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Optical Metrology and Inspection for Industrial Applications IX最新文献

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Fast 3D measurement based on fringe projection profilometry and deep learning 基于条纹投影轮廓术和深度学习的快速3D测量
Optical Metrology and Inspection for Industrial Applications IX Pub Date : 2023-01-09 DOI: 10.1117/12.2642326
Yuxuan Che, Wei Yin
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引用次数: 0
Front Matter: Volume 12319 封面:12319卷
Optical Metrology and Inspection for Industrial Applications IX Pub Date : 2022-12-22 DOI: 10.1117/12.2669307
{"title":"Front Matter: Volume 12319","authors":"","doi":"10.1117/12.2669307","DOIUrl":"https://doi.org/10.1117/12.2669307","url":null,"abstract":"","PeriodicalId":262440,"journal":{"name":"Optical Metrology and Inspection for Industrial Applications IX","volume":"295 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127072602","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Structured light 3D imaging and its applications 结构光三维成像及其应用
Optical Metrology and Inspection for Industrial Applications IX Pub Date : 2022-12-21 DOI: 10.1117/12.2641998
Yan Hu, Kaijie Zheng, Zhongwei Liang, Shijie Feng, C. Zuo
{"title":"Structured light 3D imaging and its applications","authors":"Yan Hu, Kaijie Zheng, Zhongwei Liang, Shijie Feng, C. Zuo","doi":"10.1117/12.2641998","DOIUrl":"https://doi.org/10.1117/12.2641998","url":null,"abstract":"","PeriodicalId":262440,"journal":{"name":"Optical Metrology and Inspection for Industrial Applications IX","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-12-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124180465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
In-plane coplanarity measurement by Talbot interferometer 塔尔博特干涉仪面内共面测量
Optical Metrology and Inspection for Industrial Applications IX Pub Date : 2022-12-21 DOI: 10.1117/12.2644120
Shilpi Agarwal, C. Shakher
{"title":"In-plane coplanarity measurement by Talbot interferometer","authors":"Shilpi Agarwal, C. Shakher","doi":"10.1117/12.2644120","DOIUrl":"https://doi.org/10.1117/12.2644120","url":null,"abstract":"","PeriodicalId":262440,"journal":{"name":"Optical Metrology and Inspection for Industrial Applications IX","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-12-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123429507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Structured illumination using deep learning: with applications to high-speed 3D surface imaging 使用深度学习的结构化照明:应用于高速3D表面成像
Optical Metrology and Inspection for Industrial Applications IX Pub Date : 2022-12-21 DOI: 10.1117/12.2643140
C. Zuo
{"title":"Structured illumination using deep learning: with applications to high-speed 3D surface imaging","authors":"C. Zuo","doi":"10.1117/12.2643140","DOIUrl":"https://doi.org/10.1117/12.2643140","url":null,"abstract":"","PeriodicalId":262440,"journal":{"name":"Optical Metrology and Inspection for Industrial Applications IX","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-12-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130144819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Freeform surface measurement by virtual differential confocal based on reference planes monitoring 基于参考面监测的虚拟微分共聚焦自由曲面测量
Optical Metrology and Inspection for Industrial Applications IX Pub Date : 2022-12-21 DOI: 10.1117/12.2656177
Wen-Bo Wang, Lirong Qiu, Weiqian Zhao
{"title":"Freeform surface measurement by virtual differential confocal based on reference planes monitoring","authors":"Wen-Bo Wang, Lirong Qiu, Weiqian Zhao","doi":"10.1117/12.2656177","DOIUrl":"https://doi.org/10.1117/12.2656177","url":null,"abstract":"","PeriodicalId":262440,"journal":{"name":"Optical Metrology and Inspection for Industrial Applications IX","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-12-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127342412","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Learning-based fringe analysis with uncertainty quantification 基于学习的条纹分析与不确定度量化
Optical Metrology and Inspection for Industrial Applications IX Pub Date : 2022-12-21 DOI: 10.1117/12.2641613
Shijie Feng
{"title":"Learning-based fringe analysis with uncertainty quantification","authors":"Shijie Feng","doi":"10.1117/12.2641613","DOIUrl":"https://doi.org/10.1117/12.2641613","url":null,"abstract":"","PeriodicalId":262440,"journal":{"name":"Optical Metrology and Inspection for Industrial Applications IX","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-12-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134195666","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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