{"title":"Fast 3D measurement based on fringe projection profilometry and deep learning","authors":"Yuxuan Che, Wei Yin","doi":"10.1117/12.2642326","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":262440,"journal":{"name":"Optical Metrology and Inspection for Industrial Applications IX","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-01-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Metrology and Inspection for Industrial Applications IX","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2642326","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}