一种微波测试夹具去埋的标定方法

27th ARFTG Conference Digest Pub Date : 1986-06-05 DOI:10.1109/ARFTG.1986.323670

S. Rosenbaum, O. Pitzalis, J. Marzan

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引用次数: 3

摘要

一种实用的方法已经开发，以消除测试夹具的贡献，从微波测量晶体管，单片微波集成电路(mmic)，二极管，和其他器件。该方法使用一套独特的可插入校准标准来定位微波测试夹具内的测量平面。不需要拆卸夹具，干扰同轴连接，也不需要外部计算机。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A Calibration Method for De-Embedding a Microwave Test Fixture

A practical method has been developed to remove test fixture contributions from microwave measurements of transistors, monolithic microwave integrated circuits (MMICs), diodes, and other devices. The method uses a unique set of insertable calibration standards to locate the measurement plane within the microwave test fixture. No disassembly of the fixture, disturbance of the coaxial connections, or external computer is necessary.

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27th ARFTG Conference Digest

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