{"title":"Simulation and implementation of an 8-bit carry look-ahead adder using adiabatic quantum-flux-parametron","authors":"K. Inoue, N. Takeuchi, Y. Yamanashi, N. Yoshikawa","doi":"10.1109/ISEC.2013.6604271","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604271","url":null,"abstract":"We have been studying ultra-low-power logic circuits using adiabatic quantum-flux-parametron (AQFP) logic, whose power consumption can be decreased significantly by changing their potential energies adiabatically using AC exciting currents. In this study, we designed an 8-bit carry look-ahead adder (CLA) using an AQFP cell library based on the AIST Nb 2.5 kA/cm2 standard process (STP2) and evaluated its circuit properties. The CLA is composed of 1224 critically-dumped 50-μA Josephson junctions, which occupy the area of 1.74 × 0.99 mm2. Simulation results show that the CLA has a wide bias margin of ±29.5%, and the energy dissipation is 16.4 aJ per clock cycle at 5-GHz operation.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128456251","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. E. Lehmann, D. Kirichenko, A. Kirichenko, S. Sarwana, D. Gupta
{"title":"Superconducting digital-RF receiver with high-speed data recording capability","authors":"A. E. Lehmann, D. Kirichenko, A. Kirichenko, S. Sarwana, D. Gupta","doi":"10.1109/ISEC.2013.6604274","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604274","url":null,"abstract":"A superconducting digital-RF receiver with high ingest-rate data recording capability has been developed. The data recorder unit uses standard PC components with state-of-the-art solid-state drives and interfaces with the superconductor analog-to-digital converter (ADC) through a commercial FPGA board. High-speed data ingest rates exceeding 3.2 GBps have been demonstrated successfully with single-bit ADCs clocked up to 27.52 GHz. Long data acquisitions are useful for analyzing ADC performance in terms of stability and linearity. A data analysis program has also been developed to extract performance parameters and visualize digitized signals in frequency and time domains.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127013819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Berggren, P. Longhini, A. D. de Escobar, A. Palacios, O. Mukhanov, G. Prokopenko
{"title":"Modeling the effects of fabrication spreads and noise on series coupled arrays of bi-SQUIDs","authors":"S. Berggren, P. Longhini, A. D. de Escobar, A. Palacios, O. Mukhanov, G. Prokopenko","doi":"10.1109/ISEC.2013.6604303","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604303","url":null,"abstract":"We explore the effects of fabrication spreads and noise in a series array of DC bi-SQUIDs. The investigation is performed through numerical simulations of phase equations derived from circuit diagrams. It has been previously determined that the series coupled bi-SQUID arrays dynamic range increases with the number of bi-SQUIDs in the array and that non-uniform bi-SQUID loops sizes produces a zero-field single anti-peak in the voltage response. Results show the effects of industry standard fabrication spreads to the anti-peak feature are minimal, while the effects to the voltage response of arrays of identical bi-SQUIDs can be drastic. The findings presented here will be used to support the design of an electrically small magnetic field antenna and low-noise amplifier with high bandwidth.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"262 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133241145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Operation of single-flux-quantum logic cells based on all-NbN integrated circuit technology","authors":"H. Terai, K. Makise, Zhen Wang","doi":"10.1109/ISEC.2013.6604278","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604278","url":null,"abstract":"We developed NbN-based SFQ circuits consisting of high-quality epitaxial NbN/AlN/NbN trilayer grown on MgO (100) substrate. The SFQ logic cells such as JTL, DC/SFQ converter, voltage driver, pulse splitter, TFF, and CB were designed by setting the critical current density JC at 2.5 kA/cm2. We succeeded in demonstrating correct operations of all the designed SFQ cells, but the JC range allowing the operation was quite narrow as around 70% for the designed value. The circuit simulation revealed that the TFF cell requires the JC range from 65% to 115% for the correct operation, while the DC/SFQ converter was not operational for the JC of more than 70%.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131216990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Kato, Y. Yamanashi, N. Yoshikawa, A. Fujimaki, N. Takagi, K. Takagi, S. Nagasawa
{"title":"60-GHz demonstration of an SFQ half-precision bit-serial floating-point adder using 10 kA/cm2 Nb process","authors":"T. Kato, Y. Yamanashi, N. Yoshikawa, A. Fujimaki, N. Takagi, K. Takagi, S. Nagasawa","doi":"10.1109/ISEC.2013.6604272","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604272","url":null,"abstract":"We are developing a large-scale reconfigurable data-path (LSRDP) based on single-flux-quantum (SFQ) circuits to establish a fundamental technology for future high-performance computing systems. In the LSRDP, an SFQ floating-point adder (FPA) is one of the main and most complicated circuit blocks. In our previous study, we implemented an SFQ half-precision (16-bit) bit-serial FPA using the ISTEC 2.5 kA/cm2 standard process, and demonstrated the correct operations at 24 GHz by on-chip high-speed tests. In this study, we designed and implemented an SFQ half-precision bit-serial FPA using a cell library for the AIST 10 kA/cm2 Nb nine-metal-layer process (ADP2), and carried out on-chip high speed tests. The designed FPA contains 9661 Josephson junctions and occupies a circuit area of 12.95 mm2. Its target operation frequency is 50 GHz. We have demonstrated the correct operation of the FPA at the maximum frequency of 62 GHz although there is a functional error in the design. The measured DC bias margin ranges from 102% to 108% at 50 GHz operation. The total power consumption is measured to be 2.9 mW.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130992761","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Superconducting tunnel junction (STJ) detectors for ion-charge-number sensitive mass spectrometry","authors":"M. Ohkubo, N. Zen, M. Ukibe, S. Shiki, K. Koike","doi":"10.1109/ISEC.2013.6604258","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604258","url":null,"abstract":"Mass spectrometry (MS) is one of the indispensable methods in analytical chemistry. Conventional ion detectors installed in MS instruments solely count individual keV ions or measure ion flux, which leads to no information on the charge states of the individual ions. Superconducting tunnel junction (STJ) detectors, on the other hand, have sensitivity to the ion-charge-number through kinetic energy measurement of keV ions. The STJ detectors overcome such limits in conventional MS instruments as mass/charge-number (m/z) overlap that occurs between, for example, 14N+ and 14N22+ (m/z 14), and neutral loss that means that neutral fragments produced from a precursor ion cannot be analyzed directly in tandem mass spectrometry.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"142 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115089560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. D. de Andrade, S. Berggren, B. Taylor, A. D. de Escobar
