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Proceedings IEEE European Test Workshop最新文献

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Bridging the testing speed gap: design for delay testability 弥合测试速度差距:延迟可测试性设计
Proceedings IEEE European Test Workshop Pub Date : 2000-05-23 DOI: 10.1109/ETW.2000.873771
H. Speek, H. Kerkhoff, M. Sachdev, M. Shashaani
{"title":"Bridging the testing speed gap: design for delay testability","authors":"H. Speek, H. Kerkhoff, M. Sachdev, M. Shashaani","doi":"10.1109/ETW.2000.873771","DOIUrl":"https://doi.org/10.1109/ETW.2000.873771","url":null,"abstract":"The economic testing of high-speed digital ICs is becoming increasingly problematic. Even advanced, expensive testers are not always capable of testing these ICs because of their high-speed limitations. This paper focuses on a design for delay testability technique such that high-speed ICs can be tested using inexpensive, low-speed ATE. Also extensions for possible full BIST of delay faults are addressed.","PeriodicalId":255826,"journal":{"name":"Proceedings IEEE European Test Workshop","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128581834","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
A system level boundary scan controller board for VME applications [to CERN experiments] 用于VME应用的系统级边界扫描控制器板[用于CERN实验]
Proceedings IEEE European Test Workshop Pub Date : 2000-05-23 DOI: 10.1109/ETW.2000.873793
N. Cardoso, C. B. Almeida, José Carlos da Silva
{"title":"A system level boundary scan controller board for VME applications [to CERN experiments]","authors":"N. Cardoso, C. B. Almeida, José Carlos da Silva","doi":"10.1109/ETW.2000.873793","DOIUrl":"https://doi.org/10.1109/ETW.2000.873793","url":null,"abstract":"This work is the result of a collaboration between INESC and LIP in the CMS experiment being conducted at CERN. The collaboration addresses the application of boundary scan test at system level namely the development of a VME boundary scan controller (BSC) board prototype and the corresponding software. This prototype uses the MTM bus existing in the VME64/spl times/ backplane to apply the 1149.1 test vectors to a system composed of nineteen boards, called here units under test (UUTs). A top-down approach is used to describe our work. The paper begins with some insights about the experiment being conducted at CERN, proceed with system level considerations concerning our work and with some details about the BSC board. The results obtained so far and the proposed work is reviewed in the end of this contribution.","PeriodicalId":255826,"journal":{"name":"Proceedings IEEE European Test Workshop","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133931696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Fast and low-area TPGs based on T-type flip-flops can be easily integrated to the scan path 基于t型触发器的快速和低面积TPGs可以很容易地集成到扫描路径中
Proceedings IEEE European Test Workshop Pub Date : 2000-05-23 DOI: 10.1109/ETW.2000.873794
T. Garbolino, A. Hlawiczka, A. Kristof
{"title":"Fast and low-area TPGs based on T-type flip-flops can be easily integrated to the scan path","authors":"T. Garbolino, A. Hlawiczka, A. Kristof","doi":"10.1109/ETW.2000.873794","DOIUrl":"https://doi.org/10.1109/ETW.2000.873794","url":null,"abstract":"A new structure of the fast and low-area test pattern generator (TPG) composed of T-type flip-flops that can be easily integrated to the scan path is proposed in the paper. Nowadays, techniques of incorporating TPGs containing T-type flip-flops to the scan path either use asynchronous set and reset inputs of flip-flops or require adding a large amount of logic to transform TPG into the shift register. They all introduce large area overhead and degrade timing parameters of TPG. The area overhead of a new TPG structure is much less than in the case of to-day existing solutions. Moreover, it possess better timing parameters than conventionally designed TPGs. This last feature has been partially achieved due to the use of dedicated T-type flip-flop, whose design is presented in the paper. In addition, authors propose a testing method that is suitable for verifying correct functioning of both the scan-path and the new type TPGs incorporated in it.","PeriodicalId":255826,"journal":{"name":"Proceedings IEEE European Test Workshop","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122491004","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
RTL-based functional test generation for high defects coverage in digital SOCs 基于rtl的数字soc高缺陷覆盖率功能测试生成
Proceedings IEEE European Test Workshop Pub Date : 2000-05-23 DOI: 10.1109/ETW.2000.873785
