Quality Engineering最新文献

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A high dimensional functional time series approach to evolution outlier detection for grouped smart meters 分组智能电表演化异常点检测的高维函数时间序列方法
IF 2 4区 工程技术
Quality Engineering Pub Date : 2022-11-01 DOI: 10.1080/08982112.2022.2135009
A. Elías, J. Morales, S. Pineda
{"title":"A high dimensional functional time series approach to evolution outlier detection for grouped smart meters","authors":"A. Elías, J. Morales, S. Pineda","doi":"10.1080/08982112.2022.2135009","DOIUrl":"https://doi.org/10.1080/08982112.2022.2135009","url":null,"abstract":"Abstract Smart metering infrastructures collect data almost continuously in the form of fine-grained long time series. These massive data series often have common daily patterns that are repeated between similar days or seasons and shared among grouped meters. Within this context, we propose an unsupervised method to highlight individuals with abnormal daily dependency patterns, which we term evolution outliers. To this end, we approach the problem from the standpoint of High Dimensional Functional Time Series and we use the concept of functional depth to exploit the dynamic group structure and isolate individual meters with a different evolution. The performance of the proposal is first evaluated empirically through a simulation exercise under different evolution scenarios. Subsequently, the importance and need for an evolution outlier detection method are shown by using actual smart-metering data corresponding to photo-voltaic energy generation and circuit voltage records. Here, our proposal detects outliers that might go unnoticed by other approaches of the literature that have demonstrated to be effective capturing magnitude and shape abnormalities.","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"35 1","pages":"371 - 387"},"PeriodicalIF":2.0,"publicationDate":"2022-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47493760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Software security evaluation using multilevel vulnerability discovery modeling 基于多层次漏洞发现模型的软件安全评估
IF 2 4区 工程技术
Quality Engineering Pub Date : 2022-11-01 DOI: 10.1080/08982112.2022.2132404
Ruchi Sharma, A. Shrivastava, H. Pham
{"title":"Software security evaluation using multilevel vulnerability discovery modeling","authors":"Ruchi Sharma, A. Shrivastava, H. Pham","doi":"10.1080/08982112.2022.2132404","DOIUrl":"https://doi.org/10.1080/08982112.2022.2132404","url":null,"abstract":"Abstract In this work, we propose a new vulnerability discovery model by predicting the number and probability of occurrence of vulnerabilities of different severity levels in software. The severity prediction assumes that the vulnerability score is a continuous variable distributed over a range of 0–10 as per the widely accepted common vulnerability scoring system. We have further developed a risk assessment model which can be used to define the security level of software and is helpful in risk assessment and patch management. A numerical illustration is done on real-life dataset to validate the proposed model.","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"35 1","pages":"341 - 352"},"PeriodicalIF":2.0,"publicationDate":"2022-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47982825","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Introduction to special edition of Quality Engineering 《质量工程》特刊简介
IF 2 4区 工程技术
Quality Engineering Pub Date : 2022-10-02 DOI: 10.1080/08982112.2022.2133883
R. Hoerl, R. Snee
{"title":"Introduction to special edition of Quality Engineering","authors":"R. Hoerl, R. Snee","doi":"10.1080/08982112.2022.2133883","DOIUrl":"https://doi.org/10.1080/08982112.2022.2133883","url":null,"abstract":"This special issue of Quality Engineering is dedicated to the topic of statistical engineering (SE). The primary motivation for the development of SE as a discipline has been the gap between the impact statistics has had on society, which has been noteworthy to be sure, and the impact that it could and should have, which would be transformational. Ironically, ten years ago Christine Anderson-Cook and Lu Lu saw this issue, and co-edited the first special edition of Quality Engineering on SE (Anderson-Cook and Lu 2012), which at that time was just beginning to emerge as a unique discipline. A lot has happened between 2012 and 2022, hence we feel that this is an excellent time to revisit SE in the journal that has published many of the seminal papers on the topic. In their introduction to the first special edition, Anderson-Cook and Lu stated:","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"34 1","pages":"423 - 425"},"PeriodicalIF":2.0,"publicationDate":"2022-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41638089","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An exponentially weighted moving average control chart based on signed ranks for finite horizon processes 有限水平过程的指数加权移动平均控制图
IF 2 4区 工程技术
Quality Engineering Pub Date : 2022-09-27 DOI: 10.1080/08982112.2022.2125815
T. Perdikis, G. Celano, S. Psarakis, P. Castagliola
{"title":"An exponentially weighted moving average control chart based on signed ranks for finite horizon processes","authors":"T. Perdikis, G. Celano, S. Psarakis, P. Castagliola","doi":"10.1080/08982112.2022.2125815","DOIUrl":"https://doi.org/10.1080/08982112.2022.2125815","url":null,"abstract":"Abstract Distribution-free control charts are an efficient quality monitoring tool to inspect lots of parts manufactured within a finite production horizon. In this work, the performance of the Exponentially Weighted Moving Average chart based on the Wilcoxon signed rank statistic is investigated for on-line monitoring of finite production runs. The chart’s on-target performance is evaluated through a specific non-homogeneous Markov chain model under different process scenarios. A numerical analysis is conducted for determining its optimal design and a performance comparison with other available schemes is presented for different symmetric distributions of observations. Finally, an illustrative example is presented to show a practical implementation of the investigated chart.","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"35 1","pages":"290 - 303"},"PeriodicalIF":2.0,"publicationDate":"2022-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46840574","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A simple test to determine the contributors of fraction nonconforming shifts in a multivariate binomial process 一个简单的测试,以确定在多元二项式过程中的分数不符合移位的贡献者
