发布求助
文献互助 智能选刊 最新文献

35th ARFTG Conference Digest最新文献

筛选
英文 中文
Using Embedded Microcontrollers in Radar Test Equipment 嵌入式单片机在雷达测试设备中的应用
35th ARFTG Conference Digest Pub Date : 1990-07-01 DOI: 10.1109/ARFTG.1990.323978
Richard S. Binney, L. E. Riblett
{"title":"Using Embedded Microcontrollers in Radar Test Equipment","authors":"Richard S. Binney, L. E. Riblett","doi":"10.1109/ARFTG.1990.323978","DOIUrl":"https://doi.org/10.1109/ARFTG.1990.323978","url":null,"abstract":"With the recent advancements in microcontroller technology, radar test equipment can be designed to improve the accuracy of measurements being made and simplify designs. An embedded integrator monitor design application (hardware and software) is presented and comparisons are made between the embedded design and the more traditional discrete design approach.","PeriodicalId":256746,"journal":{"name":"35th ARFTG Conference Digest","volume":"121 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122058386","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Model Fitting Using Both TDR and Frequency Responses 使用TDR和频率响应的模型拟合
35th ARFTG Conference Digest Pub Date : 1990-05-10 DOI: 10.1109/ARFTG.1990.323972
R. Lane
{"title":"Model Fitting Using Both TDR and Frequency Responses","authors":"R. Lane","doi":"10.1109/ARFTG.1990.323972","DOIUrl":"https://doi.org/10.1109/ARFTG.1990.323972","url":null,"abstract":"Fitting a circuit model to measured data is usually accomplished by matching the model's calculated 'S' parameters to the target's 'S' parameters as measured on a VANA over the model's operating frequency range. For electrically \" long\" structures, several wavelengths long at the upper modelling frequency and poor starting values, the conventional technique leads to convergence difficulties. Using the IFT to effectively obtain the time domain step reflection response and matching this to the target's similarly transformed response, leads to better starting values and surer convergence. Examples are given, run on a low cost, commercially available circuit analysis program, of optimization using frequency domain only and time/frequency domain switching, for several simple networks. Some of the resolution limitations inherent in the method and choice of mode switching points are discussed.","PeriodicalId":256746,"journal":{"name":"35th ARFTG Conference Digest","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117216464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Vector Pulse Profiling Using Carrier Spectral Line with 20 Nanosecond Resolution 20纳秒分辨率载波谱线矢量脉冲分析
35th ARFTG Conference Digest Pub Date : 1990-05-10 DOI: 10.1109/ARFTG.1990.323982
M. Grace, P. Kapetanic
{"title":"Vector Pulse Profiling Using Carrier Spectral Line with 20 Nanosecond Resolution","authors":"M. Grace, P. Kapetanic","doi":"10.1109/ARFTG.1990.323982","DOIUrl":"https://doi.org/10.1109/ARFTG.1990.323982","url":null,"abstract":"Pulse Microwave Systems are used extensively in radar and electronic warfare equipment. The ability to characterize these systems under pulse microwave operating conditions has only recently been developed. In addition, pulse techniques are used to characterize the varied components used in these systems such as transmit-receive switches, pulsed amplifiers, and pulsed MMIC transceivers. Pulsc measurements are also used to prevent thermal destruction of semi-conductor devices that do not have the proper heat sinking for on-wafer testing.","PeriodicalId":256746,"journal":{"name":"35th ARFTG Conference Digest","volume":"61 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121005681","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Measuring the Surface Reflection and Attenuation of Absorbing Materials in Free Space 自由空间中吸收材料表面反射与衰减的测量
35th ARFTG Conference Digest Pub Date : 1990-05-10 DOI: 10.1109/ARFTG.1990.323984
H. Stinehelfer
{"title":"Measuring the Surface Reflection and Attenuation of Absorbing Materials in Free Space","authors":"H. Stinehelfer","doi":"10.1109/ARFTG.1990.323984","DOIUrl":"https://doi.org/10.1109/ARFTG.1990.323984","url":null,"abstract":"","PeriodicalId":256746,"journal":{"name":"35th ARFTG Conference Digest","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127952794","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Algorithm for Using a Slide-Screw Tuner as a Computer-Controlled Impedance 一种利用滑丝调谐器作为计算机控制阻抗的算法
35th ARFTG Conference Digest Pub Date : 1990-05-10 DOI: 10.1109/ARFTG.1990.323976
G. Sloan
{"title":"An Algorithm for Using a Slide-Screw Tuner as a Computer-Controlled Impedance","authors":"G. Sloan","doi":"10.1109/ARFTG.1990.323976","DOIUrl":"https://doi.org/10.1109/ARFTG.1990.323976","url":null,"abstract":"In the testing of active microwave components, a common test procedure is to evaluate a device's performance when subjected to an all-phase, constant-standing-wave-ratio (APCS) load pull. Such a test specification is useful in verifying a device's stability and mismatch performance. Typically, APCS pulls are tediously performed by hand, with manually operated tuners. However, with the advent of mechanical, computer-controlled tuners, it is now possible to automate this procedure.","PeriodicalId":256746,"journal":{"name":"35th ARFTG Conference Digest","volume":"135 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114508819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
