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A Calibration Method for De-Embedding a Microwave Test Fixture 一种微波测试夹具去埋的标定方法
27th ARFTG Conference Digest Pub Date : 1986-06-05 DOI: 10.1109/ARFTG.1986.323670
S. Rosenbaum, O. Pitzalis, J. Marzan
{"title":"A Calibration Method for De-Embedding a Microwave Test Fixture","authors":"S. Rosenbaum, O. Pitzalis, J. Marzan","doi":"10.1109/ARFTG.1986.323670","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323670","url":null,"abstract":"A practical method has been developed to remove test fixture contributions from microwave measurements of transistors, monolithic microwave integrated circuits (MMICs), diodes, and other devices. The method uses a unique set of insertable calibration standards to locate the measurement plane within the microwave test fixture. No disassembly of the fixture, disturbance of the coaxial connections, or external computer is necessary.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"691 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121990357","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Speed Comparisons for Reflection Coefficient Measurement Methods 反射系数测量方法的速度比较
27th ARFTG Conference Digest Pub Date : 1986-06-01 DOI: 10.1109/ARFTG.1986.323676
J. Ashley
{"title":"Speed Comparisons for Reflection Coefficient Measurement Methods","authors":"J. Ashley","doi":"10.1109/ARFTG.1986.323676","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323676","url":null,"abstract":"Since I use the word \"phasor\" where t r a d i t i o n uses \"vector\" , some c o m n t s on terminology are p e r t i n e n t . My 1950 course i n AC c i r c u i t ana lys i s d i d use the word \"vector\" along w i t h drawings c a l l e d \"vec to r diagrams\". As f i e l d theo ry courses were added t o the EE curriculum, vec to r was a l s o needed fo r space vec to r analys is . The c i r c u i t t heo ry courses coined the word \"phasor\" t o rep lace vector .","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127077517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Load-Pull Characterization for Mesfet Oscillator Design 介面效应振荡器设计的负载-拉力特性
27th ARFTG Conference Digest Pub Date : 1986-06-01 DOI: 10.1109/ARFTG.1986.323673
G. Bava, U. Pisani, V. Pozzolo
{"title":"Load-Pull Characterization for Mesfet Oscillator Design","authors":"G. Bava, U. Pisani, V. Pozzolo","doi":"10.1109/ARFTG.1986.323673","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323673","url":null,"abstract":"","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"39 10-11","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120917163","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Real Time Tracking Measurements of a Time-Varying Comlex Impedance at K-Band Using Three Fixed Probes 用三个固定探头实时跟踪测量k波段时变复杂阻抗
27th ARFTG Conference Digest Pub Date : 1986-06-01 DOI: 10.1109/ARFTG.1986.323672
Chia-lun J. Hu
{"title":"Real Time Tracking Measurements of a Time-Varying Comlex Impedance at K-Band Using Three Fixed Probes","authors":"Chia-lun J. Hu","doi":"10.1109/ARFTG.1986.323672","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323672","url":null,"abstract":"Three-probe microwave automatic impedance measuring system has been designed and used in many places. The principle of this system is similar to that of the six-port systems. But because of the simplicity of the three-probe theories. It is possible to realized the design of the three-probe system by using only analog circuits as reported in IEEE Trasactions on MTT as well as in the ARFTG conferences. The main advantage of this analog system is its real time measurement capacity. That is, it can measure and track in real time the variations of the real and the imaginary parts of the unknown complex impedance when this impedance is varying in real time. In this article, the author wish to report to the audience some experimental results of real-time tracking comparison measurements. These results were obtained by using simultaneously an HP 8410 automatic network analyzer and the current three-probe system. The 8410 is used with data taken directly from its analog output without going through its digital processing part. The quantitative difference between these two measured results is seen to be within a few percents while the qualitative variations of the two are exactly the same. The digitally treated outputs from any commercial network analyzer are usually more accurate but they are not measured continuously in real time. That is, it may not capture many important features of the varying unknown impedance when the impedance is varying very fast in real time.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131261622","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Repeatability Issues for De-Embedding Microstrip Discontinuity S-Parameter Measurements by the TSD Technique 用TSD技术去除嵌入微带不连续s参数测量的可重复性问题
27th ARFTG Conference Digest Pub Date : 1986-06-01 DOI: 10.1109/ARFTG.1986.323665
L. Dunleavy, P. Katehi
{"title":"Repeatability Issues for De-Embedding Microstrip Discontinuity S-Parameter Measurements by the TSD Technique","authors":"L. Dunleavy, P. Katehi","doi":"10.1109/ARFTG.1986.323665","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323665","url":null,"abstract":"Connection repeatability is a critical issue for millimeter-wave de-embedding. Regardless of the de-embedding scheme, the electrical connections made to standards used for fixture characterization must be repeatable and similar to those made to the device under test. Key repeatability issues related to the measurement of microstrip discontinuities with the \"TSD\" (thru-short-delay) technique are discussed. These include the repeatability of coax/microstrip connections, microstrip/microstrip interconnects, microstrip line fabrication and substrate mounting, and the electrical characteristics of coax-to-microstrip transitions (launchers). Each of these issues has been explored experimentally and the results are presented for two types of coaxial-to-microstrip test fixtures: one usable from 2 to 18GHz, and the other from 2 to 40GHz.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126875273","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Coherent (I/Q) Detector Performance Under Extended Drive Signal Conditions 扩展驱动信号条件下相干(I/Q)检测器的性能