IF 2 4区 工程技术
Quality Engineering Pub Date : 2022-09-26 DOI: 10.1080/08982112.2022.2124876
C. Hou
{"title":"A simple test to determine the contributors of fraction nonconforming shifts in a multivariate binomial process","authors":"C. Hou","doi":"10.1080/08982112.2022.2124876","DOIUrl":"https://doi.org/10.1080/08982112.2022.2124876","url":null,"abstract":"Abstract The fraction nonconforming, which follows a binomial distribution, is one of the most critical quality characteristics of attribute processes. In addition, the multivariate binomial process plays an important role in industries due to the enormous diversity of quality characteristics. A multivariate binomial process is deemed out of control when it triggers a signal in a multivariate statistical process control chart. However, it is difficult to determine which quality characteristic triggers the nonconforming shift. In contrast to most current studies that identify the contributors of shifts in multivariate normal processes, this study discusses the contributors of fraction nonconforming shifts in multivariate binomial processes. First, a test that can be applied to detect outliers in a multivariate binomial distribution is proposed. In addition, a stepwise test method that can be used to determine the contributors of fraction nonconforming shifts in a multivariate binomial process is then developed. Numerical results indicate that the method proposed is effective in determining the contributors of fraction nonconforming shifts for a multivariate binomial process.","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"35 1","pages":"279 - 289"},"PeriodicalIF":2.0,"publicationDate":"2022-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48357035","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Developing a cost-efficient dual sampling system for lot disposition by considering process yield and quality loss 考虑工艺产量和质量损失,开发一种经济高效的批量处理双采样系统
IF 2 4区 工程技术
Quality Engineering Pub Date : 2022-09-26 DOI: 10.1080/08982112.2022.2124381
Shih-Wen Liu, Zih-Huei Wang, To‐Cheng Wang
{"title":"Developing a cost-efficient dual sampling system for lot disposition by considering process yield and quality loss","authors":"Shih-Wen Liu, Zih-Huei Wang, To‐Cheng Wang","doi":"10.1080/08982112.2022.2124381","DOIUrl":"https://doi.org/10.1080/08982112.2022.2124381","url":null,"abstract":"Abstract In the past few decades, various sampling strategies have been developed for different perspectives or occasions to benefit from cost reduction or time-saving when one performs lot disposition, particularly for those inspected items or expensive procedures. The quick switching sampling (QSS) system has been important in examining fewer samples under the same quality requirements and was designed with a dually flexible mechanism for varied qualities. However, most related studies considered only a fixed switching policy either critical value or sample-sized tightenings, which might neglect the collective effect of two types of QSS systems. In this study, we integrate two variables QSS (VQSS) systems in a generalized form, known as integrated VQSS (IVQSS), based on the Cpmk index, a non-scale process performance indicator considering centering, variation, and quality loss simultaneously to accommodate advantages of two individual systems. The operating characteristic function is derived using the Markov Chain theory. Furthermore, we developed a mathematical model to minimize the average sample number and limit two acceptable sampling risks under desirable submitted quality levels. The plan parameters are obtained for making a reliable judgment on submissions by solving this optimization problem. Finally, to illustrate the practicability of the proposed method, we demonstrated a numerical application obtained from a solar panel industry and provided the solved plan parameters under commonly used conditions for convenient use.","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"35 1","pages":"267 - 278"},"PeriodicalIF":2.0,"publicationDate":"2022-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48856789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Precision of CSLT measurement system for defect detection in bored piles CSLT检测系统在钻孔桩缺陷检测中的精度
IF 2 4区 工程技术
Quality Engineering Pub Date : 2022-09-13 DOI: 10.1080/08982112.2022.2118062
Tak Cho Eric Ho, I. Zwetsloot
{"title":"Precision of CSLT measurement system for defect detection in bored piles","authors":"Tak Cho Eric Ho, I. Zwetsloot","doi":"10.1080/08982112.2022.2118062","DOIUrl":"https://doi.org/10.1080/08982112.2022.2118062","url":null,"abstract":"Abstract Crosshole Sonic Logging Tomography (CSLT) is an emerging innovative measurement system which provides information on the size, shape, and orientation of defects in a bored pile. In this paper, we quantify measurement precision of the CSTL system by a gage repeatability and reproducibility (R&R) study, in order to understand and model the effects of the test operators, defects, and the test machines on measurement error. We do this by setting up a test pile with three know defects and performing various measurement experiments. We use a feature extraction method to quantify measurement error. Overall, we find that the CSLT has satisfactory repeatability and reproducibility for practical usage of defect detection.","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"35 1","pages":"353 - 363"},"PeriodicalIF":2.0,"publicationDate":"2022-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46979005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Statistical engineering: Synergies with established engineering disciplines 统计工程:与已建立的工程学科协同作用
