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Characterisation and Control of Defects in Semiconductors最新文献

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Characterizing electrically active defects by transient capacitance spectroscopy 瞬态电容光谱法表征电活性缺陷
Characterisation and Control of Defects in Semiconductors Pub Date : 2019-09-30 DOI: 10.1049/pbcs045e_ch1
L. Vines
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引用次数: 0
Vibrational spectroscopy 振动光谱
Characterisation and Control of Defects in Semiconductors Pub Date : 2019-09-30 DOI: 10.1049/pbcs045e_ch3
M. McCluskey
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引用次数: 0
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