{"title":"Pulsed Bias-RF Power GaAs MMIC Testing","authors":"W. Pribble, R. Sweeney","doi":"10.1109/ARFTG.1991.324022","DOIUrl":"https://doi.org/10.1109/ARFTG.1991.324022","url":null,"abstract":"Development of automated on-wafer test methods over the past few years has made possible the highly accurate characterization of both passive and low-power active microwave devices without the extra time, expense, and accuracy degradation introduced by packaging. Probes operating from dc to 65 GHz and enhanced calibration procedures such as the TRL method [ l ] have aided in construction of test systems that non-destructively characterize large quantities of microwave devices to quickly provide accurate statistical data.","PeriodicalId":264877,"journal":{"name":"37th ARFTG Conference Digest","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126197579","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Discontinuities and Noise Modeling Noise Model Verification Using Advanced \" Discontinuities \"","authors":"U. Rohde","doi":"10.1109/ARFTG.1991.324019","DOIUrl":"https://doi.org/10.1109/ARFTG.1991.324019","url":null,"abstract":"Presents a series of slides and explanations of discontinuities and noise modeling noise model verification using advanced discontinuities.","PeriodicalId":264877,"journal":{"name":"37th ARFTG Conference Digest","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125588148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Using a Packaged Fet to Transform Between Measurement Media","authors":"R. Lane","doi":"10.1109/ARFTG.1991.324024","DOIUrl":"https://doi.org/10.1109/ARFTG.1991.324024","url":null,"abstract":"The recent availability of low cost HEMT devices in an improved stripline package useful to 26GH2, though exciting for the hybrid amplifier designer, poses new measurement problems for the device supplier. Hybrid applications are most commonly in microstrip, with the leads cropped short and soldered down. Therefore using an improved version of the TTF1 or even a full lead length microstrip fixture2, the 'S' parameters as measured will differ slightly from what they will be in the customer's application. If the port isolation is sufficient, then knowing the full lead fixture and application \"end effects\" \"3' parameters permits transforming between the two media.","PeriodicalId":264877,"journal":{"name":"37th ARFTG Conference Digest","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130139097","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electromagnetic Simulation of Microwave Components","authors":"D. Swanson","doi":"10.1109/ARFTG.1991.324014","DOIUrl":"https://doi.org/10.1109/ARFTG.1991.324014","url":null,"abstract":"Workers in industry and academia have been writing numerical codes to solve electromagnetic fields problems for several decades. These programs were often written - on main frame computers with little thought given to portability or the user interface. Only in the past few years have commercial general purpose electromagnetic field solvers become available to the engineering community. These commercial efforts are the result of advances in software and the development of low cost UNIX workstations. These commercial codes offer new opportunities for the microwave engineering community to validate existing analytical models, create new models and solve complex structures that cannot be reduced to an analytical model. This paper will briefly review the methods used in commercial electromagnetic field solvers and present some examples of their use in an engineering environment.","PeriodicalId":264877,"journal":{"name":"37th ARFTG Conference Digest","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114369479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Resonant Mode Dielectrometer for Substrates","authors":"G. Kent","doi":"10.1109/ARFTG.1991.324016","DOIUrl":"https://doi.org/10.1109/ARFTG.1991.324016","url":null,"abstract":"An advance towards meeting the need for microwave permittivity measurements of substrates is represented by the resonant mde dielectrmter (RMD), Fig.lb. The RMD is an evolution frun the evanescent mde dielectrmter (EMD), which is related to other evanescent resonators. These methods use the lowest resonance of the TE-01 cylindrical waveguide mode; and as a result, no metalization of the specimen is required. Only the EMD and RMi) are suitable for measuring thin sanples of any shape but large enough in area.","PeriodicalId":264877,"journal":{"name":"37th ARFTG Conference Digest","volume":"104 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132765554","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Modeling Precision Connectors with a High Frequency Structure Simulator","authors":"J. Dunsmore","doi":"10.1109/ARFTG.1991.324017","DOIUrl":"https://doi.org/10.1109/ARFTG.1991.324017","url":null,"abstract":"Presents a series of slides and explanations of modeling precision vonnectors with a high frequency structure simulators.","PeriodicalId":264877,"journal":{"name":"37th ARFTG Conference Digest","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124642541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
B. Oldfield, J. Rautio, J. Merrill, T. Miracco, P. Draxler
