2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)最新文献

筛选
英文 中文
Design and control methodology for fine grain power gating based on energy characterization and code profiling of microprocessors 基于微处理器能量表征和代码分析的细粒度功率门控设计与控制方法
2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2014-03-27 DOI: 10.1109/ASPDAC.2014.6742995
K. Usami, M. Kudo, Kensaku Matsunaga, Tsubasa Kosaka, Yoshihiro Tsurui, Weihan Wang, H. Amano, Hiroaki Kobayashi, Ryuichi Sakamoto, M. Namiki, Masaaki Kondo, Hiroshi Nakamura
{"title":"Design and control methodology for fine grain power gating based on energy characterization and code profiling of microprocessors","authors":"K. Usami, M. Kudo, Kensaku Matsunaga, Tsubasa Kosaka, Yoshihiro Tsurui, Weihan Wang, H. Amano, Hiroaki Kobayashi, Ryuichi Sakamoto, M. Namiki, Masaaki Kondo, Hiroshi Nakamura","doi":"10.1109/ASPDAC.2014.6742995","DOIUrl":"https://doi.org/10.1109/ASPDAC.2014.6742995","url":null,"abstract":"This paper presents a design and control scheme of a microprocessor whose internal function units are power gated at instruction-by-instruction basis. Enabling/disabling the power gating is adaptively controlled under the support of on-chip leakage monitors and the operating system to minimize energy overhead due to sleep-in and wakeup. Measured results of the fabricated chip in the 65nm CMOS technology demonstrated that our approach reduces energy to 21-35% in the range of 25-85°C as compared to the non power-gated case. Energy dissipation was reduced by up to 15% as compared to the conventional fine-grain power gating technique in the same temperature range.","PeriodicalId":234635,"journal":{"name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125626335","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
BOB-router: A new buffering-aware global router with over-the-block routing resources optimization BOB-router:一种新的具有缓冲意识的全局路由器,具有跨块路由资源优化功能
2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2014-03-27 DOI: 10.1109/ASPDAC.2014.6742943
Yilin Zhang, Salim Chowdhury, D. Pan
{"title":"BOB-router: A new buffering-aware global router with over-the-block routing resources optimization","authors":"Yilin Zhang, Salim Chowdhury, D. Pan","doi":"10.1109/ASPDAC.2014.6742943","DOIUrl":"https://doi.org/10.1109/ASPDAC.2014.6742943","url":null,"abstract":"In this paper, we propose a new global router, BOB-Router, endowed with the ability to use over-the-block routing resources to the greatest extent in addition to traditional routing concepts of minimizing wirelength, via count and overflow. In previous global routing formulations, the routing resources over the IP blocks were either dealt as routing blockages leading to a significant waste, or simply treated in the same way as outside-the-block routing resources, which violates the slew constraints and thus fail buffering. Utilizing over-the-block routing resources could dramatically improve the routing solution, yet requires special attention, since the slew, affected by different RC on different metal layers, must be constrained by buffering and is easily violated. Moreover, even all nets are slew-legalized, the routing solution could still suffer from heavy congestion problem. For the first time, BOB-Router tries to solve the over-the-block global routing problem through minimizing overflows, wirelength and via count simultaneously without violating slew constraints. BOB-Router generates a slew-legalized initial solution followed by a Lagrangian-multiplier-based pricing phase and RC-constrained A* search to help explore new buffering-aware topologies on all metal layers. Our experimental results show that BOB-Router completely satisfies the slew constraints and significantly outperforms the obstacle-avoiding global routers in terms of wirelength, via count and overflows.","PeriodicalId":234635,"journal":{"name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116140250","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
7.3 Gb/s universal BCH encoder and decoder for SSD controllers 7.3 Gb/s通用BCH编解码器,用于SSD控制器
2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2014-02-20 DOI: 10.1109/ASPDAC.2014.6742862
Hoyoung Yoo, Youngjoo Lee, I. Park
{"title":"7.3 Gb/s universal BCH encoder and decoder for SSD controllers","authors":"Hoyoung Yoo, Youngjoo Lee, I. Park","doi":"10.1109/ASPDAC.2014.6742862","DOIUrl":"https://doi.org/10.1109/ASPDAC.2014.6742862","url":null,"abstract":"This paper presents a universal BCH encoder and decoder that can support multiple error-correction capabilities. A novel encoding architecture and on-demand syndrome calculation technique is proposed to reduce both hardware complexity and power consumption. Based on the proposed methods, 32-parallel universal encoder and decoder are designed for BCH (8192+14t, 8192, t) codes, where the error-correction capability t is configurable to 8, 11, 16, 24, 32, and 64. The prototype chip achieves a throughput of 7.3 Gb/s and occupies 2.24 mm2 in 0.13μm CMOS technology.","PeriodicalId":234635,"journal":{"name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"93 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116911699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Variation-aware voltage island formation for power efficient near-threshold manycore architectures 功率效率近阈值多核架构的变化感知电压岛形成
2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2014-02-20 DOI: 10.1109/ASPDAC.2014.6742907
Ioannis S. Stamelakos, S. Xydis, G. Palermo, C. Silvano
