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A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates 微波衬底电特性的CPW t谐振器技术
57th ARFTG Conference Digest Pub Date : 2002-08-07 DOI: 10.1109/7260.989861
R. L. Peterson, R. F. Drayton
{"title":"A CPW T-Resonator Technique for Electrical Characterization of Microwave Substrates","authors":"R. L. Peterson, R. F. Drayton","doi":"10.1109/7260.989861","DOIUrl":"https://doi.org/10.1109/7260.989861","url":null,"abstract":"The microstrip T-resonator is a well established tool for determining broadband electrical properties of microwave materials, namely effective dielectric constant and attenuation. In this paper finite ground coplanar waveguide (CPW) T-resonators on high resistivity silicon are presented and evaluated. The multi-moding seen in CPW T-junctions is effectively eliminated through the use of gold wire bonds. The calibration independence of the CPW T-resonator technique is demonstrated and the predicted impedance independence of the CPW ¿T¿ is experimentally validated. The electrical property results obtained using the T-resonator on high resistivity silicon substrates are in good agreement with data from other characterization techniques. The CPW T-resonator is thus shown to provide rapid and accurate characterization of integrated microwave substrates.","PeriodicalId":248678,"journal":{"name":"57th ARFTG Conference Digest","volume":"112 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116757633","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 43
Complex Relative Permittivity Measurement in the Frequency Range of 30-110 GHz by Fabry-Perot Resonator Method 用法布里-珀罗腔法测量30-110 GHz频率范围内的复相对介电常数
57th ARFTG Conference Digest Pub Date : 2001-05-25 DOI: 10.1109/ARFTG.2001.327475
Ryuichi Katsumi, Y. Higashida
{"title":"Complex Relative Permittivity Measurement in the Frequency Range of 30-110 GHz by Fabry-Perot Resonator Method","authors":"Ryuichi Katsumi, Y. Higashida","doi":"10.1109/ARFTG.2001.327475","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327475","url":null,"abstract":"The relative permittivity, ¿¿, and the dielectric loss tangent, tan¿, of ceramics were measured in the frequency range of 30-110 GHz by Fabry-Perot resonator method. The measurement error of ¿¿ was ± 0.5% and that of tan¿ was 1×10-5.","PeriodicalId":248678,"journal":{"name":"57th ARFTG Conference Digest","volume":"76 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126029689","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
In-circuit, Non-Contacting, S-parameter measurement for planar circuits 平面电路的在线、非接触、s参数测量
57th ARFTG Conference Digest Pub Date : 2001-05-25 DOI: 10.1109/ARFTG.2001.327465
J. Stenarson, K. Yhland, C. Wingqvist
{"title":"In-circuit, Non-Contacting, S-parameter measurement for planar circuits","authors":"J. Stenarson, K. Yhland, C. Wingqvist","doi":"10.1109/ARFTG.2001.327465","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327465","url":null,"abstract":"A method for measuring S-parameters of a circuit embedded in a planar circuit environment is presented. The method utilizes an inductive and a capacitive probe. Experimental results are presented for probe measurements of reflection coefficient from 0.7 to 20 GHz with good agreement to verifying measurements up to 14 GHz. The method shows great promise for in-circuit S-parameter testing that has previously required physical modification or even complete disassembly to test sub-circuits in a microstrip environment.","PeriodicalId":248678,"journal":{"name":"57th ARFTG Conference Digest","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128741068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Comparison of Active and Passive Load-Pull Test Benches 主动式和被动式载荷-拉力试验台的比较
57th ARFTG Conference Digest Pub Date : 2001-05-25 DOI: 10.1109/ARFTG.2001.327461
C. Arnaud, J. Carbonéro, J. Nebus, J. Teyssier
{"title":"Comparison of Active and Passive Load-Pull Test Benches","authors":"C. Arnaud, J. Carbonéro, J. Nebus, J. Teyssier","doi":"10.1109/ARFTG.2001.327461","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327461","url":null,"abstract":"Some load-pull test benches are developed at present time in different university laboratories. These characterization benches offer high capabilities and are well suited for the research activities. This paper presents the evolutions to apply the load-pull characterization technique issued from the research to the industrial world. This application involves choices to make. These ones are justified and detailed after descriptions of a research and an industrial load-pull characterization bench.","PeriodicalId":248678,"journal":{"name":"57th ARFTG Conference Digest","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125477011","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Separation of the Nonlinear Source Pull from the Nonlinear System Behaviour 非线性源拉与非线性系统行为的分离
57th ARFTG Conference Digest Pub Date : 2001-05-25 DOI: 10.1109/ARFTG.2001.327462
P. Crama, Y. Rolain, W. van Moer, J. Schoukens
{"title":"Separation of the Nonlinear Source Pull from the Nonlinear System Behaviour","authors":"P. Crama, Y. Rolain, W. van Moer, J. Schoukens","doi":"10.1109/ARFTG.2001.327462","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327462","url":null,"abstract":"In this paper we describe a measurement technique to identify a nonlinear system in the presence of nonlinear source pull. Models identified with CW measurement data are not generalisable when nonlinear source pull is present. This is demonstrated on measured data and compared with the performance of the proposed technique. The method is based on two tone signals with very close frequencies that excite the system at the fundamental and harmonic frequencies. By varying the phase relation between the beat components, the system¿s nonlinear behaviour is separated from the nonlinear source pull. Note that such excitations can be generated using commercially available synthesizers with SSB IQ modulation options.","PeriodicalId":248678,"journal":{"name":"57th ARFTG Conference Digest","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114839006","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Large-Signal Time Domain Characterization of Microwave Transistors under RF Pulsed Conditions 射频脉冲条件下微波晶体管的大信号时域特性
