2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)最新文献_第8页

Delay Insensitive logic with increased fault tolerance and optimized for subthreshold operation 延迟不敏感逻辑，增加容错性，优化亚阈值操作

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) Pub Date : 1900-01-01 DOI: 10.1109/S3S.2013.6716554

I. Santos, E. MacDonald

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引用次数: 0

The activation energy dependence on the electric field in UTBOX SOI FBRAM devices utboxsoi FBRAM器件中活化能对电场的依赖性

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) Pub Date : 1900-01-01 DOI: 10.1109/S3S.2013.6716570

T. Nicoletti, S. Santos, K. Sasaki, J. Martino, M. Aoulaiche, E. Simoen, C. Claeys

引用次数: 2

NW-TFET analog performance for different Ge source compositions 不同锗源组成下的NW-TFET模拟性能

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) Pub Date : 1900-01-01 DOI: 10.1109/S3S.2013.6716561

P. Agopian, S. D. Dos Santos, F. Neves, J. Martino, A. Vandooren, R. Rooyackers, E. Simoen, C. Claeys

引用次数: 12

Back bias influence on analog performance of pTFET 背偏置对晶体管模拟性能的影响

2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) Pub Date : 1900-01-01 DOI: 10.1109/S3S.2013.6716584

P. Agopian, F. Neves, J. Martino, A. Vandooren, R. Rooyackers, E. Simoen, C. Claeys

引用次数: 3