Statistical analysis of in service failed epoxy resin bushings in a 50 kV switchgear assembly

2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2006-10-01 DOI:10.1109/CEIDP.2006.311971

R. Jongen, P. Morshuis, J. Smit, A. Janssen, E. Gulski

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引用次数: 6

Abstract

In the 1960's up to the 1980's a very compact oil-filled switchgear assembly was installed in the 50 kV networks of different utilities in the Netherlands. Per bay the switchgear consists of different oil-filled compartments where the high voltage parts are supported and connected from one compartment to the other by epoxy resin bushings. The population of this type of bushing is relative large. The number of failures however is low, and most of them occurred in the early nineties. This initiated a concern about the possibility of an oncoming re-investment wave due to replacement of this type of circuit breaker. In this contribution a statistical analysis of failure data was performed for failure prediction in the future. From the statistical analysis it can be concluded that the bushings are in the wear-out life period of the bathtub curve. However, the relative low value of the shape parameter indicates that the ageing process is in its early stage. If the failure rate function obtained from the analysis is compared with the population in service, than the total population can be stated as young. With the analysis an estimate is made of the expected number of failures in coming years, which can help the asset manager to determine if action has to be taken to meet the business policy

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50kv开关柜在役失效环氧树脂套管的统计分析

在20世纪60年代到80年代，一个非常紧凑的充油开关柜组件安装在荷兰不同公用事业的50千伏网络中。每个开关设备由不同的充油室组成，其中高压部件由一个室支撑并通过环氧树脂套管从一个室连接到另一个室。这种类型的套管的数量相对较大。然而，失败的数量很低，其中大多数发生在九十年代初。这引发了人们对即将到来的再投资浪潮的可能性的关注，因为更换了这种类型的断路器。在这篇文章中，对失效数据进行了统计分析，以便将来进行失效预测。从统计分析可以得出衬套处于浴盆曲线的磨损寿命期。然而，形状参数相对较低，表明老化过程处于早期阶段。如果将分析得到的故障率函数与在役人口进行比较，则总人口可以表示为年轻人口。通过分析，可以对未来几年的预期失败数量进行估计，这可以帮助资产管理人员确定是否必须采取行动来满足业务策略

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena

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