{"title":"Application of the venable converter to a series of satellite twt power processors","authors":"A. Rostad, C. McCown, D. O. Lawrence","doi":"10.1109/PESC.1976.7072904","DOIUrl":"https://doi.org/10.1109/PESC.1976.7072904","url":null,"abstract":"The development of a series of five TWT power processors for military and commercial communications satellites is described. Each power conditioner uses the high efficiency Venable Regulating dc-todc Converter* as a design base and together they form a series of processors capable of providing traveling-wave tube power in the range of 7 to 100 watts and at a variety of electrode voltages up to 4 kV.","PeriodicalId":208049,"journal":{"name":"1970 IEEE Power Electronics Specialists Conference","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125617527","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Stable hot spots and second breakdown in power transistors","authors":"P. Hower, D. Blackburn, F. Oettinger, S. Rubin","doi":"10.1109/PESC.1976.7072923","DOIUrl":"https://doi.org/10.1109/PESC.1976.7072923","url":null,"abstract":"The mechanism of hot spot formation in transistors is examined from both experimental and theoretical viewpoints. It is shown that after the device becomes thermally unstable the device may restabilize in a hot spot mode of operation. The IC, VCE thermal instability locus can accurately be predicted assuming the current density is uniform prior to hot spot formation. A new model is proposed which explains why the device may restabilize in a hot spot mode and why devices exhibit \"thermal hysteresis\". It is also shown using thermal mapping techniques that emitter current crowding exists in the stable hot spot mode. Finally, the experiments support the idea that second breakdown occurs when the current density within the hot spot reaches a critical value.","PeriodicalId":208049,"journal":{"name":"1970 IEEE Power Electronics Specialists Conference","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126653503","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Resonant switching power conversion","authors":"E. Miller","doi":"10.1109/PESC.1976.7072919","DOIUrl":"https://doi.org/10.1109/PESC.1976.7072919","url":null,"abstract":"A description is given of the operating cycle of the resonant switching dc-to-dc power converter. A method is outlined for precise voltage regulation against line and load changes. Sufficient analysis is presented to form the basis for preliminary design to meet any set of input and output requirements. Performance features are outlined for a flight qualified, highly efficient, light weight resonant switching converter for the U. S. Navy's Navigation Technology Satellite (NTS-2).","PeriodicalId":208049,"journal":{"name":"1970 IEEE Power Electronics Specialists Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129629820","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"AC power conditioning","authors":"J. Motto","doi":"10.1109/PESC.1976.7072908","DOIUrl":"https://doi.org/10.1109/PESC.1976.7072908","url":null,"abstract":"The advent of readily available high power static switching devices has resulted in an almost infinite number of techniques for the control, inversion, and conditioning of A C power. The six papers presented in this session represent a good cross section of the power electronic technologies utilized for the A C power conditioning in a wide range of industrial and power systems applications.","PeriodicalId":208049,"journal":{"name":"1970 IEEE Power Electronics Specialists Conference","volume":"221 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115590596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Computer model for a high power SCR","authors":"H. Nienhaus, J. Bowers, P. C. Herren","doi":"10.1109/PESC.1976.7072898","DOIUrl":"https://doi.org/10.1109/PESC.1976.7072898","url":null,"abstract":"This paper describes a general computer model for a high power SCR that gives an accurate simulation of all important static and dynamic performance characteristics including such two-dimensional effects a spreading, gate isolation, and latch-in. Computer simulated vs. measured static characteristics of a representative device are listed for comparison. A comparison of a computer simulated vs. measured turn on transient is also included.","PeriodicalId":208049,"journal":{"name":"1970 IEEE Power Electronics Specialists Conference","volume":"128 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115227912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Power semiconductor devices, PESC, 1976","authors":"Warren Letsinger","doi":"10.1109/PESC.1976.7072922","DOIUrl":"https://doi.org/10.1109/PESC.1976.7072922","url":null,"abstract":"Discrete power semiconductors and other electrical components have demanding applications today that require new sophistication in design, characterization, and performance. Voltage and power levels, as well as switching speeds available in thyristors and transistors, make additional knowledge of dynamic characteristics essential. In this session, seven papers are presented that embody additional knowledge--two are devoted to aspects of power transistor second breakdown phenomena; one describes the design and characteristics of a field terminated diode that offers improved characteristics over an SCR; three are committed to the design of light activated thyristors and switches; and one describes nondestructive corona studies of mylar capacitors.","PeriodicalId":208049,"journal":{"name":"1970 IEEE Power Electronics Specialists Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1976-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128860135","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Ultrasonic evaluation of high voltage circuit boards","authors":"S. Klima, T. Riley","doi":"10.1109/PESC.1976.7072907","DOIUrl":"https://doi.org/10.1109/PESC.1976.7072907","url":null,"abstract":"Preliminary observations indicate that an ultrasonic scanning technique may be useful as a quick, low cost, nondestructive method for judging the quality of circuit board materials for high voltage applications. Corona inception voltage tests were conducted on fiberglassepoxy and fiberglass-polyimide high pressure laminates from 20° to 140° C. The same materials were scanned ultrasonically by utilizing the s ingle transducer, throughtransmission technique with reflector plate, and recording variations in ultrasonic energy transmitted through the board thickness. A direct relationship was observed between ultrasonic transmission level and corona inception voltage. The ultrasonic technique was subsequently used to aid selection of high quality circuit boards for the Communications Technology Satellite.","PeriodicalId":208049,"journal":{"name":"1970 IEEE Power Electronics Specialists Conference","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127188487","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Opening remarks","authors":"P. Thollot","doi":"10.1163/22116176-90000128","DOIUrl":"https://doi.org/10.1163/22116176-90000128","url":null,"abstract":"The 1976 Power Electronics Specialists Conference truly exemplified the principles on which the first such conference was based, seven years ago.","PeriodicalId":208049,"journal":{"name":"1970 IEEE Power Electronics Specialists Conference","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125697768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"1977 Power Electronics Specialists Conference","authors":"","doi":"10.1109/pesc.1976.7072891","DOIUrl":"https://doi.org/10.1109/pesc.1976.7072891","url":null,"abstract":"The Power Electronics Specialists Conference, held since 1970, spans diverse electrical/ electronic disciplines and v a r i ed industrial areas to create a forum for presenting the technology of power electronics.","PeriodicalId":208049,"journal":{"name":"1970 IEEE Power Electronics Specialists Conference","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123662390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Regulation of a lightweight high efficiency capacitor diode voltage multiplier DC-DC converter","authors":"W. Harrigill, I. Myers","doi":"10.1109/PESC.1976.7072916","DOIUrl":"https://doi.org/10.1109/PESC.1976.7072916","url":null,"abstract":"A method for the regulation of a capacitor diode voltage multiplier dc-dc converter has been developed which has only minor penalties in weight and efficiency. An auxiliary inductor is used, which only handles a fraction of the total power, to control the output voltage through a pulse width modulation method in a buck boost circuit.","PeriodicalId":208049,"journal":{"name":"1970 IEEE Power Electronics Specialists Conference","volume":"220 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130493122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}