Vector Pulse Profiling Using Carrier Spectral Line with 20 Nanosecond Resolution

Abstract

Pulse Microwave Systems are used extensively in radar and electronic warfare equipment. The ability to characterize these systems under pulse microwave operating conditions has only recently been developed. In addition, pulse techniques are used to characterize the varied components used in these systems such as transmit-receive switches, pulsed amplifiers, and pulsed MMIC transceivers. Pulsc measurements are also used to prevent thermal destruction of semi-conductor devices that do not have the proper heat sinking for on-wafer testing.