2009 22nd International Conference on VLSI Design最新文献

{"title":"Security and Dependability of Embedded Systems: A Computer Architects' Perspective","authors":"Jörg Henkel, N. Vijaykrishnan, S. Parameswaran, R. Ragel","doi":"10.1109/VLSI.Design.2009.114","DOIUrl":"https://doi.org/10.1109/VLSI.Design.2009.114","url":null,"abstract":"Designers of embedded systems have traditionally optimized circuits for speed, size, power and time to market. Recently however, the dependability of the system is emerging as a great concern to the modern designer with the decrease in feature size and the increase in the demand for functionality. Yet another crucial concern is the security of systems used for storage of personal details and for financial transactions. A significant number of techniques that are used to overcome security and dependability are the same or have similar origins. Thus this tutorial will examine the overlapping concerns of security and dependability and the design methods used to overcome the problems and threats. This tutorial is divided into four parts: the first will examine dependability issues due to technology effects; the second will look at reliability aware designs; the third, will describe the security threats; and, the fourth part will illustrate the countermeasures to security and reliability issues Part I: Dependability Issues due to Technology Effects and Architectural Countermeasures Moore’s law has been in place for more than four decades. Each new technology node provided advantages in basically all major design constraints (performance, power, area, etc.). When migrating to upcoming technology nodes it will become obvious that this win-win situation soon will be at an end. Or, in other words, in future it becomes far more difficult and expensive to migrate to new technology nodes. One major point is an inherent undependability which will become a challenging problem. Undependability addressed within this part of the tutorial is related to a) Fabrication and Design-Time Effects like “Yield and Process Variations” and “Complexity” as well as b) run-time effects as “Aging Effects”, “Thermal Effects” and “Soft Errors”. The first part of this tutorial will give the details of these effects and a prospect of how these effects might influence future architectures for embedded systems. An overview of selected state-of-the-art paradigms and approaches is given including a focus on organic computing principles as well as run-time adaptive embedded processor architectures that can deal with dependability issues. Part II: Reliability Aware Design for Embedded Systems Design of robust embedded systems meeting stringent quality, reliability, and availability requirements is becoming increasingly difficult in advanced technologies. The current design paradigm which assumes that no gate or interconnect will ever operate incorrectly within the lifetime of a product must change to cope with such failures. New architectural features are required for robust system design with built-in mechanisms for failure tolerance, detection and recovery during normal system operation. This part of the tutorial will focus on new design techniques required for building robust systems: concurrent error detection, recovery, and selfrepair. A broad spectrum of circuit-level, logic-level,","PeriodicalId":267121,"journal":{"name":"2009 22nd International Conference on VLSI Design","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130422575","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Efficient Techniques for Directed Test Generation Using Incremental Satisfiability","authors":"P. Mishra, Mingsong Chen","doi":"10.1109/VLSI.Design.2009.72","DOIUrl":"https://doi.org/10.1109/VLSI.Design.2009.72","url":null,"abstract":"Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time and resources required for directed test generation can be prohibitively large. This paper presents an efficient test generation methodology using incremental satisfiability. The existing researches have used incremental SAT to improve counterexample (test) generation involving only one property with different bounds. This paper is the first attempt to utilize incremental satisfiability in directed test generation involving multiple properties. The contribution of this paper is a novel methodology to share learning across multiple properties by developing efficient techniques for property clustering, name substitution, and selective forwarding of conflict clauses. Our experimental results using both software and hardware benchmarks demonstrate that our approach can drastically (on average four times) reduce the overall test generation time.","PeriodicalId":267121,"journal":{"name":"2009 22nd International Conference on VLSI Design","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131112875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Metric Based Multi-Timescale Control for Reducing Power in Embedded Systems","authors":"N. Kataria, F. Brewer, J. Hespanha, T. Sherwood","doi":"10.1166/jolpe.2009.1035","DOIUrl":"https://doi.org/10.1166/jolpe.2009.1035","url":null,"abstract":"Digital control for embedded systems often requires low-power, hard real-time computation to satisfy high control-loop bandwidth, low latency, and low-power requirements. In particular, the emerging applications of Micro Electro-Mechanical Systems (MEMS) sensors, and their increasing integration, presents a challenging requirement to embed ultra-low power digital control architectures for these lithographically formed micro-structures. Controlling electromechanical structures of such a small scale, using naive digital controllers, can be prohibitively expensive (both in power and cost for portable or battery operated applications.) In this paper, we describe the potential for control systems to be transformed into a set of co-operating parallel linear systems and demonstrate, for the first time, that this parallelization can reduce the total number of instructions executed, thereby reducing power, at the expense of controlled loss in control fidelity. Since the error tolerance of