A Straightforward De-Embedding Method for Devices Embedded in Test Fixtures

Abstract

This paper deals with the de-embedding problem of devices mounted in test fixtures. An original matrix approach for the de-embedding of the scattering parameters of the device under test (DUT) is presented. The implementation of this new de-embedding method uses a non-reflecting line (L), a reflect (R), and a match (M) as standards. The main feature of the proposed method is that the wave propagation constant is not needed in the de-embedding process. Because no redundancy is involved in the computations, this method is faster than the de-embedding method implemented with LLRM (Line-Line, Reflect, Match) and LRL(m)[2].