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Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.最新文献

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Toroidal coil winding & construction techniques 环形线圈绕线及施工技术
Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005. Pub Date : 1900-01-01 DOI: 10.1109/EEIC.2005.1566316
D. C. King
{"title":"Toroidal coil winding & construction techniques","authors":"D. C. King","doi":"10.1109/EEIC.2005.1566316","DOIUrl":"https://doi.org/10.1109/EEIC.2005.1566316","url":null,"abstract":"The application of winding and construction techniques particular to toroidal-wound magnetic components is presented. Current trends in the design of electronic circuits has increased the opportunity to utilize toroids to satisfy an increasingly wider range of applications in everything from current sensing to power (and signal) filtering and conditioning. The principal advantages to using toroids along with some specific design criteria will be briefly reviewed. Then, specific winding and construction techniques for three specific applications, both commercial and military, will be discussed in detail","PeriodicalId":267510,"journal":{"name":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132293960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fault zone analysis: identifying motor defects using the rotor fault zone 故障区域分析:利用转子故障区域识别电机缺陷
Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005. Pub Date : 1900-01-01 DOI: 10.1109/EEIC.2005.1566328
D. McKinnon, N. Bethe
{"title":"Fault zone analysis: identifying motor defects using the rotor fault zone","authors":"D. McKinnon, N. Bethe","doi":"10.1109/EEIC.2005.1566328","DOIUrl":"https://doi.org/10.1109/EEIC.2005.1566328","url":null,"abstract":"In the last decade, advancements in motor testing technology have brought forth advances in online and offline testing. Online current signature analysis (CSA) is quickly becoming a standard industry practice. Offline tests include advanced inductance measurements to analyze rotor and stator health. Using a combination of online and offline tests to form a six fault zone approach offers a more complete analysis of motor health. Power quality focuses on the quality of the voltage and current. Power circuit focuses on the power circuit supplying power to the motor. The stator fault zone focuses on the turn-to-turn insulation and internal coil connections. The air gap fault zone refers to the quality of the air gap between the rotor and the stator. The insulation fault zone refers to the winding to ground insulation. The rotor fault zone refers to the health of the rotor cage and laminations. All six fault zones should be analyzed to accurately assess the overall health of a motor","PeriodicalId":267510,"journal":{"name":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","volume":"563 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132704079","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Fundamentals of semi-conductive systems for high voltage stress grading 高压应力分级用半导体系统的基本原理
Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005. Pub Date : 1900-01-01 DOI: 10.1109/EEIC.2005.1566265
D. Conley, N. Frost
{"title":"Fundamentals of semi-conductive systems for high voltage stress grading","authors":"D. Conley, N. Frost","doi":"10.1109/EEIC.2005.1566265","DOIUrl":"https://doi.org/10.1109/EEIC.2005.1566265","url":null,"abstract":"High voltage insulation systems require voltage stress grading for proper operation. Silicon carbide is a semi-conductive compound with non-linear voltage current characteristics that is commonly used in the form of paints and tapes for the basis of voltage grading systems. This paper reviews the basic requirements of the stress grading system in generators and how the non-linear characteristics of silicon carbide are utilized","PeriodicalId":267510,"journal":{"name":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131795093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Study on insulation structure of fast slide in termination and joint for 15 kV power cable applying to live work on site 应用于现场带电作业的15kv电力电缆端接接头快滑块绝缘结构研究
Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005. Pub Date : 1900-01-01 DOI: 10.1109/EEIC.2005.1566252
Teng Le-tian, Zhang Jinxiu, Luo Yan
{"title":"Study on insulation structure of fast slide in termination and joint for 15 kV power cable applying to live work on site","authors":"Teng Le-tian, Zhang Jinxiu, Luo Yan","doi":"10.1109/EEIC.2005.1566252","DOIUrl":"https://doi.org/10.1109/EEIC.2005.1566252","url":null,"abstract":"Analysis and resolution of electric field distribution in fast slide-in termination and joint using finite element numeral analysis method described in this paper. Rules of interface compress stress, compress strain, and rubber material peristaltic change as well as material fatigue character after inserting and drawing 1000 times are discussed. The research results proved that electric field controlled cone design in insulation structure of the terminations and joints is important. The elasticity and permanence distortion of the EPR used as the main insulating material may be 50% and 2%. Inserting and drawing surplus tolerance of the termination and joint should not exceed 1.7","PeriodicalId":267510,"journal":{"name":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114670647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
3D transient with motion simulation of electric motors 电机三维瞬态运动仿真
Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005. Pub Date : 1900-01-01 DOI: 10.1109/EEIC.2005.1566318
P.J. Weicker
{"title":"3D transient with motion simulation of electric motors","authors":"P.J. Weicker","doi":"10.1109/EEIC.2005.1566318","DOIUrl":"https://doi.org/10.1109/EEIC.2005.1566318","url":null,"abstract":"With recent advances in computation power and finite element meshing and solution algorithms, the analysis of 3D devices is now becoming both realistic and worthwhile, especially in the design of novel machines where 2D analysis is not suitable, such as axial flux machines like the disk induction motor investigated here. In particular, new methods for formulating motion meshes and efficient solvers allow for efficient multi-physics solution of such machines under transient conditions, considering eddy current, velocity effects, the equations of motion as well as the field solution. The computational effort and problem size required for 3D electromagnetic field simulation are considerable and the algorithms developed must be robust, efficient and scaleable. An overview of the design, the methodology for analysis and a review of the results and comparison with experiment measurements are presented","PeriodicalId":267510,"journal":{"name":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124664305","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