linear feedback control systems is mathematically well-posed, this technique opens up a new, independent dimension for system optimization. We present a novel Computer-Aided Design (CAD) method to evaluate control fidelity, with varying timescales on the controller, and analyze the trade-off between performance and power dissipation. A CAD Metric for control fidelity is proposed and we demonstrate the potential for power savings using this decomposition on two different control problems.","PeriodicalId":267121,"journal":{"name":"2009 22nd International Conference on VLSI Design","volume":"Suppl 22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134252399","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"H-NMRU: A Low Area, High Performance Cache Replacement Policy for Embedded Processors","authors":"Sourav Roy","doi":"10.1109/VLSI.Design.2009.32","DOIUrl":"https://doi.org/10.1109/VLSI.Design.2009.32","url":null,"abstract":"We propose a low area, high performance cache replacement policy for embedded processors called Hierarchical Non-Most-Recently-Used (H-NMRU). The H-NMRU is a parameterizable policy where we can trade-off performance with area. We extended the Dinero cache simulator [1] with the H-NMRU policy and performed architectural exploration with a set of cellular and multimedia benchmarks. On a 16 way cache, a two level H-NMRU policy where the first and second levels have 8 and 2 branches respectively, performs as good as the Pseudo-LRU (PLRU) policy with storage area saving of 27%. Compared to true LRU, H-NMRU on a 16 way cache saves huge amount of area (82%) with marginal increase of cache misses (3%). Similar result was also noticed on other cache like structures like branch target buffers. Therefore the two level H-NMRU cache replacement policy (with associativity/2 and 2 branches on the two levels) is a very attractive option for caches on embedded processors with associativities greater than 4.","PeriodicalId":267121,"journal":{"name":"2009 22nd International Conference on VLSI Design","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133471627","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Temperature Aware Scheduling for Embedded Processors","authors":"R. Jayaseelan, T. Mitra","doi":"10.1166/jolpe.2009.1036","DOIUrl":"https://doi.org/10.1166/jolpe.2009.1036","url":null,"abstract":"Power density has been increasing at an alarming rate in recent processor generations resulting in high on-chip temperature. Higher temperature results in poor reliability and increased leakage current. In this paper, we propose a temperature aware scheduling technique in the context of embedded multi-tasking systems. We observe that there is a high variability in the thermal properties of different embedded applications. We design temperature-aware scheduling(TAS) scheme that exploits this variability to maintain the system temperature below a desired level while satisfying a number of requirements such as throughput, fairness and real time constraints. Moreover, TAS enables exploration of the tradeoffs between throughput and fairness in temperature-constrained systems. Compared against standard schedulers with reactive hardware-level thermal management, TAS provides better throughput with negligible impact on fairness.","PeriodicalId":267121,"journal":{"name":"2009 22nd International Conference on VLSI Design","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125132985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Techniques for the Design of Low Voltage Power Efficient Analog and Mixed Signal Circuits","authors":"J. Ramírez-Angulo, R. Carvajal, A. López-Martín","doi":"10.1109/VLSI.Design.2009.112","DOIUrl":"https://doi.org/10.1109/VLSI.Design.2009.112","url":null,"abstract":"Emerging applications in various fields, such as Ambient Intelligence scenarios or remote biomedical monitoring, currently demand wireless sensor networks with transceivers having extremely low power consumption requirements. This is a key issue in order to decrease battery weight and size and to increase the lifetime of the battery, which usually in these sensing nodes is not replaceable. To achieve these strict power requirements, several solutions have been proposed at various layers. At the physical layer, savings in power consumption are achieved by lowvoltage operation and optimized power-to-performance ratio. Supply voltages of 1V (or less) are anyway mandatory in modern deep submicron technologies to operate reliably due to the extremely thin oxide. Furthermore reduction of the supply voltage (even of not required) strongly reduces power consumption in digital circuits since it scales with supply voltage. Although this is not so simple in analog circuits, they should operate at the same supply voltage than the digital part in mixed-mode systems to avoid the complexity involved in generating various supply voltages. The canonic way of designing analog circuits consist in using high-gain amplifiers with passive components in negative feedback loops, both in continuous-time or discrete-time form. Sometimes amplifiers are operated in open loop (e.g. Gm-C filters, some VGAs, etc.), and in this case a large linear range is required for the amplifier at the expense of gain. In any case, amplifiers play a key role in analog design, and their power consumption directly impacts that of the overall analog system. Such amplifiers usually take the form of Operational Transconductance Amplifiers (OTAs) with high output resistance, typically driving capacitive loads, or operational amplifiers with low output resistance able to drive low resistive loads. Besides low-voltage and power-efficient operation, these amplifiers should feature a fast settling response, not limited by slew rate. Conciliating all these requirements is difficult with conventional class A topologies, since the bias current limits the maximum output current. Hence a trade-off between slew rate and power consumption do exists [1]. To overcome this issue, class AB topologies are often employed. These circuits provide well-controlled quiescent currents, which can be made