2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena最新文献

Higher frequency performance of stress-grading systems for HV large rotating machines 高压大型旋转机械应力分级系统的高频性能研究

2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2006-12-01 DOI: 10.1109/CEIDP.2006.312100

R. Hebner, H. El-kishky, M. Abdel-Salam, F. Brown

引用次数: 6

Relationship between PD-induced electromagnetic wave measured with UHF method and charge quantity obtained by PD current waveform in model GIS UHF法测得的PD感应电磁波与模型GIS中PD电流波形得到的电荷量的关系

2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2006-12-01 DOI: 10.1109/CEIDP.2006.312007

S. Ohtsuka, T. Teshima, S. Matsumoto, M. Hikita

引用次数: 37

Dielectric Properties of Biodegradable Polymers 生物可降解聚合物的介电性能

2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2006-12-01 DOI: 10.1109/CEIDP.2006.312020

Y. Ohki, N. Hirai

引用次数: 12

Surface static properties of plasma treated FRP 等离子体处理玻璃钢的表面静电性能

2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2006-10-01 DOI: 10.1109/CEIDP.2006.311962

J. K. Park, Claire Gu, B. Lee

引用次数: 0

Condition assessment of porcelain and toughened glass insulators from residual strength tests 瓷绝缘子和钢化玻璃绝缘子残余强度试验的状态评定

2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2006-10-01 DOI: 10.1109/CEIDP.2006.311957

A.P. Mishra, R. Gorur, S. Venkataraman, D. Kingsbury

{"title":"Condition assessment of porcelain and toughened glass insulators from residual strength tests","authors":"A.P. Mishra, R. Gorur, S. Venkataraman, D. Kingsbury","doi":"10.1109/CEIDP.2006.311957","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.311957","url":null,"abstract":"Transmission and distribution networks of most utilities worldwide have a substantial quantity of porcelain and toughened glass insulators that have been in service for over 30 years; a number that has been traditionally considered as useful life for planning purposes. Many utilities are implementing programs to replace older or defective insulators for improving reliability and also for upgrading their lines. In order to help prioritize line maintenance it is important to identify the condition of insulators and replace those insulators whose performance has reduced significantly from their new condition, hence threatening reliability. In this project, porcelain and toughened glass insulators that were in service for periods ranging from 10-30 years were removed from several locations. Electrical (puncture strength, flashover voltage) and mechanical (tensile strength) tests were performed to assess any reduction in performance. Diagnostic tests such as analysis of bonding agents, identification of internal failure paths were performed to understand failure causes. A sufficiently large number of samples were evaluated and this permitted condition assessment with statistically significant confidence limits","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"138 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123776046","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

Arc characteristics of polluted insulators covered with ice 覆冰污染绝缘子的电弧特性

2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2006-10-01 DOI: 10.1109/CEIDP.2006.311963

Y. Sabri, M. Farzaneh, J. Zhang

引用次数: 3

Diagnosis of electrical and mechanical faults of induction motor 感应电动机电气和机械故障的诊断

2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2006-10-01 DOI: 10.1109/CEIDP.2006.311984

H. Nakamura, Y. Yamamoto, Y. Mizuno

引用次数: 7

Wavelet Packet Denoising of Partial Discharge Data 局部放电数据的小波包去噪

2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2006-10-01 DOI: 10.1109/CEIDP.2006.312014

C. Petrarca, G. Lupò

{"title":"Wavelet Packet Denoising of Partial Discharge Data","authors":"C. Petrarca, G. Lupò","doi":"10.1109/CEIDP.2006.312014","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.312014","url":null,"abstract":"On-site partial discharge (PD) measurements are affected by external noise and disturbances of various nature such as interferences from radio transmissions, stochastic noise, steep front pulses from power electronics, etc. In such a hostile electromagnetic environment, the partial discharge can be completely submerged by the surrounding signals and the sensitivity and reliability of the measurement can be strongly affected. Once the signal has been recorded, a post-processing tool is needed in order to recover the PD pulses. In this paper a wavelet based technique has been used in order to extract the PD data from a noisy environment: the Wavelet Packet Transform (WPT) has been adopted, which allows a more detailed analysis of the signal with respect to the Discrete Time Wavelet Transform (DTWT). As a first step, the post-processing tool has been applied to a typical uncorrupted PD pulse which has been decomposed up to its deepest level; subsequently, an energy-based criterion in conjunction with hard-thresholding has been used in order to select a suitable mother wavelet and an adequate decomposition level; useful patterns have then been collected for the reconstruction of the signal with minimum shape distortion. Finally, the suggestions provided have been used for the extraction of numerical simulating signals, characterised by a very low signal to noise ratio (SNR), reproducing a PD pulse corrupted by external interferences and noise, in order to show the effectiveness of the proposed method.","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129568547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

Statistical analysis of in service failed epoxy resin bushings in a 50 kV switchgear assembly 50kv开关柜在役失效环氧树脂套管的统计分析

2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2006-10-01 DOI: 10.1109/CEIDP.2006.311971

R. Jongen, P. Morshuis, J. Smit, A. Janssen, E. Gulski

{"title":"Statistical analysis of in service failed epoxy resin bushings in a 50 kV switchgear assembly","authors":"R. Jongen, P. Morshuis, J. Smit, A. Janssen, E. Gulski","doi":"10.1109/CEIDP.2006.311971","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.311971","url":null,"abstract":"In the 1960's up to the 1980's a very compact oil-filled switchgear assembly was installed in the 50 kV networks of different utilities in the Netherlands. Per bay the switchgear consists of different oil-filled compartments where the high voltage parts are supported and connected from one compartment to the other by epoxy resin bushings. The population of this type of bushing is relative large. The number of failures however is low, and most of them occurred in the early nineties. This initiated a concern about the possibility of an oncoming re-investment wave due to replacement of this type of circuit breaker. In this contribution a statistical analysis of failure data was performed for failure prediction in the future. From the statistical analysis it can be concluded that the bushings are in the wear-out life period of the bathtub curve. However, the relative low value of the shape parameter indicates that the ageing process is in its early stage. If the failure rate function obtained from the analysis is compared with the population in service, than the total population can be stated as young. With the analysis an estimate is made of the expected number of failures in coming years, which can help the asset manager to determine if action has to be taken to meet the business policy","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129860470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

On the degree of exfoliation affecting the corona performance of a nanodielectric surface 剥落程度对纳米电介质表面电晕性能的影响

2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2006-10-01 DOI: 10.1109/CEIDP.2006.311939

M. Frechette, R. Larocque, M. Lessard, M. Trudeau, R. Veillette, K. Cole, M.T. Ton That

引用次数: 5