{"title":"使用封装场效应管在测量介质之间进行变换","authors":"R. Lane","doi":"10.1109/ARFTG.1991.324024","DOIUrl":null,"url":null,"abstract":"The recent availability of low cost HEMT devices in an improved stripline package useful to 26GH2, though exciting for the hybrid amplifier designer, poses new measurement problems for the device supplier. Hybrid applications are most commonly in microstrip, with the leads cropped short and soldered down. Therefore using an improved version of the TTF1 or even a full lead length microstrip fixture2, the 'S' parameters as measured will differ slightly from what they will be in the customer's application. If the port isolation is sufficient, then knowing the full lead fixture and application \"end effects\" \"3' parameters permits transforming between the two media.","PeriodicalId":264877,"journal":{"name":"37th ARFTG Conference Digest","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Using a Packaged Fet to Transform Between Measurement Media\",\"authors\":\"R. Lane\",\"doi\":\"10.1109/ARFTG.1991.324024\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The recent availability of low cost HEMT devices in an improved stripline package useful to 26GH2, though exciting for the hybrid amplifier designer, poses new measurement problems for the device supplier. Hybrid applications are most commonly in microstrip, with the leads cropped short and soldered down. Therefore using an improved version of the TTF1 or even a full lead length microstrip fixture2, the 'S' parameters as measured will differ slightly from what they will be in the customer's application. If the port isolation is sufficient, then knowing the full lead fixture and application \\\"end effects\\\" \\\"3' parameters permits transforming between the two media.\",\"PeriodicalId\":264877,\"journal\":{\"name\":\"37th ARFTG Conference Digest\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"37th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.1991.324024\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"37th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1991.324024","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Using a Packaged Fet to Transform Between Measurement Media
The recent availability of low cost HEMT devices in an improved stripline package useful to 26GH2, though exciting for the hybrid amplifier designer, poses new measurement problems for the device supplier. Hybrid applications are most commonly in microstrip, with the leads cropped short and soldered down. Therefore using an improved version of the TTF1 or even a full lead length microstrip fixture2, the 'S' parameters as measured will differ slightly from what they will be in the customer's application. If the port isolation is sufficient, then knowing the full lead fixture and application "end effects" "3' parameters permits transforming between the two media.