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Development of Energy-efficient Cryogenic Optical (ECO) data link 节能低温光学(ECO)数据链的发展
2013 IEEE 14th International Superconductive Electronics Conference (ISEC) Pub Date : 2013-07-07 DOI: 10.1109/ISEC.2013.6604276
O. Mukhanov, Igor V. Vernik, A. Kirichenko, A. Kadin, K. Choquette, M. Tan, T. Fryslie
{"title":"Development of Energy-efficient Cryogenic Optical (ECO) data link","authors":"O. Mukhanov, Igor V. Vernik, A. Kirichenko, A. Kadin, K. Choquette, M. Tan, T. Fryslie","doi":"10.1109/ISEC.2013.6604276","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604276","url":null,"abstract":"We develop an energy efficient digital data link connecting cryogenic superconducting single flux quantum (SFQ) circuits to room-temperature electronics. The design is based on low-temperature (4 K) superconductor ERSFQ SFQ/dc drivers, high-temperature superconductor data cables spanning 4 K to 70 K temperature stages, mid-temperature (70 K) polarization modulation vertical cavity surface emitting lasers (PM VCSELs), and fiber optic links to room temperature electronics. The Energy-efficient Cryogenic Optical (ECO) data link design is based on balancing power dissipation and signal gain at each temperature stage to maximize overall energy efficiency following the recently introduced Thermo-Gain Rule. To achieve VCSEL light emission with two switchable distinct polarization modes, a cruciform-shaped anisotropic optical cavity is formed by fabrication of a photonic crystal with etched periodic air holes surrounding the unetched cruciform region. In this report, we present the results of design, fabrication, and preliminary testing of the ECO data link components.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121018237","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Josephson junction binary oscillator computing 约瑟夫森结二进制振荡器计算
2013 IEEE 14th International Superconductive Electronics Conference (ISEC) Pub Date : 2013-07-07 DOI: 10.1109/ISEC.2013.6604275
S. Lynch, J. Borresen, Kit Latham
{"title":"Josephson junction binary oscillator computing","authors":"S. Lynch, J. Borresen, Kit Latham","doi":"10.1109/ISEC.2013.6604275","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604275","url":null,"abstract":"The first modern computers were built at Manchester University in the late 1940s and amongst the principal components used were vacuum tube oscillators. Following the development of the transistor, such oscillator-based computers quickly became obsolete. Here, a novel application of superconducting Josephson Junction (JJ) technology based on neural dynamics is proposed. Neuron-type oscillators can be constructed from JJs and they can be connected together to form computer circuits in a manner entirely consistent with modern architectures. SIMetrix models of both computation and memory are presented and metrics are discussed. It has been estimated that JJs switch 100 times faster than their transistor counterparts and use 300 times less power (including the super-cooling). Utilizing the circuits described in this paper, it is also estimated that computers could be constructed using at least 10 times fewer components. Thus, theoretically these JJ-based computers could be up to 300,000 times more efficient than their CMOS counterparts.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127263687","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
STM-SQUID microscopy using a fine probe STM-SQUID显微镜使用精细探针
2013 IEEE 14th International Superconductive Electronics Conference (ISEC) Pub Date : 2013-07-07 DOI: 10.1109/ISEC.2013.6604311
N. Watanabe, Y. Miyato, H. Itozaki
{"title":"STM-SQUID microscopy using a fine probe","authors":"N. Watanabe, Y. Miyato, H. Itozaki","doi":"10.1109/ISEC.2013.6604311","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604311","url":null,"abstract":"We developed an STM-SQUID microscope by combining a scanning tunneling microscope (STM) and a superconducting quantum interference device (SQUID) in order to observe the local magnetic structure of magnetic materials. The STM-SQUID microscope features a high permeability permalloy probe placed between the SQUID and the sample to serve as a flux guide. The magnetic field of the sample surface was effectively transmitted to the SQUID using this method, so it substantially improved the spatial resolution. However, simulation experiments showed that the shape of probe tip greatly influenced the spatial resolution of the magnetic field images, so we investigated this phenomenon further. The signal-noise ratio in magnetic images obtained with the STM-SQUID microscope is improved by using a permalloy probe for which the radius and cone angle of the probe tip are small.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122468360","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Bit error rate in low-voltage RSFQ circuits with small critical currents/lowered bias voltages 小临界电流/低偏置电压下低压RSFQ电路的误码率
2013 IEEE 14th International Superconductive Electronics Conference (ISEC) Pub Date : 2013-07-07 DOI: 10.1109/ISEC.2013.6604277
Masamitsu Tanaka, A. Kitayama, T. Takinami, Yuto Komura, A. Fujimaki