Marcelino B. Santos, F. Gonçalves, I. Teixeira, João Paulo Teixeira
{"title":"RTL-based functional test generation for high defects coverage in digital SOCs","authors":"Marcelino B. Santos, F. Gonçalves, I. Teixeira, João Paulo Teixeira","doi":"10.1109/ETW.2000.873785","DOIUrl":"https://doi.org/10.1109/ETW.2000.873785","url":null,"abstract":"Functional test is long viewed as unfitted for production test. The purpose of this contribution is to propose a RTL-based test generation methodology which can be rewardingly used both for design validation and to enhance the test effectiveness of classic, gate-level test generation. Hence, a RTL-based defect-oriented test generation methodology is proposed, for which a high defects coverage (DC) and a relatively short test sequence can be derived, thus allowing low-energy operation in test mode. The test effectiveness, regarding DC, is shown to be weakly dependent on the structural implementation of the behavioral description. The usefulness of the methodology is ascertained using the VeriDOS simulation environment and the CMUDSP ITC'99 benchmark circuit.","PeriodicalId":255826,"journal":{"name":"Proceedings IEEE European Test Workshop","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122676509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 35
Combining symbolic and genetic techniques for efficient sequential circuit test generation 结合符号和遗传技术实现高效的顺序电路测试生成
Proceedings IEEE European Test Workshop Pub Date : 2000-05-23 DOI: 10.1109/ETW.2000.873786
M. Boschini, X. Yu, F. Fummi, E. Rudnick
{"title":"Combining symbolic and genetic techniques for efficient sequential circuit test generation","authors":"M. Boschini, X. Yu, F. Fummi, E. Rudnick","doi":"10.1109/ETW.2000.873786","DOIUrl":"https://doi.org/10.1109/ETW.2000.873786","url":null,"abstract":"Symbolic and genetic techniques are combined in a new approach to sequential circuit test generation that uses circuit decomposition, rather than the algorithmic decomposition used in previous hybrid test generators. Symbolic techniques are used to generate test sequences for the control logic, and genetic algorithms are used to generate sequences for the datapath. The combined sequences provide higher fault coverages than those generated by existing deterministic and GA-based test generators, and execution times are significantly lower in many cases.","PeriodicalId":255826,"journal":{"name":"Proceedings IEEE European Test Workshop","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125998984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
CA-CSTP: a new BIST architecture for sequential circuits CA-CSTP:时序电路的一种新的BIST体系结构
Proceedings IEEE European Test Workshop Pub Date : 2000-05-23 DOI: 10.1109/ETW.2000.873795
F. Corno, M. Sonza Reorda, Giovanni Squillero, M. Violante
{"title":"CA-CSTP: a new BIST architecture for sequential circuits","authors":"F. Corno, M. Sonza Reorda, Giovanni Squillero, M. Violante","doi":"10.1109/ETW.2000.873795","DOIUrl":"https://doi.org/10.1109/ETW.2000.873795","url":null,"abstract":"Circular Self-Test Path (CSTP) is an attractive technique for implementing BIST in sequential circuits; unfortunately, there are cases in which the fault coverage it attains is unacceptably low. This paper proposes a new architecture, named CA-CSTP, which overcomes these limitations and always reaches a high fault coverage by exploiting a slightly more complex chain cell based on a Cellular Automata architecture. Experimental results show the effectiveness of our proposal.","PeriodicalId":255826,"journal":{"name":"Proceedings IEEE European Test Workshop","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126832754","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Towards an ADC BIST scheme using the histogram test technique 基于直方图测试技术的ADC BIST方案
Proceedings IEEE European Test Workshop Pub Date : 2000-05-23 DOI: 10.1109/ETW.2000.873779
F. Azaïs, S. Bernard, Y. Betrand, M. Renovell
{"title":"Towards an ADC BIST scheme using the histogram test technique","authors":"F. Azaïs, S. Bernard, Y. Betrand, M. Renovell","doi":"10.1109/ETW.2000.873779","DOIUrl":"https://doi.org/10.1109/ETW.2000.873779","url":null,"abstract":"This paper discusses the viability of a BIST implementation for the sinusoidal histogram technique classically used for ADC testing. An original approach based on (i) approximations to estimate the ADC parameters, (ii) decomposition of the global test in a code-after-code test procedure and (iii) piecewise approximation to compute the ideal histogram is developed. These three features allow a significant reduction of the required operative resources as well as the required memory resources dedicated to the storage of both experimental and reference data.","PeriodicalId":255826,"journal":{"name":"Proceedings IEEE European Test Workshop","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126715639","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 85