{"title":"Simple Microstrip Structures Calculated vs Measured","authors":"B. Oldfield, J. Rautio, J. Merrill, T. Miracco, P. Draxler","doi":"10.1109/ARFTG.1991.324015","DOIUrl":"https://doi.org/10.1109/ARFTG.1991.324015","url":null,"abstract":"The microwave performance of simple microstrip structures such as gaps, bends, stubs, termination and Beatty lines was calculated using both standard RF analysis and EM analysis. The structures were manufactured on 10 mil alumina and the RF performance was measured to 60 GHz. The results are compared. The question of the accuracy of both models and measurements is always nagging, especially at higher frequencies and in non coax structures. Measurement capability for microstrip has improved dramatically in the past few years with improved test fixtures, microstrip calibration standards, dispersion correction and broadband time domain. Modeling has also improved and there are at least two major modeling techniques, standard circuit analysis, such as Touchstone, and Electromagnetic Simulation. EM can provide analysis of structures which are not currently covered by standard analysis. The test structures were kept simple and were mostly either broadband or were centered around 30 GHz. The structures were manufactured on 10 mil alumina which was held to a thickness tolerance of ±0.0001\". The data was gathered in DOS format and plotted through Touchstone. EM simulations were provided by Sonnet Software and EESOF. Standard analysis was by EESOF Touchstone. The RF measurements and structures were provided by Wiltron. Measurements were made on a 60 GHz Model 360 network analyzer using a Model 3680V test fixture. Calibration used microstrip standards. Due to time constraints, not all structures were analyzed by all involved. The information on the data is given below.","PeriodicalId":264877,"journal":{"name":"37th ARFTG Conference Digest","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131641450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Measuring Resistive Sheets in Free Space","authors":"H. Stinehelfer, M. Ballou","doi":"10.1109/ARFTG.1991.324025","DOIUrl":"https://doi.org/10.1109/ARFTG.1991.324025","url":null,"abstract":"Resistive sheet material, having surface resistance measured in ohms per square, is measured in a reflection and transmission manner by placing the material between two antennas. The measured transmission data is then converted to the time domain for separation of surface reflection and the attenuation thru the material.","PeriodicalId":264877,"journal":{"name":"37th ARFTG Conference Digest","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130803887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Automated On-Wafer Noise and Load Pull Characterization Using Precision Computer Controlled Electromechanical Tuners","authors":"M. Tutt, D. Pavlidis, C. Tsironis","doi":"10.1109/ARFTG.1991.324021","DOIUrl":"https://doi.org/10.1109/ARFTG.1991.324021","url":null,"abstract":"A wafer probing system capable of both noise, and load and source pull measurements is described. The system is based on precision computer controlled electromechanical tuners. Sophisticated system software controls calibration, measurements, data analysis and display. Results of measurements of submicron In-GaAs/InAlAs/InP HEMTs and GaAs MESFETs are presented.","PeriodicalId":264877,"journal":{"name":"37th ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130679645","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Gigahertz Test Fixture for Two Port Passive Devices","authors":"M. Cavin, D. Malocha","doi":"10.1109/ARFTG.1991.324020","DOIUrl":"https://doi.org/10.1109/ARFTG.1991.324020","url":null,"abstract":"Since it is not possible to obtain exact standards for many types of filters, resonators and discrete components, it is necessary to qualify procedures for extraction of device parameters. In addition, the package adds additional parasitics to equivalent circuit models which increases the difficulty of parameter extraction. A procedure has been developed using scattering parameters for extraction of equivalent circuit elements for bulk acoustic wave (BAW) and surface acoustic wave (SAW) crystal filters, and package equivalent circuits from a few megahertz to approximately 1 GHz. This has led to an extension of the EIA-512 standard. In addition, SAW filter parameters may also be extracted using similar S-parameter techniques. In order to accommodate the many differing BAW and SAW package types, a test fixture has been developed for measuring a broad range of packaged devices with varying pin configurations. The test fixture requires simple and easy hardware modifications to accommodate any pin spacings of 100 mils or greater. The test fixture is also able to be accurately calibrated via the twelve term S-parameter error correction model at the insertion point. Scattering parameter data is then taken on 2-port devices and computer programs accurately extract the device parameters. The test fixture will be described and the results of several applications of parameter extraction to various SAW and BAW devices will be shown. A comparison of theoretical and measured SAW filter performance will be presented.","PeriodicalId":264877,"journal":{"name":"37th ARFTG Conference Digest","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115304606","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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