{"title":"Variation-aware voltage island formation for power efficient near-threshold manycore architectures","authors":"Ioannis S. Stamelakos, S. Xydis, G. Palermo, C. Silvano","doi":"10.1109/ASPDAC.2014.6742907","DOIUrl":"https://doi.org/10.1109/ASPDAC.2014.6742907","url":null,"abstract":"The power-wall problem and its dual utilization-wall problem are considered among the main barriers to feasible/efficient scaling in the manycore era. Several researchers have proposed the usage of aggressive voltage scaling techniques at the near-threshold voltage region, promising significant improvements in power efficiency at the expense of reduced performance values and higher sensitivity to process parametric variations. In this paper, we introduce a variability-aware framework for exploring the potential power-efficiency of the Near Threshold Computing (NTC) under performance constraints. We propose and analyze the usage of fine-grained voltage islands to cope with the increased effect of variability problem in the NTC region. For the considered workloads, we found that the power impact of fine-grained voltage islands formation can be up to 35% for a 128-core chip operating at NTC region, while the adoption of a variability aware technique can bring to a power reduction of up to 43% with respect to a variability unaware technique. Finally, we show that voltage regulator's complexity, in terms of voltage quantization levels, has a very low effect on the power efficiency at NTC, making in that way the usage of voltage islands a feasible solution for copying with variability1.","PeriodicalId":234635,"journal":{"name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121378727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Efficient parallel GPU algorithms for BDD manipulation BDD操作的高效并行GPU算法
2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2014-02-20 DOI: 10.1109/ASPDAC.2014.6742980
M. Velev, Ping Gao
{"title":"Efficient parallel GPU algorithms for BDD manipulation","authors":"M. Velev, Ping Gao","doi":"10.1109/ASPDAC.2014.6742980","DOIUrl":"https://doi.org/10.1109/ASPDAC.2014.6742980","url":null,"abstract":"We present parallel algorithms for Binary Decision Diagram (BDD) manipulation optimized for efficient execution on Graphics Processing Units (GPUs). Compared to a sequential CPU-based BDD package with the same capabilities, our GPU implementation achieves at least 5 orders of magnitude speedup. To the best of our knowledge, this is the first work on using GPUs to accelerate a BDD package.","PeriodicalId":234635,"journal":{"name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125853879","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
A fast and provably bounded failure analysis of memory circuits in high dimensions 高维存储电路的快速、可证明的有界失效分析
2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2014-02-20 DOI: 10.1109/ASPDAC.2014.6742928
Wei Wu, Fang Gong, Gengsheng Chen, Lei He
{"title":"A fast and provably bounded failure analysis of memory circuits in high dimensions","authors":"Wei Wu, Fang Gong, Gengsheng Chen, Lei He","doi":"10.1109/ASPDAC.2014.6742928","DOIUrl":"https://doi.org/10.1109/ASPDAC.2014.6742928","url":null,"abstract":"Memory circuits have become important components in today's IC designs which demands extremely high integration density and reliability under process variations. The most challenging task is how to accurately estimate the extremely small failure probability of memory circuits where the circuit failure is a “rare event”. Classic importance sampling has been widely recognized to be inaccurate and unreliable in high dimensions. To address this issue, we propose a fast statistical analysis to estimate the probability of rare events in high dimensions and prove that the estimation is always bounded. This methodology has been successfully applied to the failure analysis of memory circuits with hundreds of variables, which was considered to be very intractable before. To the best of our knowledge, this is the first work that successfully solves high dimensional “rare event” problems without using expensive Monte Carlo and classic importance sampling methods. Experiments on a 54-dimensional SRAM cell circuit show that the proposed approach achieves 1150x speedup over Monte Carlo without compromising any accuracy. It also outperforms the classification based method (e.g., Statistical Blockade) by 204x and existing importance sampling method (e.g., Spherical Sampling) by 5x. On another 117-dimension circuit, the proposed approach yields 364x speedup over Monte Carlo while existing importance sampling methods completely fail to provide reasonable accuracy.","PeriodicalId":234635,"journal":{"name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125522101","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 24
Energy efficient in-memory machine learning for data intensive image-processing by non-volatile domain-wall memory 通过非易失性域壁存储器实现数据密集型图像处理的高能效内存机器学习
2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2014-02-20 DOI: 10.1109/ASPDAC.2014.6742888
Hao Yu, Yuhao Wang, Shuai Chen, Wei Fei, Chuliang Weng, Junfeng Zhao, Z. Wei