New polymers for polymer magnetic devices 用于聚合物磁性器件的新型聚合物
Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005. Pub Date : 1900-01-01 DOI: 10.1109/EEIC.2005.1566310
J. Masi, C. Gorrie
{"title":"New polymers for polymer magnetic devices","authors":"J. Masi, C. Gorrie","doi":"10.1109/EEIC.2005.1566310","DOIUrl":"https://doi.org/10.1109/EEIC.2005.1566310","url":null,"abstract":"New polymer (organic) materials have been fabricated in which there is sufficient electronic exchange as well as stability, both thermally and chemically, at room temperature and above. This paper gives an overview of the synthesis of promising new complex polymer building blocks that can yield ferro-, ferri-, and super-paramagnetic materials for magnetic devices. The use of these methods to produce ferri-, para-, and super-paramagnetic materials allows form factor, low-temperature processing, and device variations that facilitate their use in a wide variety of applications. New materials from the saccharide, urethane, silicone, and epoxide classes of materials are explained. Some devices made from these materials are discussed and demonstrated","PeriodicalId":267510,"journal":{"name":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127490595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
University-company partnerships key to resolving outsourcing of U.S. jobs 大学与公司的合作关系是解决美国就业外包问题的关键
Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005. Pub Date : 1900-01-01 DOI: 10.1109/EEIC.2005.1566303
G.J. Erwin
{"title":"University-company partnerships key to resolving outsourcing of U.S. jobs","authors":"G.J. Erwin","doi":"10.1109/EEIC.2005.1566303","DOIUrl":"https://doi.org/10.1109/EEIC.2005.1566303","url":null,"abstract":"Many analysts believe that industry-university partnerships in the U.S. similar to those between the Electrical Manufacturing and Coil Winding Association and American universities could help the U.S. electrical manufacturing industry recover from the loss of jobs overseas through the development of new innovations. Unfortunately, media outlets often fail to provide a balanced view of the outsourcing issue for many industries including the electrical and electronics manufacturing industry, thus creating public uncertainty regarding the import and export of U.S. jobs. This paper summarizes some of the outsourcing issues in the industry today, provides insights into how the electrical and electronics manufacturing industry could re-establish itself through relationships with institutions of higher education, and attempts to decipher the real story of outsourcing that our national media fails to report","PeriodicalId":267510,"journal":{"name":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130148034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Research on surge arc prolongation device for power cable fault location 电力电缆故障定位中浪涌弧延长装置的研究
Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005. Pub Date : 1900-01-01 DOI: 10.1109/EEIC.2005.1566254
M.H. Li, M.G. Zhou, Y.M. Qu, Z. Yan, S.Y. Gong
{"title":"Research on surge arc prolongation device for power cable fault location","authors":"M.H. Li, M.G. Zhou, Y.M. Qu, Z. Yan, S.Y. Gong","doi":"10.1109/EEIC.2005.1566254","DOIUrl":"https://doi.org/10.1109/EEIC.2005.1566254","url":null,"abstract":"The development of an arc prolongation device for the secondary impulse method used in power cable fault location is reported in this paper. The faulty cable breaks down by a HV surge. Prior to the arc extinguishing, the device will supply, automatically, the energy to the faulty cable to sustain the arc sufficiently for the secondary impulse test. The device consists of an energy generator, wave blocker, impulse duration modulator, and signal coupler which are mounted in a compact case. This makes it easy to link the device with the surge generator and faulty cable on site. Since the output voltage is low, the device is safe for the cable's good insulation. Both simulations and laboratory tests show the device can prolong the arc for many milliseconds. The on-site secondary impulse method tests using this device produces fault location waveforms on the instrument's screen","PeriodicalId":267510,"journal":{"name":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125525740","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
An overview of technical challenges in the design of current transformers 电流互感器设计中的技术挑战概述
Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005. Pub Date : 1900-01-01 DOI: 10.1109/EEIC.2005.1566323
N. Das, M. Kazimierczuk
{"title":"An overview of technical challenges in the design of current transformers","authors":"N. Das, M. Kazimierczuk","doi":"10.1109/EEIC.2005.1566323","DOIUrl":"https://doi.org/10.1109/EEIC.2005.1566323","url":null,"abstract":"This paper presents approximate equations that may be used to obtain the lower cutoff frequency fL and higher cutoff frequency fH and thereby the bandwidth of a current transformer. The equations are validated by a PSpice simulation. The Bode plots for both low-frequency range and high-frequency range for a selected design are presented. Also an overview of the various problems that should be considered while designing a current transformer is given, including leakage inductance, stray capacitance, ringing, parasitic resonance, saturation, and mechanical clamping","PeriodicalId":267510,"journal":{"name":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126506430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Salt water pinhole testing of magnet wire 磁铁线盐水针孔试验
Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005. Pub Date : 1900-01-01 DOI: 10.1109/EEIC.2005.1566283
D. Barta
{"title":"Salt water pinhole testing of magnet wire","authors":"D. Barta","doi":"10.1109/EEIC.2005.1566283","DOIUrl":"https://doi.org/10.1109/EEIC.2005.1566283","url":null,"abstract":"The Japanese Industrial Standard, JIS C-3003, describes the procedure for salt water pinhole testing of magnet wire products. This paper will discuss the industry use of this test, investigations into the critical factors of this testing method, as well as the determination of the different modes of wire insulation failure. A better understanding of the electrochemistry and the magnet wire insulation compatibility aspects of this test has lead to possible use alternative salts in this testing method","PeriodicalId":267510,"journal":{"name":"Proceedings Electrical Insulation Conference and Electrical Manufacturing Expo, 2005.","volume":"90 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126511917","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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