2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

Direct point-contact characterization of Bias instability on bare SOI wafers

Pub Date : 2013-10-07 DOI: 10.1109/S3S.2013.6716529 C. Márquez, N. Rodriguez, C. Fernandez, A. Ohata, F. Gámiz, F. Allibert, S. Cristoloveanu

Self-aligned contacts for 10nm FDSOI Node: From device to circuit evaluation

Pub Date : 2013-10-01 DOI: 10.1109/S3S.2013.6716549 H. Niebojewski, C. Le Royer, Y. Morand, O. Rozeau, M. Jaud, S. Barnola, C. Arvet, J. Pradelles, J. Bustos, J. Pedini, E. Dubois, O. Faynot

GaP source-drain SOI 1T-DRAM: Solving the key technological challenges

Pub Date : 2013-10-01 DOI: 10.1109/S3S.2013.6716573 A. Pal, A. Nainani, Z. Ye, X. Bao, E. Sanchez, K. Saraswat