2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)最新文献_第2页

Safe Operation Area Of Trench-Gate And Low-Charge Power MOSFET 沟栅和低电荷功率MOSFET的安全工作区域

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI: 10.1109/RADECS45761.2018.9328679

G. Davydov, D. Boychenko, Daria V. Pechenkina, A. Tararaksin, T. Kritskaya, A. Polokhov

引用次数: 1

TID Effects on Soft-breakdown and Self-heating Characteristics of 400V SOI NLDMOSFETs TID对400V SOI nldmosfet软击穿和自热特性的影响

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI: 10.1109/RADECS45761.2018.9328663

Lei Shu, Liang Wang, Xin Zhou, Yuan Li, Tongde Li, Zhangyi’an Yuan, Cheng-Long Sui, Yuanfu Zhao

引用次数: 5

Proton Testing of the NXP P4080 Processor at the COSY Accelerator 恩智浦P4080处理器在COSY加速器上的质子测试

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI: 10.1109/RADECS45761.2018.9328704

S. Hoeffgen, Mirko Liebender, M. Baum, Christopher Carl, O. Felden, Tobias Kündgen, W. Lennartz, S. Metzger, Samuel Plettner, Friedrich Schün

引用次数: 0

A SET Harden Phase-Locked Loop with Perturbation Compensated Charge Pump & Interleaved VCO 带扰动补偿电荷泵和交错压控振荡器的SET强化锁相环

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI: 10.1109/RADECS45761.2018.9328650

Yuan-feng Wei, Haigang Yang, Tianwen Li, Zhujia Chen

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引用次数: 1

Single-Event Transients in a PIN Photodiode and a Single-Photon Avalanche Diode Integrated in 0.35μm CMOS 集成在0.35μm CMOS中的PIN光电二极管和单光子雪崩二极管的单事件瞬态

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI: 10.1109/RADECS45761.2018.9328700

M. Hofbauer, B. Steindl, K. Schneider-Hornstein, B. Goll, K. Voss, H. Zimmermann

引用次数: 0

A Zero-Timing Overhead SET Mitigation Approach for Flash-based FPGAs 基于flash的fpga零时序开销SET缓解方法

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI: 10.1109/RADECS45761.2018.9328665

S. Azimi, B. Du, L. Sterpone

引用次数: 2

The General Chairman's Address 主席的讲话

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI: 10.1109/radecs45761.2018.9328699

S. Habinc

引用次数: 0

Modeling of Annular Gate MOS Transistors 环形栅极MOS晶体管的建模

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI: 10.1109/RADECS45761.2018.9328697

V. Bezhenova, A. Michalowska-Forsyth

引用次数: 3

Long-Term Degradation Study of CMOS SPADs in Space Radiation Environment 空间辐射环境下CMOS spad的长期退化研究

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI: 10.1109/RADECS45761.2018.9328660

M. Campajola, F. Di Capua, D. Fiore, C. Nappi, E. Sarnelli, L. Gasparini

引用次数: 3

Evaluation of Heavy-Ion-Induced SEU Cross Sections of a 65-nm Thin BOX FD-SOI Flip-Flops Based on Stacked Inverter 基于堆叠逆变器的65 nm薄盒FD-SOI触发器的重离子诱导SEU截面评估

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2018-09-01 DOI: 10.1109/RADECS45761.2018.9328724

J. Furuta, Kentaro Kojima, Kazutoshi Kobayashi

引用次数: 2