{"title":"Bit error rate in low-voltage RSFQ circuits with small critical currents/lowered bias voltages","authors":"Masamitsu Tanaka, A. Kitayama, T. Takinami, Yuto Komura, A. Fujimaki","doi":"10.1109/ISEC.2013.6604277","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604277","url":null,"abstract":"We report experimental results of bit-error-rate (BER) measurements in small-critical-current or lowered-biasvoltage rapid single-flux-quantum (RSFQ) circuits for power reduction. In such reduced-power RSFQ circuits, the BERs can be increased because of the reduced signal-to-noise ratio. We fabricated 2-bit shift registers using a 2.5-kA/cm2 niobium process, and measured BERs by low-frequency tests at 4.2 K. We obtained sufficiently wide bias margins when we reduced the critical currents in a range of 1/2 to 1/4 of the conventional design, while it narrowed as the critical currents reduced to 1/8. For low-voltage shift registers, the bias margins linearly decreased in width as bias voltages were lowered. We found that 0.25 mV, 1/10 of the conventional design, was a good bias voltage to balance competing power reduction and bias margin.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124674874","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Statistical timing analysis tool for SFQ cells (STATS) SFQ细胞统计时序分析工具(STATS)
2013 IEEE 14th International Superconductive Electronics Conference (ISEC) Pub Date : 2013-07-07 DOI: 10.1109/ISEC.2013.6604281
M. E. Çelik, A. Bozbey
{"title":"Statistical timing analysis tool for SFQ cells (STATS)","authors":"M. E. Çelik, A. Bozbey","doi":"10.1109/ISEC.2013.6604281","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604281","url":null,"abstract":"Todays superconductor integrated circuits are increasingly taking part in various fields, such as processors, detector read-out systems and communication systems. As the circuit complexities increase, importance of robust and practical simulation software increases. However, at the moment, the tools used for circuit design are mostly made up by modifying the software used in the semiconductor technology. These tools generally doesn't consider the effects that may cause timing variances such as fabrication spread over design values and the thermal noise. Earlier studies show that timing variances become comparable with cell timings due to accumulation of timing jitter over long data transmission paths. It is possible to estimate these effects with analog simulators such as Jsim. However, due the number of simulations and simulation durations, it is not practical to use them for large circuits. At the moment, such large circuits are simulated with Verilog or similar simulators and each gate is modelled with only deterministic delay and interval values. Hence, these simulators only give an idea of the circuit operation with the assumption that all the timings are at the design value. In this work, we are developing a digital simulation tool for that can be used for large SFQ circuits with the assumption that the constituting gates have probabilistic, mainly Gaussian, output distributions. Our simulator also gives the output probabilities for the circuits and individual gates.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"119 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120956428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Operation of practical eSFQ circuits 实用eSFQ电路的操作
2013 IEEE 14th International Superconductive Electronics Conference (ISEC) Pub Date : 2013-07-07 DOI: 10.1109/ISEC.2013.6604279
M. Volkmann, A. Sahu, Andriy V. Dotsenko, O. Mukhanov
{"title":"Operation of practical eSFQ circuits","authors":"M. Volkmann, A. Sahu, Andriy V. Dotsenko, O. Mukhanov","doi":"10.1109/ISEC.2013.6604279","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604279","url":null,"abstract":"We have designed and tested energy-efficient single flux quantum (eSFQ) circuits for use in practical circuits. The first circuit is a 184-bit shift register for acquisition memory to store short transient events. The second circuit is a 16-bit deserializer integrated with an analog-to-digital converter modulator. The deserializer converts a high speed oversampling delta modulator 1-bit data stream into 16 parallel digital outputs at 1/16 of input data rate. In this work, we report preliminary functional and high-speed operation of some of these eSFQ circuits including their margins of operation at different clock speeds, maximum operation frequencies, and power dissipation.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"605 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116318993","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
PC2: Identifying noise processes in superconducting resonators PC2:识别超导谐振器中的噪声过程
2013 IEEE 14th International Superconductive Electronics Conference (ISEC) Pub Date : 2013-07-07 DOI: 10.1109/ISEC.2013.6604284
Jonathan Burnett, T. Lindström, I. Wisby, S. D. Graaf, A. Adamyan, A. Danilov, S. Kubatkin, P. Meeson, A. Tzalenchuk
