Proceedings First Asian Test Symposium (ATS `92)最新文献

筛选
英文 中文
Accumulator-based compaction for built-in self test of data-path architectures 用于数据路径体系结构的内置自测的基于累加器的压缩
Proceedings First Asian Test Symposium (ATS `92) Pub Date : 1992-11-26 DOI: 10.1109/ATS.1992.224401
M. Kassab, J. Rajski, J. Tyszer
{"title":"Accumulator-based compaction for built-in self test of data-path architectures","authors":"M. Kassab, J. Rajski, J. Tyszer","doi":"10.1109/ATS.1992.224401","DOIUrl":"https://doi.org/10.1109/ATS.1992.224401","url":null,"abstract":"Accumulators composed of adders and registers are commonly used building blocks in general-purpose computing structures based on data-path architecture. The authors introduce a new accumulator-based compaction scheme for parallel compaction of test responses. The proposed scheme is compatible with the width of the data path, the hardware overhead is minimal, it does not introduce any performance degradation, and the compaction quality is the same as that offered by linear feedback shift registers.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131316126","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Functional testing with process flowcharts of microprocessor based sequence controllers 基于微处理器的顺序控制器工艺流程图的功能测试
Proceedings First Asian Test Symposium (ATS `92) Pub Date : 1992-11-26 DOI: 10.1109/ATS.1992.224445
T. Yamazoe, M. Hashizume, E. Tasaka, T. Tamesada, T. Kayahara
{"title":"Functional testing with process flowcharts of microprocessor based sequence controllers","authors":"T. Yamazoe, M. Hashizume, E. Tasaka, T. Tamesada, T. Kayahara","doi":"10.1109/ATS.1992.224445","DOIUrl":"https://doi.org/10.1109/ATS.1992.224445","url":null,"abstract":"A functional test method is proposed for production tests of microprocessor based sequence controllers. The method is based on process flowcharts, in which the operation sequences of sequence controlled machines are defined. The method is applied to a fault detection problem of a commercialized boiler control circuit and the effectiveness is checked.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133097459","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信