IF 2 4区 工程技术
Quality Engineering Pub Date : 2022-09-13 DOI: 10.1080/08982112.2022.2118064
Susan O. Schall
{"title":"Statistical engineering: Synergies with established engineering disciplines","authors":"Susan O. Schall","doi":"10.1080/08982112.2022.2118064","DOIUrl":"https://doi.org/10.1080/08982112.2022.2118064","url":null,"abstract":"Abstract This article explores the similarities and synergies between statistical engineering and established engineering disciplines. Statistical engineering is compared to the focus, process, and knowledge of established engineering disciplines and areas where synergies lie to the benefit of all engineering disciplines identified. Statistical engineering has the potential to help solve large unstructured engineering challenges to improve the planet. SUMMARY In theory, and also in my experience, statistical engineering has much in common with the definition and processes of engineering. Both focus on solving problems with similar frameworks and overlapping tool sets. Statistical engineering brings more emphasis, methods, and tools for data analysis that would benefit the engineering design process in attacking the large unstructured challenges of our world (the 14 grand challenges). It also defines problems at a broader level, including the political and social elements of the problem that could lead to better, more sustainable (long-term) solutions. Statistical engineering can also help all types of engineering enhance their problem-solving skills by incorporating empirical approaches into problem-solving efforts.","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"34 1","pages":"468 - 472"},"PeriodicalIF":2.0,"publicationDate":"2022-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42982441","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A life extrapolation model using accelerated equivalent luminance and its application 加速等效亮度寿命外推模型及其应用
IF 2 4区 工程技术
Quality Engineering Pub Date : 2022-09-13 DOI: 10.1080/08982112.2022.2119409
Jianping Zhang, Yinjie Zhang, Lei Sun, Jian Fu, Qing Zhou, Jun Hu, Cheng Bao, Siyi Chen
{"title":"A life extrapolation model using accelerated equivalent luminance and its application","authors":"Jianping Zhang, Yinjie Zhang, Lei Sun, Jian Fu, Qing Zhou, Jun Hu, Cheng Bao, Siyi Chen","doi":"10.1080/08982112.2022.2119409","DOIUrl":"https://doi.org/10.1080/08982112.2022.2119409","url":null,"abstract":"Abstract Aiming at predicting the life of vacuum fluorescent display (VFD) accurately, four groups of constant-stress accelerated degradation tests (ADTs) were conducted, and the life extrapolation model of accelerated equivalent luminance (LEMAEL) based on each test sample was proposed. In this model, firstly, Weibull function was employed to fit luminance degradation data of each sample at each stress. Secondly, Logistic function was determined by Anderson-Darling test to respectively describe the distributions of shape and scale parameters, and the degradation formula of accelerated equivalent luminance was obtained to estimate accelerated life. Finally, Power function was selected by comparing determination coefficients to fit the data points formed by accelerated life and stress, and thereby VFD life was extrapolated. The results indicate that the collected test data of each sample objectively reflect VFD luminance characteristics; the degradation formula intuitively exhibits the luminance variation law at each accelerated stress, and Power function accurately reveals the relationship between life and stress; LEMAEL is characterized by high precision and large amount of data information, which not only actualizes the accurate life estimation for light-emitting devices without conventional life tests, but also provides entirely new modeling ideas and thoughts for reliability evaluation and life prediction of products.","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"35 1","pages":"258 - 266"},"PeriodicalIF":2.0,"publicationDate":"2022-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48201234","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Design of Multiple Deferred State Repetitive Group Sampling Plans for Life Tests based on Generalized Gamma Distribution 基于广义伽玛分布的多延迟状态重复组寿命试验抽样方案设计
IF 2 4区 工程技术
Quality Engineering Pub Date : 2022-09-07 DOI: 10.1080/08982112.2022.2118063
K. Sathya Narayana Sharma
{"title":"Design of Multiple Deferred State Repetitive Group Sampling Plans for Life Tests based on Generalized Gamma Distribution","authors":"K. Sathya Narayana Sharma","doi":"10.1080/08982112.2022.2118063","DOIUrl":"https://doi.org/10.1080/08982112.2022.2118063","url":null,"abstract":"Abstract Reliability sampling plans is a procedure to determine the acceptance or non-acceptance of the lot(s) of finished products by performing tests on the sampled items. Lifetime of individual items is a quality characteristic that can be treated as a continuous random variable and can be modeled by an appropriate continuous probability distribution. In this article, Multiple Deferred State Repetitive Group Sampling (MDSRGS) Plans for life tests under hybrid censoring with a provision to draw a random sample and to admit a maximum of one failure in the sample is formulated assuming that the lifetime random variable follows a Generalized Gamma (GG) distribution. A methodical procedure for the selection of the plan parameters using mean life criterion with the desired discrimination protecting the interests of the producer and the consumer in terms of the acceptable mean life and unacceptable mean life is evolved.","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"35 1","pages":"248 - 257"},"PeriodicalIF":2.0,"publicationDate":"2022-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42754631","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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