{"title":"PC2: Identifying noise processes in superconducting resonators","authors":"Jonathan Burnett, T. Lindström, I. Wisby, S. D. Graaf, A. Adamyan, A. Danilov, S. Kubatkin, P. Meeson, A. Tzalenchuk","doi":"10.1109/ISEC.2013.6604284","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604284","url":null,"abstract":"Extensive studies of dielectric loss due to two level fluctuators (TLFs) in superconducting resonators have provided routes for low loss resonators. The research is motivated not only by the use of resonators as detectors and in quantum information processing, but more generally due to TLFs being a source of noise and decoherence in all quantum devices. In this work a frequency locked loop was used to measure frequency fluctuations at timescales in excess of 104 seconds, thereby accurately probing the TLF induced low- frequency noise of the resonator. Our measurement method lead to very high statistical confidence even for very long timescales, and here we can therefore present results explicitly identifying power dependent flicker frequency noise (S = 1/fa where a=1) persisting down to the mHz level.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"73 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113961122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Bi-SQUID noise simulation Bi-SQUID噪声模拟
2013 IEEE 14th International Superconductive Electronics Conference (ISEC) Pub Date : 2013-07-07 DOI: 10.1109/ISEC.2013.6604308
A. Sharafiev, V. Kornev, I. Soloviev, O. Mukhanov
{"title":"Bi-SQUID noise simulation","authors":"A. Sharafiev, V. Kornev, I. Soloviev, O. Mukhanov","doi":"10.1109/ISEC.2013.6604308","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604308","url":null,"abstract":"We present an analysis of noise characteristics of bi-SQUID through its voltage response and compare to characteristics of dc SQUID in the open loop configuration. The additional Josephson junction in bi-SQUID gives an additional source of fluctuations, changes transfer function, nonlinear dynamics and nonlinear noise spectrum transformation. These result in different input noise level versus applied magnetic flux.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130447801","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Effect of barrier geometry for HTS ion damage Josephson junctions 势垒几何对高温超导离子损伤Josephson结的影响
2013 IEEE 14th International Superconductive Electronics Conference (ISEC) Pub Date : 2013-07-07 DOI: 10.1109/ISEC.2013.6604297
S. Ouanani, D. Crété, J. Kermorvant, Y. Lemaître, B. Marcilhac, J. Mage, J. Lesueur, N. Bergeal, C. Feuillet-Palma, C. Ulysse, D. Mailly
{"title":"Effect of barrier geometry for HTS ion damage Josephson junctions","authors":"S. Ouanani, D. Crété, J. Kermorvant, Y. Lemaître, B. Marcilhac, J. Mage, J. Lesueur, N. Bergeal, C. Feuillet-Palma, C. Ulysse, D. Mailly","doi":"10.1109/ISEC.2013.6604297","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604297","url":null,"abstract":"The large area (2D) technology for high temperature superconducting (HTS) Josephson junctions and circuits we are developing is based on the ion damage process established at LPEM [1, 2]. The aim of this work was to do a statistical analysis of the effect of geometrical parameters on Josephson junctions properties. Only junction length and barrier thickness are varied; film thickness is kept constant at a nominal 150nm. Statistical analysis of characteristic parameters (Ic, Rn, temperature range of operation...) is presented.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131142065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Liquid-phase detection of biological targets with magnetic markers and high Tc SQUID 磁性标记物和高Tc SQUID液相检测生物靶标
2013 IEEE 14th International Superconductive Electronics Conference (ISEC) Pub Date : 2013-07-07 DOI: 10.1109/ISEC.2013.6604304
S. Uchida, Y. Higuchi, Y. Ueoka, T. Yoshida, K. Enpuku, S. Adachi, K. Tanabe, A. Tsukamoto
{"title":"Liquid-phase detection of biological targets with magnetic markers and high Tc SQUID","authors":"S. Uchida, Y. Higuchi, Y. Ueoka, T. Yoshida, K. Enpuku, S. Adachi, K. Tanabe, A. Tsukamoto","doi":"10.1109/ISEC.2013.6604304","DOIUrl":"https://doi.org/10.1109/ISEC.2013.6604304","url":null,"abstract":"We developed a highly sensitive HTS SQUID system for liquid-phase detection of biological targets using Brownian relaxation of magnetic markers. The SQUID was made of a ramp-edge Josephson junction using RE123-based multilayer process, and it showed a flux noise of 7.5 micro flux-quantam/Hz1/2 in the white noise region. The 1/f noise was 14 micro flux-quantam/Hz1/2 at f = 1 Hz when the SQUID was operated with AC bias mode. Using the SQUID system, we detected a biological target called biotin. In the experiment, biotins were fixed to a large polymer bead with a diameter of 3.3 micron meter. Streptavidin-coated magnetic markers were used for the detection. The bound and unbound (free) markers were magnetically distinguished using the difference in their Brownian relaxation time, i.e., without using the washing process to separate them. The minimum detectable number of biotins was as low as 104, corresponding to a sensitivity of 4.8×10-19 mol/ml. This result indicates a high sensitivity of the developed method.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132871014","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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