2018 IEEE 19th Latin-American Test Symposium (LATS)最新文献

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Validation of a dynamic checkpoint mechanism for Apache Hadoop with failure scenarios 验证Apache Hadoop的动态检查点机制与失败场景
2018 IEEE 19th Latin-American Test Symposium (LATS) Pub Date : 2018-03-01 DOI: 10.1109/LATW.2018.8347240
Paulo Vinicius Cardoso, P. Barcelos
{"title":"Validation of a dynamic checkpoint mechanism for Apache Hadoop with failure scenarios","authors":"Paulo Vinicius Cardoso, P. Barcelos","doi":"10.1109/LATW.2018.8347240","DOIUrl":"https://doi.org/10.1109/LATW.2018.8347240","url":null,"abstract":"New computational paradigms have created data intensive applications which have a demand for efficient and reliable processing platforms. High performance systems, used to answer this demand, have a increasing number of components such as nodes and cores. A multi component system may suffer with reliability and availability issues once the mean time between failures become smaller. Checkpoint and Recovery (CR) is a fault tolerance technique based on backward error recovery that focus on retrieving system safety state from backup saves. This paper shows the Checkpoint and Recovery technique implemented by Apache Hadoop, a framework that allows distributed processing of large datasets across clusters of computers. Hadoop uses the checkpoint technique to provides fault tolerance on Hadoop Distributed File System (HDFS). However, choosing an appropriate checkpoint interval is a major challenge once Hadoop defines the CR attributes statically. Then we propose a dynamic solution for checkpoint attributes configuration on HDFS, whose goal is to make it adaptable to system usage context. We expose a validation of both static and dynamic mechanisms on failure induced scenarios with DataNode crashes in order to determine the overhead of checkpoint and recovery steps.","PeriodicalId":236190,"journal":{"name":"2018 IEEE 19th Latin-American Test Symposium (LATS)","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123486136","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
TDevCGen: A synthesis toolset of HW/SW communication protocol monitors from high-level specifications TDevCGen:来自高级规范的硬件/软件通信协议监视器的综合工具集
2018 IEEE 19th Latin-American Test Symposium (LATS) Pub Date : 2018-03-01 DOI: 10.1109/LATW.2018.8349686
R. Macieira, E. Barros
{"title":"TDevCGen: A synthesis toolset of HW/SW communication protocol monitors from high-level specifications","authors":"R. Macieira, E. Barros","doi":"10.1109/LATW.2018.8349686","DOIUrl":"https://doi.org/10.1109/LATW.2018.8349686","url":null,"abstract":"The use of an electronic embedded system for general or multi-purpose applications has increased substantially and while they require more flexibility for processing different types of applications and communication protocols. The need for this high flexibility also requires the use of general purpose processors as a solution for configuring and controlling a considerable amount of peripherals, what consequently implies in an increasing need for hardware-dependent software (HdS). HdS is a highly critical component and error prone due to the nature of the environment in which it is inserted, and it's hard coding. So it is essential to support the development and runtime phases of HdS by methodologies that are able to capture devices' accesses violations, through the monitoring of the communication protocol specification. So, this paper presents the toolset TDevCGen. This toolset synthesizes properties monitors, for checking hardware/software communication protocol, described through a high-level DSL called TDevC language. Before synthesizing the monitor model (SystemC or SystemVerilog) for runtime validation, the TDevCGen performs a sequence of validation in the specification input, looking for type mismatch, properties inconsistencies and the presence of nondeterministic in the specified protocol. Experiments using a DM9000A Ethernet device and an Altera UART show the efficiency and practicality of proposed approach (TDevCGen). The approach TDevCGen supports the specification of the protocol and communication properties, reducing the time of verification phase significantly, and performs a fast and reliable monitor's synthesis from a high-level specification, eliminating the use of general purpose languages, error-prone coding, and, thus, increasing the reliability of communication checking.","PeriodicalId":236190,"journal":{"name":"2018 IEEE 19th Latin-American Test Symposium (LATS)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130837531","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors 氧化锌纳米颗粒薄膜晶体管的时域电特性
2018 IEEE 19th Latin-American Test Symposium (LATS) Pub Date : 2018-03-01 DOI: 10.1109/LATW.2018.8349695
Thales E. Becker, F. Vidor, G. Wirth, T. Meyers, Julia Reker, U. Hilleringmann
{"title":"Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors","authors":"Thales E. Becker, F. Vidor, G. Wirth, T. Meyers, Julia Reker, U. Hilleringmann","doi":"10.1109/LATW.2018.8349695","DOIUrl":"https://doi.org/10.1109/LATW.2018.8349695","url":null,"abstract":"In this work, the characteristics of thin-film transistors (TFTs) employing nanoparticulated zinc oxide (ZnO) as the active semiconductor channel layer are discussed. The growing interest in this component is associated to the development of low-cost, flexible and transparent electronic devices. The TFTs integrated with ZnO nanoparticles are presented and an extensive time domain electrical characterization campaign was performed on 80 samples of two different integration setups: inverted staggered and inverted coplanar. In the performed tests two main disturbances were identified, which were classified as abrupt and memory effects. From the collected data, hypotheses to explain the observed typical behavior are formulated. Trapping activity, ambient interaction, dielectric dipoles, formed parallel-paths and oxygen vacancies are mechanisms that may be associated to the observed behavior.","PeriodicalId":236190,"journal":{"name":"2018 IEEE 19th Latin-American Test Symposium (LATS)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125828034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A novel method of impact and failure mechanism analysis of RF-based fault injection: A frequency response analyzer, FRA 基于射频的故障注入冲击和失效机理分析新方法:频率响应分析仪,FRA
2018 IEEE 19th Latin-American Test Symposium (LATS) Pub Date : 2018-03-01 DOI: 10.1109/LATW.2018.8349671
L. Kretly, R. Maltione, M. G. Villalva
{"title":"A novel method of impact and failure mechanism analysis of RF-based fault injection: A frequency response analyzer, FRA","authors":"L. Kretly, R. Maltione, M. G. Villalva","doi":"10.1109/LATW.2018.8349671","DOIUrl":"https://doi.org/10.1109/LATW.2018.8349671","url":null,"abstract":"This work presents a novel method to test and verify the impact and failure mechanisms of the RF interference injection on smart power integrated circuits, over of control loop circuits, checking the stability, gain and phase margin changes. The design and test algorithm is developed, as well as is proposed a robust design guide line. Theoretical analysis, simulation and test results from a silicon vehicle blocks implemented in 0.35um and 0.6um CMOS technology are presented and discussed.","PeriodicalId":236190,"journal":{"name":"2018 IEEE 19th Latin-American Test Symposium (LATS)","volume":"196 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115653184","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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