{"title":"Flux flushing in superconducting niobium films","authors":"M. D. de Andrade, S. Berggren, B. Taylor, A. D. de Escobar","doi":"10.1109/ISEC.2013.6604314","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604314","url":null,"abstract":"Flux trapping in superconducting devices has shown to be detrimental to the consistent operation of superconducting electronics (SCE). Approaches to improve reliability of SCE components have focused on introduction of flux trap regions and highly elaborate degaussing procedures. Nevertheless, a controlled and reproducible method to assure the elimination of trapped flux on SCE devices remains elusive. A substantial body of work on artificial defects utilizing the so called ratchet effect has demonstrate limited control of the magnetic vortices in niobium films. These early attempts to control the spurious vortices distribution have been limited to small geometrical regions having no practical effect on improving SCE devices operational parameters. In this paper, we report simulations and propose an improved method utilizing the ratchet effect that can be extended to physical sizes compatible to existing fabrication techniques of SCE devices.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123408058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"YBCO current leads for adiabatic demagnetization refrigeration of X-ray detectors in space","authors":"R. Webber, J. Delmas, D. Yohannes, J. Vivalda","doi":"10.1109/ISEC.2013.6604293","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604293","url":null,"abstract":"Future satellite missions carrying X-ray spectrometers will be cooled to milliKelvin temperatures by multistage Adiabatic Demagnetization Refrigerators (ADR), which, in turn will be precooled by closed-cycle cryocoolers. Each stage of the ADR will use a low temperature superconducting magnet, which will periodically be energized via high temperature superconducting (HTS) leads. The heat-leak and required refrigeration for these leads has historically been a relatively large burden on the mission energy budget; hence the motivation for a lower heat leak. Our suggested approach is to fabricate inherently tough and flexible leads in the 2A to 10A range from commercially available YBa2Cu3O7-X (YBCO) tape. The substrates of such tapes are tough, strong, low thermal conductivity metals which can be cut longitudinally into thin strips approximately 500 micrometers in width using a precision dicing saw. In the region of the thermal gradient, the protective silver coating is removed and replaced by a non-conducting encapsulant; the as-manufactured silver coating is left at the ends to make electrical joints. This is a process which should lend itself well to small-scale manufacture. We have demonstrated the feasibility of several key facets of the design and expect that the overall result of this project will be to reduce significantly the size, weight and power requirement of the satellite-borne cryosystem and at the same time produce a lighter more robust lead structure.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116807760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Grib, M. Mans, M. Buenfeld, J. Scherbel, F. Schmidl, P. Seidel, H. Schneidewind
{"title":"Coherent radiation in serial arrays of Josephson junctions","authors":"A. Grib, M. Mans, M. Buenfeld, J. Scherbel, F. Schmidl, P. Seidel, H. Schneidewind","doi":"10.1109/ISEC.2013.6604302","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604302","url":null,"abstract":"We measured IV-characteristics of a planar array of about 362 shunted intrinsic Josephson junctions in microbridges made from the Tl2Ba2CaCu2O8 layers which were grown epitaxially on 20° misaligned LaAlO3 substrates. The IV-characteristics contained resonant particularities (jumps of voltages) with a main period of 17 mV. We showed that the origin of particularities was the interaction of Josephson generation with the internal resonant mode of the system. We modeled this interaction considering the radiation of junctions into the transmission line and found that strong synchronization of junctions appeared in the vicinity of the first particularity. The estimate of the ac power emitted into free space was 0.05-0.1 microwatt, whereas the power of 0.3-0.5 mW was emitted inside the resonant system.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"269 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114329876","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Bogorin, M. Ware, Douglas McClure, S. Sorokanich, B. Plourde
{"title":"Reducing surface loss in 3D microwave copper cavities for superconducting transmon qubits","authors":"D. Bogorin, M. Ware, Douglas McClure, S. Sorokanich, B. Plourde","doi":"10.1109/ISEC.2013.6604283","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604283","url":null,"abstract":"The recent implementation of three-dimensional microwave cavities coupled to superconducting transmon qubits has led to dramatic improvements in qubit coherence times [1]. Besides the superconducting aluminum cavities that have been used in many such measurements, other recent experiments have utilized copper cavities [2] with coherence times now approaching 0.1 ms. We are investigating the effects on the quality factor for three-dimensional copper cavities that have the cavity-wall surfaces electropolished and coated with a superconducting tin layer. The copper base provides a good path for thermalizing the cavity walls and qubit chip, while the surface treatment reduces the microwave loss. We have measured a superconducting transmon qubit in such a cavity and we report our low-temperature coherence results on the same qubit and cavity measured in two different labs.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124661965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}