ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis最新文献

SRAM Bitcell Defect Identification Methodology Using Electrical Failure Analysis Data 基于电气故障分析数据的SRAM位元缺陷识别方法

ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis Pub Date : 2020-12-01 DOI: 10.31399/ASM.CP.ISTFA2020P0322

Hyungtae Kim, Geonho Kim, Li Yunrong, Ji-hyeok Jeong, Youngdae Kim

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Publication Note 出版报告

ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis Pub Date : 2020-12-01 DOI: 10.31399/asm.cp.istfa2020fm02

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Back Side Illumination Image Sensor Characterization by Backside Circuit Editing 背面照明图像传感器的背面电路编辑特性

ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis Pub Date : 2020-12-01 DOI: 10.31399/ASM.CP.ISTFA2020P0129

Jian Yu, Jin Xu, Niel Sanico

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Failure Case Studies of GaAs-Based Oxide-Confined VCSELs gaas基氧化物约束VCSELs失效案例研究

ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis Pub Date : 2020-12-01 DOI: 10.31399/ASM.CP.ISTFA2020P0317

Kuang-Tse Ho, Ching-Hsiang Chan

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