出版报告

ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis Pub Date : 2020-12-01 DOI:10.31399/asm.cp.istfa2020fm02

{"title":"出版报告","authors":"","doi":"10.31399/asm.cp.istfa2020fm02","DOIUrl":null,"url":null,"abstract":"\n The papers in this volume are based on presentations accepted for the 46th International Symposium for Testing and Failure Analysis, ISTFA 2020, that was scheduled to be held from November 15 to 19, 2020, in Pasadena, California, USA. The conference was cancelled due to the coronavirus (COVID-19) pandemic.","PeriodicalId":238558,"journal":{"name":"ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis","volume":"91 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Publication Note\",\"authors\":\"\",\"doi\":\"10.31399/asm.cp.istfa2020fm02\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n The papers in this volume are based on presentations accepted for the 46th International Symposium for Testing and Failure Analysis, ISTFA 2020, that was scheduled to be held from November 15 to 19, 2020, in Pasadena, California, USA. The conference was cancelled due to the coronavirus (COVID-19) pandemic.\",\"PeriodicalId\":238558,\"journal\":{\"name\":\"ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis\",\"volume\":\"91 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.31399/asm.cp.istfa2020fm02\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.31399/asm.cp.istfa2020fm02","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

本卷中的论文基于计划于2020年11月15日至19日在美国加利福尼亚州帕萨迪纳举行的第46届测试和故障分析国际研讨会(ISTFA 2020)接受的演讲。由于新型冠状病毒(COVID-19)大流行，会议被取消。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Publication Note

The papers in this volume are based on presentations accepted for the 46th International Symposium for Testing and Failure Analysis, ISTFA 2020, that was scheduled to be held from November 15 to 19, 2020, in Pasadena, California, USA. The conference was cancelled due to the coronavirus (COVID-19) pandemic.

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来源期刊

ISTFA 2020: Papers Accepted for the Planned 46th International Symposium for Testing and Failure Analysis

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