How to avoid random walks in hierarchical test path identification 分层测试路径识别中如何避免随机游走
Proceedings IEEE European Test Workshop Pub Date : 2000-05-23 DOI: 10.1109/ETW.2000.873787
Y. Makris, Jamison D. Collins, A. Orailoglu
{"title":"How to avoid random walks in hierarchical test path identification","authors":"Y. Makris, Jamison D. Collins, A. Orailoglu","doi":"10.1109/ETW.2000.873787","DOIUrl":"https://doi.org/10.1109/ETW.2000.873787","url":null,"abstract":"Hierarchical test approaches address the complexity of test generation through symbolic reachability paths that provide access to the I/Os of each module in a hierarchical design. While transparency behavior suitable for symbolic design traversal can be utilized for datapath modules, control modules do not exhibit transparency, and therefore require exhaustive search algorithms or expensive DFT hardware. In this paper we introduce a fast hierarchical test path identification methodology for circuits with no DFT at the controller-datapath interface. We introduce the concept of influence tables, modeling the impact of control states on the datapath, based on which appropriate state sequences for accessing each module are identified. Imposition of such sequences on a hierarchical test path identification algorithm, in the form of constraints, results in significant speedup over alternative non-DFT based approaches.","PeriodicalId":255826,"journal":{"name":"Proceedings IEEE European Test Workshop","volume":"122 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130783307","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Defect detection from visual abnormalities in manufacturing process using I/sub DDQ/ 利用I/sub DDQ/对制造过程中的视觉异常进行缺陷检测
Proceedings IEEE European Test Workshop Pub Date : 2000-05-23 DOI: 10.1109/ETW.2000.873777
M. Sanada
{"title":"Defect detection from visual abnormalities in manufacturing process using I/sub DDQ/","authors":"M. Sanada","doi":"10.1109/ETW.2000.873777","DOIUrl":"https://doi.org/10.1109/ETW.2000.873777","url":null,"abstract":"Abnormal I/sub DDQ/ (quiescent V/sub DD/ supply current) indicates the existence of physical damage in a circuit. Using this phenomenon, a CAD-based fault diagnosis technology has been developed to enhance the manufacturing yield of logic LSI. This method to detect the fatal defect fragments in several abnormalities identified with wafer inspection apparatus includes a way to separate various leakage faults, and to define the diagnosis area encircling the abnormal portions. The proposed technique progressively narrows the faulty area by using logic simulation to extract the logic states of the diagnosis area, and by locating test vectors related to abnormal I/sub DDQ/. The fundamental diagnosis way employs the comparative operation of each circuit element to determine whether the same logic state with abnormal I/sub DDQ/ exists in normal logic state or not.","PeriodicalId":255826,"journal":{"name":"Proceedings IEEE European Test Workshop","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124824296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Low cost concurrent test implementation for linear digital systems 线性数字系统的低成本并行测试实现
Proceedings IEEE European Test Workshop Pub Date : 2000-05-23 DOI: 10.1109/ETW.2000.873791
I. Bayraktaroglu, A. Orailoglu
{"title":"Low cost concurrent test implementation for linear digital systems","authors":"I. Bayraktaroglu, A. Orailoglu","doi":"10.1109/ETW.2000.873791","DOIUrl":"https://doi.org/10.1109/ETW.2000.873791","url":null,"abstract":"An implementation of a low-cost, time-extended invariant-based concurrent test scheme for linear digital systems is presented. Both feedback and non-feedback systems are analyzed to identify gate and RT level implementation requirements for high on-line fault coverage. Simulation results on implementations satisfying the outlined requirements indicate that low latency, 100% on-line fault coverage is attained within hardware costs comparable to those of scan insertion.","PeriodicalId":255826,"journal":{"name":"Proceedings IEEE European Test Workshop","volume":"146 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116466690","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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