would have problems. Thus, there are problems with manufacturing the products for as many years as they would like to as well as being able to provide spare parts for customers. To be able to analyze the extent of the problem as well as learning about how the industry copes with the problem, we have conducted a survey among the foremost Norwegian original equipment manufacturer (OEM) companies and contract manufacturers. This paper presents the main observations from this survey. The main conclusion from the survey is that obsolescence is a problem but the extent of it depends on how much proactive focus a company has. The companies taking precautions would benefit from that by extending the time span before they have to redesign their systems.","PeriodicalId":274042,"journal":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","volume":"142 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116534769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
RF Transformer Model Parameters Measurement 射频变压器模型参数测量
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems Pub Date : 2007-04-11 DOI: 10.1109/DDECS.2007.4295298
V. Dumbrava, L. Svilainis
{"title":"RF Transformer Model Parameters Measurement","authors":"V. Dumbrava, L. Svilainis","doi":"10.1109/DDECS.2007.4295298","DOIUrl":"https://doi.org/10.1109/DDECS.2007.4295298","url":null,"abstract":"The analysis and the measurement technique of the RF transformer model is presented. Transformer is used to improve the SNR of the input stages and for DC biasing through the winding inductance. The frequency range 0.1 MHz to 10 MHz utilized by the conventional ultrasound is assumed. Model is incorporating the winding resistances and the core loss resistance. The winding resistances experimental measurements and the modelling results comparison are presented. It has been indicated that winding resistances variance of plusmn20 % is causing only 0.02 dB variation in the preamplifier noise figure if source impedance is low. The core loss resistance measurement and experimental investigation results are outlined. It is shown that plusmn20% variance of this resistance can cause preamplifier noise figure variations reaching 0.03 dB for high output impedance transducer.","PeriodicalId":274042,"journal":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","volume":"207 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115041844","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A HW/SW Architecture to Reduce the Effects of Soft-Errors in Real-Time Operating System Services 一种减少实时操作系统服务中软错误影响的软硬件架构
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems Pub Date : 2007-04-11 DOI: 10.1109/DDECS.2007.4295291
Mohammad Hossein Neishaburi, M. R. Kakoee, M. Daneshtalab, S. Safari, Z. Navabi
{"title":"A HW/SW Architecture to Reduce the Effects of Soft-Errors in Real-Time Operating System Services","authors":"Mohammad Hossein Neishaburi, M. R. Kakoee, M. Daneshtalab, S. Safari, Z. Navabi","doi":"10.1109/DDECS.2007.4295291","DOIUrl":"https://doi.org/10.1109/DDECS.2007.4295291","url":null,"abstract":"Today, real-time applications that have stringent critical constraint are placed and run in an environment with real-time operating system (RTOS) more and more. The services provided by RTOSs are severely exposed to faults that affect both functional and timing of tasks running based on RTOS. In this paper, we propose an architecture for real-time operating systems which provides more robust services in term of soft errors. We try to evaluate and analyze robustness of services due to soft-errors in two architectures which are SW-RTOS and HW/SW-RTOS. According to experimental results, the proposed architecture for HW/SW-RTOS gives more robust services regarding soft errors versus purely software bases RTOSs.","PeriodicalId":274042,"journal":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128567202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Decomposition of Logic Functions in Reed-Muller Spectral Domain Reed-Muller谱域逻辑函数的分解
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems Pub Date : 2007-04-11 DOI: 10.1109/DDECS.2007.4295284
E. Hrynkiewicz, S. Kolodzinski
{"title":"Decomposition of Logic Functions in Reed-Muller Spectral Domain","authors":"E. Hrynkiewicz, S. Kolodzinski","doi":"10.1109/DDECS.2007.4295284","DOIUrl":"https://doi.org/10.1109/DDECS.2007.4295284","url":null,"abstract":"The paper deals with the problems of logic function decomposition in Reed-Muller spectral domain. The Ashenhurst and the Curtis decompositions are considered. The decompositions are executed on positive polarization Reed-Muller spectrum of decomposed functions. The elaborated methods of decomposition are guided to implementation of logic functions in LUT based FPGA. The results are very promising.","PeriodicalId":274042,"journal":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","volume":"418 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122119371","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
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