2022 98th ARFTG Microwave Measurement Conference (ARFTG)最新文献

筛选
英文 中文
Mixer Residual Phase Noise Measurements Using Clock-locked DDS Sources and Receivers 使用时钟锁定DDS源和接收机的混频器剩余相位噪声测量
2022 98th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2022-01-17 DOI: 10.1109/ARFTG52954.2022.9844065
J. Dunsmore, J. Iwai
{"title":"Mixer Residual Phase Noise Measurements Using Clock-locked DDS Sources and Receivers","authors":"J. Dunsmore, J. Iwai","doi":"10.1109/ARFTG52954.2022.9844065","DOIUrl":"https://doi.org/10.1109/ARFTG52954.2022.9844065","url":null,"abstract":"Methods for residual measurements on mixers are difficult and require at least one other mixer making it difficult to separate the residual effects between them. Here we introduce a novel scheme that uses a system completely clocked off a single reference oscillator using pairs of DDS sources to produce an input and LO signal as well as a third DDS source to re-convert the mixer output We show the close-in phase noise is largely canceled with this method resulting in a good measure of the mixer residual phase noise somewhat independent of the raw phase noise of the DDS sources. This improvement can also be shown for close-in residual measurements of amplifiers.","PeriodicalId":266876,"journal":{"name":"2022 98th ARFTG Microwave Measurement Conference (ARFTG)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121573225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Quantifying Noise Floor and Trace Noise in VNA Measurements for the WR-15 Waveguide Band WR-15波导带VNA测量中的本底噪声和迹线噪声量化
2022 98th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2022-01-17 DOI: 10.1109/ARFTG52954.2022.9844076
A. Hagerstrom, Angela C. Stelson, J. Jargon, Christian J.Long
{"title":"Quantifying Noise Floor and Trace Noise in VNA Measurements for the WR-15 Waveguide Band","authors":"A. Hagerstrom, Angela C. Stelson, J. Jargon, Christian J.Long","doi":"10.1109/ARFTG52954.2022.9844076","DOIUrl":"https://doi.org/10.1109/ARFTG52954.2022.9844076","url":null,"abstract":"We present a model and measured data to assess the uncertainties in scattering-parameter measurements due to noise floor and trace noise in the receivers of a vector network analyzer operating in the WR-15 waveguide band.","PeriodicalId":266876,"journal":{"name":"2022 98th ARFTG Microwave Measurement Conference (ARFTG)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122698650","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Probe Measurement System for Surface Mount Devices at Radio Frequencies 射频表面贴装设备的探头测量系统
2022 98th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2022-01-17 DOI: 10.1109/ARFTG52954.2022.9844052
R. Kishikawa, M. Horibe, Toshiaki Ohi, A. Yamamoto, Noriyoshi Hashimoto, Ryo Takeda
{"title":"Probe Measurement System for Surface Mount Devices at Radio Frequencies","authors":"R. Kishikawa, M. Horibe, Toshiaki Ohi, A. Yamamoto, Noriyoshi Hashimoto, Ryo Takeda","doi":"10.1109/ARFTG52954.2022.9844052","DOIUrl":"https://doi.org/10.1109/ARFTG52954.2022.9844052","url":null,"abstract":"This paper presents a new probe system for measuring the scattering parameters of surface mount devices in radio frequency range in response to the demand for operating power devices at higher frequencies. Two ground-source probes with 3.7 mm pitch and a probe station for controlling these probes were designed as original components of the proposed system. When used with a commercially available vector network analyzer, a de source supply, two bias-Ts, and cables, the scattering parameters with the de bias voltage supplied can be measured. This is a pioneer probe measurement system for surface mount devices in the power electronics operated at the radio frequencies. Because the probes can be used in direct contact with a surface mount device under test, precise measurement results can be obtained. The evaluation results for the stability of the developed system and contact reproducibility are also presented. Around the low reflection area, the stability of the system and the contact reproducibility of the magnitude of S11 were less than 0.00007 from 50 kHz to 300 MHz. However, these values increased at the frequencies over 1 GHz. It is confirmed that probe control is important in probe measurements especially at high frequency range.","PeriodicalId":266876,"journal":{"name":"2022 98th ARFTG Microwave Measurement Conference (ARFTG)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131088157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Contactless in-situ probe planarity adjustment on co-planar devices 共面器件的非接触式原位探头平面度调整
2022 98th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2022-01-17 DOI: 10.1109/ARFTG52954.2022.9844092
R. Sakamaki
{"title":"Contactless in-situ probe planarity adjustment on co-planar devices","authors":"R. Sakamaki","doi":"10.1109/ARFTG52954.2022.9844092","DOIUrl":"https://doi.org/10.1109/ARFTG52954.2022.9844092","url":null,"abstract":"This paper demonstrates a contactless in-situ planarity adjustment of a ground-signal-ground (GSG) probe on practical planar devices. The proposed technique completes the adjustment with minimizing footprints on the devices. Furthermore, repeatability of tilt angle was 0.6 degrees, which was compatible to a conventional manual inspection technique. No footprint was observed after the adjustment process. The proposed technique can realize in-situ planarity adjustment just above a device-under-test (DUT).","PeriodicalId":266876,"journal":{"name":"2022 98th ARFTG Microwave Measurement Conference (ARFTG)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125598074","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信