very low in order to reduce drastically the static power dissipation. However, they automatically boost dynamic currents when a large differential input signal is applied, yielding maximum current levels well above the quiescent currents. Several class AB amplifiers have been proposed. Most of them are based on adaptive biasing techniques, by including extra circuitry that increases quiescent currents (e.g. by increasing tail currents in differential stages). However, often the extra circuits included increase both power consumption and silicon area, and add significant parasitic capacitance to the internal nodes. Also ","PeriodicalId":267121,"journal":{"name":"2009 22nd International Conference on VLSI Design","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130658756","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Efficient Analog/RF Layout Closure with Compaction Based Legalization","authors":"Subramanian Rajagopalan, S. Bhattacharya, S. Batterywala","doi":"10.1109/VLSI.Design.2009.61","DOIUrl":"https://doi.org/10.1109/VLSI.Design.2009.61","url":null,"abstract":"Advancements in process technology have resulted in tremendous increase in the number of design rules. This has greatly complicated the task of building design rule clean layouts. While EDA tools aid in layout creation for standard cell based ASICs, the problem remains unsolved for custom, analog and RF circuits. For such circuits, layout designers spend lot of time converting functionally correct schematic circuits into acceptable design rule clean layouts. While techniques have been proposed to remove Design Rule Violations (DRVs) with minimum perturbation to hand crafted layouts, designers still spend lot of time to get to layout closure. In the proposed methodology, designers can quickly draw sparse and possibly design rule unclean layouts and then use a compaction based layout legalization to clean up the DRVs and reduce area. This increases the productivity of layout designers and reduces the turnaround time for layout closure. The proposed technique achieves close to best possible area for a given sparse layout, keeps hard macros unaltered, respects relative positions, and removes all violations of modeled design rules. Reported experimental results suggest that this method can be used to automate layout creation process.","PeriodicalId":267121,"journal":{"name":"2009 22nd International Conference on VLSI Design","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134275722","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Analysis of the Energy Quantization Effects on Single Electron Inverter Performance through Noise Margin Modeling","authors":"S. Dan, S. Mahapatra","doi":"10.1109/VLSI.Design.2009.34","DOIUrl":"https://doi.org/10.1109/VLSI.Design.2009.34","url":null,"abstract":"Possible integration of Single Electron Transistor (SET) with CMOS technology is making the study of semiconductor SET more important than the metallic SET and consequently, the study of energy quantization effects on semiconductor SET devices and circuits is gaining significance. In this paper, for the first time, the effects of energy quantization on SET inverter performance are examined through analytical modeling and Monte Carlo simulations. It is observed that the primary effect of energy quantization is to change the Coulomb Blockade region and drain current of SET devices and as a result affects the noise margin, power dissipation, and the propagation delay of SET inverter. A new model for the noise margin of SET inverter is proposed which includes the energy quantization effects. Using the noise margin as a metric, the robustness of SET inverter is studied against the effects of energy quantization. It is shown that SET inverter designed with C_T : C_G = 1/3 (where C_T and C_G are tunnel junction and gate capacitances respectively) offers maximum robustness against energy quantization.","PeriodicalId":267121,"journal":{"name":"2009 22nd International Conference on VLSI Design","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133770990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Inline Assertions - Embedding Formal Properties in a Test Bench","authors":"Aritra Hazra, Priyankar Ghosh, P. Dasgupta, P. Chakrabarti","doi":"10.1109/VLSI.Design.2009.31","DOIUrl":"https://doi.org/10.1109/VLSI.Design.2009.31","url":null,"abstract":"The scope of immediate assertions in SystemVerilog is restricted to Boolean properties, where as temporal properties are specified as concurrent assertions. Concurrent assertion statements can also be embedded in a procedural block - known as procedural concurrent assertions which are used under restricted situations. This paper introduces the notion of inline assertions which generalizes the embedding of temporal properties within the procedural code of a test bench. The paper proposes verification methodologies for inline assertions and compares them with the traditional approaches of formal property verification and dynamic assertion based verification. The paper also focuses on coverage related issues when the intent of a concurrent assertion is modeled as an inline assertion.","PeriodicalId":267121,"journal":{"name":"2009 22nd International Conference on VLSI Design","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121275194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"High-Speed On-Chip Event Counters for Embedded Systems","authors":"N. Mukherjee, Artur Pogiel, J. Rajski, J. Tyszer","doi":"10.1109/VLSI.Design.2009.15","DOIUrl":"https://doi.org/10.1109/VLSI.Design.2009.15","url":null,"abstract":"The paper presents new discrete event counters that are based on ring generators – high performance linear feedback shift registers. These devices outperform earlier solutions by providing an unprecedented speed of operations. A complete data required to implement the new event counters is also provided.","PeriodicalId":267121,"journal":{"name":"2009 22nd International Conference on VLSI Design","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121968198","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}