Cheng Qian, Zeyu Wu, Wei Chen, Jiajie Fan, Xi Yang, Yi Ren, Bo Sun, Zi-li Wang
{"title":"Degradation Analysis for Reliability of Optoelectronics","authors":"Cheng Qian, Zeyu Wu, Wei Chen, Jiajie Fan, Xi Yang, Yi Ren, Bo Sun, Zi-li Wang","doi":"10.1007/978-3-030-81576-9_11","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":269519,"journal":{"name":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","volume":"412 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Reliability of Organic Compounds in Microelectronics and Optoelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-81576-9_11","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}