57th ARFTG Conference Digest Pub Date : 2001-05-25 DOI: 10.1109/ARFTG.2001.327460
J. Teyssier, S. Augaudy, D. Barataud, J. Nebus, R. Quéré
{"title":"Large-Signal Time Domain Characterization of Microwave Transistors under RF Pulsed Conditions","authors":"J. Teyssier, S. Augaudy, D. Barataud, J. Nebus, R. Quéré","doi":"10.1109/ARFTG.2001.327460","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327460","url":null,"abstract":"This paper describes a time domain measurement technique of large-signal RF pulsed waveforms, based on Agilent Nonlinear Network Measurement System (NNMS). A transistor is biased under pulsed conditions and the RF is applied during bias pulses. The paper shows how the time domain RF measurements are acquired during the pulses. Up to 12 harmonic frequencies are taken into account, in order to provide an accurate time domain voltage and current description at both transistor terminals.","PeriodicalId":248678,"journal":{"name":"57th ARFTG Conference Digest","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122304242","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 21
PAVO: A simple wide band nonlinear component model 一个简单的宽带非线性组件模型
57th ARFTG Conference Digest Pub Date : 2001-05-25 DOI: 10.1109/ARFTG.2001.327470
Y. Rolain, W. van Moer, A. Geens
{"title":"PAVO: A simple wide band nonlinear component model","authors":"Y. Rolain, W. van Moer, A. Geens","doi":"10.1109/ARFTG.2001.327470","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327470","url":null,"abstract":"A measurement based model for a microwave system operating in a power range up to several dB¿s of compression over its full operation frequency band is proposed. The model uses a limited amount of parameters, is easy to implement in an existing simulator, does not require the publishing of internal schematics, and predicts the response of the component over its whole working area. This model is hence a candidate for inclusion in data sheets.","PeriodicalId":248678,"journal":{"name":"57th ARFTG Conference Digest","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129794077","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Non-Linear Behavior Characterization Methods for HFC Networks Return Path Devices and Their Relationship HFC网络回程设备的非线性行为表征方法及其关系
57th ARFTG Conference Digest Pub Date : 2001-05-25 DOI: 10.1109/ARFTG.2001.327466
S. Bette, V. Moeyaert, J. Froidure, M. Blondel
{"title":"Non-Linear Behavior Characterization Methods for HFC Networks Return Path Devices and Their Relationship","authors":"S. Bette, V. Moeyaert, J. Froidure, M. Blondel","doi":"10.1109/ARFTG.2001.327466","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327466","url":null,"abstract":"This paper presents a measurement methodology to characterize the non-linear behavior of HFC (Hybrid Fiber Coax) return path components and sub-systems. The measurement method, based on NPR (Noise Power Ratio), takes into account the spectral and statistical nature of return path signals, those being different from downstream signals. The paper describes a reliable measurement set-up based on a filtered white noise source and a spectrum analyzer. Correction figures to apply to spectrum analyzer measurements, experimental best practices and measurement uncertainty are developed. The automation of the set-up is presented as well as some results concerning an electric return path amplifier and an optical return path system. The temperature behavior of those devices is compared by the way of the NPR. Also, a theoretical analysis of the relationship between tones distortions characterization and the NPR method is established and experimentally demonstrated. Therefrom, an alternative measurement method for return path systems is proposed to the attention of laboratories which do not possess NPR measurement capabilities.","PeriodicalId":248678,"journal":{"name":"57th ARFTG Conference Digest","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128085258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Novel Measurement Standard for Nonlinear In-Band Distortion Characterization 非线性带内失真表征的一种新型测量标准
57th ARFTG Conference Digest Pub Date : 2001-05-25 DOI: 10.1109/ARFTG.2001.327476
N. Carvalho, J. Pedro
{"title":"A Novel Measurement Standard for Nonlinear In-Band Distortion Characterization","authors":"N. Carvalho, J. Pedro","doi":"10.1109/ARFTG.2001.327476","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327476","url":null,"abstract":"This paper proposes a novel measurement standard for nonlinear in-band distortion characterization. Based on a previously established theoretical work, it first identifies the main limitations of noise power ratio figure of merit. Then, an appropriate alternative is proposed, along with its required measurement set-up.","PeriodicalId":248678,"journal":{"name":"57th ARFTG Conference Digest","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121482292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Straightforward De-Embedding Method for Devices Embedded in Test Fixtures 一种直接解除嵌入测试装置的方法
57th ARFTG Conference Digest Pub Date : 2001-05-25 DOI: 10.1109/ARFTG.2001.327471
J. Reynoso‐Hernández, E. Inzunza-González
{"title":"A Straightforward De-Embedding Method for Devices Embedded in Test Fixtures","authors":"J. Reynoso‐Hernández, E. Inzunza-González","doi":"10.1109/ARFTG.2001.327471","DOIUrl":"https://doi.org/10.1109/ARFTG.2001.327471","url":null,"abstract":"This paper deals with the de-embedding problem of devices mounted in test fixtures. An original matrix approach for the de-embedding of the scattering parameters of the device under test (DUT) is presented. The implementation of this new de-embedding method uses a non-reflecting line (L), a reflect (R), and a match (M) as standards. The main feature of the proposed method is that the wave propagation constant is not needed in the de-embedding process. Because no redundancy is involved in the computations, this method is faster than the de-embedding method implemented with LLRM (Line-Line, Reflect, Match) and LRL(m)[2].","PeriodicalId":248678,"journal":{"name":"57th ARFTG Conference Digest","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130148795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
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