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Reliability of Organic Compounds in Microelectronics and Optoelectronics最新文献

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Degradation and Failures of Polymers Used in Light-Emitting Diodes 发光二极管用聚合物的降解和失效
Reliability of Organic Compounds in Microelectronics and Optoelectronics Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-81576-9_8
M. Y. Mehr, W. V. van Driel, G. Q. Zhang
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引用次数: 0
EMC Oxidation Under High-Temperature Aging 高温老化下的电磁兼容氧化
Reliability of Organic Compounds in Microelectronics and Optoelectronics Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-81576-9_3
A. Inamdar, P. Gromala, A. Prisacaru, A. Kabakchiev, Y. Yang, B. Han
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引用次数: 1
Outlook: From Physics of Failure to Physics of Degradation 展望:从失效物理学到退化物理学
Reliability of Organic Compounds in Microelectronics and Optoelectronics Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-81576-9_17
W. V. van Driel, M. Y. Mehr, X. Fan, G. Zhang
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引用次数: 0
Reliability and Failure of Microelectronic Materials 微电子材料的可靠性与失效
Reliability of Organic Compounds in Microelectronics and Optoelectronics Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-81576-9_12
A. Mavinkurve, R. Rongen, M. van Soestbergen
{"title":"Reliability and Failure of Microelectronic Materials","authors":"A. Mavinkurve, R. Rongen, M. van Soestbergen","doi":"10.1007/978-3-030-81576-9_12","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_12","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"2019 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121717585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Degradation Analysis for Reliability of Optoelectronics 光电器件可靠性退化分析
Reliability of Organic Compounds in Microelectronics and Optoelectronics Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-81576-9_11
Cheng Qian, Zeyu Wu, Wei Chen, Jiajie Fan, Xi Yang, Yi Ren, Bo Sun, Zi-li Wang
{"title":"Degradation Analysis for Reliability of Optoelectronics","authors":"Cheng Qian, Zeyu Wu, Wei Chen, Jiajie Fan, Xi Yang, Yi Ren, Bo Sun, Zi-li Wang","doi":"10.1007/978-3-030-81576-9_11","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_11","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"412 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133550438","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Artificial Intelligence and LED Degradation 人工智能与LED退化
Reliability of Organic Compounds in Microelectronics and Optoelectronics Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-81576-9_10
J. Wei
{"title":"Artificial Intelligence and LED Degradation","authors":"J. Wei","doi":"10.1007/978-3-030-81576-9_10","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_10","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125732881","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Degradation and Reliability of Organic Materials in Organic Light-Emitting Diodes (OLEDs) 有机发光二极管(oled)中有机材料的降解与可靠性
Reliability of Organic Compounds in Microelectronics and Optoelectronics Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-81576-9_9
Kelley J. Rountree, J. Davis, Karmann Riter, Jean-Tae Kim, M. McCombs, R. Pope
{"title":"Degradation and Reliability of Organic Materials in Organic Light-Emitting Diodes (OLEDs)","authors":"Kelley J. Rountree, J. Davis, Karmann Riter, Jean-Tae Kim, M. McCombs, R. Pope","doi":"10.1007/978-3-030-81576-9_9","DOIUrl":"https://doi.org/10.1007/978-3-030-81576-9_9","url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127751087","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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