{"title":"Energy efficient in-memory machine learning for data intensive image-processing by non-volatile domain-wall memory","authors":"Hao Yu, Yuhao Wang, Shuai Chen, Wei Fei, Chuliang Weng, Junfeng Zhao, Z. Wei","doi":"10.1109/ASPDAC.2014.6742888","DOIUrl":"https://doi.org/10.1109/ASPDAC.2014.6742888","url":null,"abstract":"Image processing in conventional logic-memory I/O-integrated systems will incur significant communication congestion at memory I/Os for excessive big image data at exa-scale. This paper explores an in-memory machine learning on neural network architecture by utilizing the newly introduced domain-wall nanowire, called DW-NN. We show that all operations involved in machine learning on neural network can be mapped to a logic-in-memory architecture by non-volatile domain-wall nanowire. Domain-wall nanowire based logic is customized for in machine learning within image data storage. As such, both neural network training and processing can be performed locally within the memory. The experimental results show that system throughput in DW-NN is improved by 11.6x and the energy efficiency is improved by 92x when compared to conventional image processing system.","PeriodicalId":234635,"journal":{"name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122487713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
A transaction-oriented UVM-based library for verification of analog behavior 一个面向事务的基于uvm的库,用于验证模拟行为
2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2014-02-20 DOI: 10.1109/ASPDAC.2014.6742989
Alexander W. Rath, Volkan Esen, W. Ecker
{"title":"A transaction-oriented UVM-based library for verification of analog behavior","authors":"Alexander W. Rath, Volkan Esen, W. Ecker","doi":"10.1109/ASPDAC.2014.6742989","DOIUrl":"https://doi.org/10.1109/ASPDAC.2014.6742989","url":null,"abstract":"The Universal Verification Methodology (UVM) has become a de facto standard in today's functional verification of digital designs. However, it is rarely used for the verification of Designs Under Test containing Real Number Models. This paper presents a new technique using UVM that can be used in order to compare models of analog circuitry on different levels of abstraction. It makes use of statistic metrics. The presented technique enables us to ensure that Real Number Models used in chip projects match the transistor level circuitry during the whole life cycle of the project.","PeriodicalId":234635,"journal":{"name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127735402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
SDG2KPN: System Dependency Graph to function-level KPN generation of legacy code for MPSoCs SDG2KPN: mpsoc遗留代码的功能级KPN生成的系统依赖图
2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2014-02-20 DOI: 10.1109/ASPDAC.2014.6742901
Jude Angelo Ambrose, Jorgen Peddersen, S. Parameswaran, Alvin Labios, Yusuke Yachide
{"title":"SDG2KPN: System Dependency Graph to function-level KPN generation of legacy code for MPSoCs","authors":"Jude Angelo Ambrose, Jorgen Peddersen, S. Parameswaran, Alvin Labios, Yusuke Yachide","doi":"10.1109/ASPDAC.2014.6742901","DOIUrl":"https://doi.org/10.1109/ASPDAC.2014.6742901","url":null,"abstract":"The Multiprocessor System-on-Chip (MPSoC) paradigm as a viable implementation platform for parallel processing has expanded to encompass embedded devices. The ability to execute code in parallel gives MPSoCs the potential to achieve high performance with low power consumption. In order for sequential legacy code to take advantage of the MPSoC design paradigm, it must first be partitioned into data flow graphs (such as Kahn Process Networks - KPNs) to ensure the data elements can be correctly passed between the separate processing elements that operate on them. Existing techniques are inadequate for use in complex legacy code. This paper proposes SDG2KPN, a System Dependency Graph to KPN conversion methodology targeting the conversion of legacy code. By creating KPNs at the granularity of the function-/procedure-level, SDG2KPN is the first of its kind to support shared and global variables as well as many more program patterns/application types. We also provide a design flow which allows the creation of MPSoC systems utilizing the produced KPNs. We demonstrate the applicability of our approach by retargeting several sequential applications to the Tensilica MPSoC framework. Our system parallelized AES, an application of 950 lines, in 4.8 seconds, while H.264, of 57896 lines, took 164.9 seconds to parallelize.","PeriodicalId":234635,"journal":{"name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121620207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An overview of spin-based integrated circuits 基于自旋的集成电路概述
2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2014-02-20 DOI: 10.1109/ASPDAC.2014.6742969
Wang-Cheng Kang, Weisheng Zhao, Zhaohao Wang, Jacques-Olivier Klein, Yue Zhang, Djaafar Chabi, Youguang Zhang, D. Ravelosona, C. Chappert
{"title":"An overview of spin-based integrated circuits","authors":"Wang-Cheng Kang, Weisheng Zhao, Zhaohao Wang, Jacques-Olivier Klein, Yue Zhang, Djaafar Chabi, Youguang Zhang, D. Ravelosona, C. Chappert","doi":"10.1109/ASPDAC.2014.6742969","DOIUrl":"https://doi.org/10.1109/ASPDAC.2014.6742969","url":null,"abstract":"Conventional CMOS integrated circuits suffer from serve power and scalability challenges as technology node scales into ultra-deep-micron technology nodes. Alternative approaches beyond charge-only based circuits. In particular, spin-based devices or integrated circuits show promising merits to overcome these issues by adding the spin freedom of electrons to the electronic circuits. Spintronics has now become a hot topic in both academics and industrials. This paper overviews the status and prospects of spin-based integrated circuits under intense investigation and address particularly their merits and challenges for practical applications.","PeriodicalId":234635,"journal":{"name":"2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131826187","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 28
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信