On Wafer Pulse Power Vector Testing 晶圆脉冲功率矢量测试
35th ARFTG Conference Digest Pub Date : 1990-05-10 DOI: 10.1109/ARFTG.1990.323983
J. Mahon, P. Ersland, C. Weichert, Mike Lally, J. Lanteri, D. Kaputa
{"title":"On Wafer Pulse Power Vector Testing","authors":"J. Mahon, P. Ersland, C. Weichert, Mike Lally, J. Lanteri, D. Kaputa","doi":"10.1109/ARFTG.1990.323983","DOIUrl":"https://doi.org/10.1109/ARFTG.1990.323983","url":null,"abstract":"","PeriodicalId":256746,"journal":{"name":"35th ARFTG Conference Digest","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128146655","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Limitations and Accuracy of CAD Simulators for Discontinuity Models on GaAs Substrates GaAs衬底不连续模型的CAD模拟器的局限性和准确性
35th ARFTG Conference Digest Pub Date : 1990-05-10 DOI: 10.1109/ARFTG.1990.323973
John D. Goshinska, M. Dydyk, Ron Kielmeyer
{"title":"Limitations and Accuracy of CAD Simulators for Discontinuity Models on GaAs Substrates","authors":"John D. Goshinska, M. Dydyk, Ron Kielmeyer","doi":"10.1109/ARFTG.1990.323973","DOIUrl":"https://doi.org/10.1109/ARFTG.1990.323973","url":null,"abstract":"This paper presents the results of a study to establish the limitations and accuracy of commercially available CAD simulators for microstrip discontinuities, commonly referred to as the corner, step, tee and cross [l]. Measured S-parameters of these discontinuities fabricated on a 100 micron GaAs substrate are compared against results from TOUCHSTONE, SUPER COMPACT, EMsim and SONNET simulators. Results presented indicate that none of the currently available CAD simulators, used in this study, are capable of predicting microstrip discontinuities performance with sufficient accuracy to permit first time design success in MMIC technology.","PeriodicalId":256746,"journal":{"name":"35th ARFTG Conference Digest","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125389532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Self Calibration System for a Microwave Spectrum Analyzer 微波频谱分析仪的自校准系统
35th ARFTG Conference Digest Pub Date : 1990-05-10 DOI: 10.1109/ARFTG.1990.323974
C. Bryant
{"title":"Self Calibration System for a Microwave Spectrum Analyzer","authors":"C. Bryant","doi":"10.1109/ARFTG.1990.323974","DOIUrl":"https://doi.org/10.1109/ARFTG.1990.323974","url":null,"abstract":"","PeriodicalId":256746,"journal":{"name":"35th ARFTG Conference Digest","volume":"293 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115928886","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Stability Tester for MTI Radar Transmitters MTI雷达发射机稳定性测试仪
35th ARFTG Conference Digest Pub Date : 1990-05-10 DOI: 10.1109/ARFTG.1990.323980
F. Jones, David Mackes, James M. Van Damme
{"title":"A Stability Tester for MTI Radar Transmitters","authors":"F. Jones, David Mackes, James M. Van Damme","doi":"10.1109/ARFTG.1990.323980","DOIUrl":"https://doi.org/10.1109/ARFTG.1990.323980","url":null,"abstract":"Modern radars rely heavily on multiple coherent pulses for reduction of clutter. This has become more important in the case of military radar. Discusses stability testingf for MTI radar transmission.","PeriodicalId":256746,"journal":{"name":"35th ARFTG Conference Digest","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114278468","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
S-Parameter and Equivaleat-Circuit-Parameter Statistics s参数和等效电路参数统计
35th ARFTG Conference Digest Pub Date : 1990-05-01 DOI: 10.1109/ARFTG.1990.323979
R. Anholt, R. Worley, R. Neidhard
{"title":"S-Parameter and Equivaleat-Circuit-Parameter Statistics","authors":"R. Anholt, R. Worley, R. Neidhard","doi":"10.1109/ARFTG.1990.323979","DOIUrl":"https://doi.org/10.1109/ARFTG.1990.323979","url":null,"abstract":"We compare the ability of three different equivalent-circuit extraction methods to give ensembles of model parameters that accurately predict not only average S-parameters but the S-parameter statistics the standard deviations and intercorrelations between the real and imaginary parts. Measurements were made for 400 GaAs MESFET's fabricated on a single wafer with an MBE-grown active layer. Data is compared for different biases. We find that bimodal distributions give unphysical correlations that the equivalent-circuit models fail to model. The possibility of using uncorrelated equivalent-circuit values is also discussed.","PeriodicalId":256746,"journal":{"name":"35th ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117340078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信