27th ARFTG Conference Digest Pub Date : 1986-06-01 DOI: 10.1109/ARFTG.1986.323661
G. Bright, R. Macior, H. Schuman
{"title":"Coherent (I/Q) Detector Performance Under Extended Drive Signal Conditions","authors":"G. Bright, R. Macior, H. Schuman","doi":"10.1109/ARFTG.1986.323661","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323661","url":null,"abstract":"Procedures are needed for accurate and efficient testing of large quantities of microwave amplifier/digital phase shifter devices under a wide variety of signal and environment conditions. Pulsed conditions, in particular, preclude the use of conventional automatic network analyzers. A method is investigated for applying direct detection (no local oscillator) I/Q detectors to obtain accurate phase measurements without the need for leveling input signals. The investigation focuses on identifying the minimum amount of measured calibration data required to reduce uncertainties in measured phase to less than 1°. A mathematical model of the device is developed that contains parameters that can be defined from a limited amount of calibration data. Once defined, the model then can be used to determine the device error for a wide range of signal amplitudes and phases. Data obtained with an Anaren phase discriminator is presented as an illustration of the method.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122880625","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Planar Impedance Standards and Accuracy Considerations in Vector Network Analysis 矢量网络分析中的平面阻抗标准和精度考虑
27th ARFTG Conference Digest Pub Date : 1986-06-01 DOI: 10.1109/ARFTG.1986.323671
E. Strid
{"title":"Planar Impedance Standards and Accuracy Considerations in Vector Network Analysis","authors":"E. Strid","doi":"10.1109/ARFTG.1986.323671","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323671","url":null,"abstract":"An equation is given for theoretical errors in oneport corrected vector S-parameter measurements (in any transmission media). The error analysis is used to investigate parasitics peculiar to planar impedance standards. Experimental results verify the error analysis, and show that parasitics as small as 5 pH are repeatably measurable. Application to GaAsFET measurements through 26 GHz is discussed.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123865129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
How To Generate Accurate Broadband Pulsed Microwave Signals 如何产生精确的宽带脉冲微波信号
27th ARFTG Conference Digest Pub Date : 1986-06-01 DOI: 10.1109/ARFTG.1986.323663
R. Beers
{"title":"How To Generate Accurate Broadband Pulsed Microwave Signals","authors":"R. Beers","doi":"10.1109/ARFTG.1986.323663","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323663","url":null,"abstract":"","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"285 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120873176","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Strategy for Automatic Wide-Dynamic-Range Radio Spectrum Measurements 一种自动宽动态范围无线电频谱测量策略
27th ARFTG Conference Digest Pub Date : 1986-06-01 DOI: 10.1109/ARFTG.1986.323675
R. Matheson
{"title":"A Strategy for Automatic Wide-Dynamic-Range Radio Spectrum Measurements","authors":"R. Matheson","doi":"10.1109/ARFTG.1986.323675","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323675","url":null,"abstract":"","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"263 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133592601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Preliminary Results of a Time-Harmonic Electromagnetic Analysis of Shielded Microstrip Circuits 屏蔽微带电路时谐电磁分析的初步结果
27th ARFTG Conference Digest Pub Date : 1986-06-01 DOI: 10.1109/ARFTG.1986.323668
J. Rautio, R. Harrington
{"title":"Preliminary Results of a Time-Harmonic Electromagnetic Analysis of Shielded Microstrip Circuits","authors":"J. Rautio, R. Harrington","doi":"10.1109/ARFTG.1986.323668","DOIUrl":"https://doi.org/10.1109/ARFTG.1986.323668","url":null,"abstract":"The precise analysis of microstrip circuits at microwave and millimeter wave frequencies has become critically important in the design of monolithic microwave GaAs integrated circuits. This is because the usual post-fabrication 'tweaking' of circuit response is rarely feasible and the resulting lengthy repeated design modifications drive design costs to unacceptable levels. This paper will describe a Galerkin method of moments analysis for microstrip circuits of arbitrary planar geometry enclosed in a rectangular conducting box. The technique entails a time-harmonic electromagnetic analysis evaluating all fields and surface currents. This analysis is suitable for the accurate verification of designs prior to fabrication. Thus any necessary modifications may be made quickly and inexpensively. A computer program has been written in Pascal on an IBM-PC and preliminary results will be presented.","PeriodicalId":261285,"journal":{"name":"27th ARFTG Conference Digest","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1986-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115114851","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
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