Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics最新文献_第10页

Analysis of ferroelectric thin films deposited by pulsed laser deposition on oxide and fluoride substrates 脉冲激光在氧化物和氟化物衬底上沉积铁电薄膜分析

Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics Pub Date : 1994-08-07 DOI: 10.1109/ISAF.1994.522300

S. Sengupta, L. Sengupta, S. Stowell, É. Ngo, W. E. Kosik, D. Vijay

{"title":"Analysis of ferroelectric thin films deposited by pulsed laser deposition on oxide and fluoride substrates","authors":"S. Sengupta, L. Sengupta, S. Stowell, É. Ngo, W. E. Kosik, D. Vijay","doi":"10.1109/ISAF.1994.522300","DOIUrl":"https://doi.org/10.1109/ISAF.1994.522300","url":null,"abstract":"This work has been carried out as part of an ongoing investigation in which thin film ferroelectric phase shifters are being constructed, tested, and optimized. The phase shifters will be incorporated into multi-element phased array antennas. The beam steering material used here was Ba/sub 0.6/Sr/sub 0.4/TiO/sub 3/ (BSTO) and BSTO with 1 wt% oxide additive. Thin films of BSTO have been deposited by pulsed laser deposition (PLD) onto various oxide and fluoride substrates. These include oxide substrates such as magnesium oxide (MgO), sapphire (Al/sub 2/O/sub 3/), lanthanum aluminate (LaAlO/sub 3/), neodymium gallate (NdGaO/sub 3/), and fluoride substrates such as rubidium manganese fluoride (RbMnF/sub 3/). These substrates were selected for their relatively low dielectric constants and good lattice matches to the ferroelectric thin film compound (a=3.94 /spl Aring/). The substrate/film interfaces, areal film thicknesses and compositional variation have been studied using Rutherford backscattering spectroscopy (RBS), and physical thicknesses have been measured using a profilometer. The orientation of the thin films was investigated using glancing angle X-ray diffraction. Various electrodes have been used in order to optimize the electronic properties of the films. These electronic properties were tested at 30 KHz using an HP 4194A impedance analyzer. The measured electronic properties include the dielectric constant, and (change in the dielectric constant with applied electric field). The electronic properties have been correlated to the results derived from RBS and x-ray data and will be discussed in terms of substrate and electroding optimization.","PeriodicalId":20488,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics","volume":"23 1","pages":"70-73"},"PeriodicalIF":0.0,"publicationDate":"1994-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85528899","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

The role of statistical design in the development of electrostrictive materials 统计设计在电致伸缩材料开发中的作用

Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics Pub Date : 1994-08-07 DOI: 10.1109/ISAF.1994.522483

S. E. Prasad, S. Varma, T. Hoang, T. Wheat, A. Ahmad

{"title":"The role of statistical design in the development of electrostrictive materials","authors":"S. E. Prasad, S. Varma, T. Hoang, T. Wheat, A. Ahmad","doi":"10.1109/ISAF.1994.522483","DOIUrl":"https://doi.org/10.1109/ISAF.1994.522483","url":null,"abstract":"The role of statistical design in the development and optimization of ceramic products is examined with particular reference to lead magnesium niobate/lead titanate (PMN-PT) ceramic dielectrics. It is shown that considerable benefits can be derived by following an appropriate design in which a number of factors (processing parameters) are varied simultaneously while the system response such as density, dielectric constant, loss, etc. is monitored. If it is assumed that complex factor interactions (e.g., having greater than three factors) can be ignored, only a fraction of the whole factorial matrix need be examined. Even in cases where only eight factors are involved each having only two levels, useful information can be obtained from only 16 trials drawn from the total of 256 trials (2/sup 8/) required of a full factorial matrix. Such studies are valuable in screening and ranking the importance of the various factors on the system response. Examples of such screening designs and the subsequent modelling of the system response for the important process factors so identified are presented.","PeriodicalId":20488,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics","volume":"10 1","pages":"762-765"},"PeriodicalIF":0.0,"publicationDate":"1994-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87824907","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Micropatterning process of ferroelectric oxides by irradiation of an electron beam on metal naphthenate films 金属环烷酸盐薄膜辐照铁电氧化物的微图案化过程

Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics Pub Date : 1994-08-07 DOI: 10.1109/ISAF.1994.522298

S. Okamura, A. Kakimi, Y. Yagi, K. Mori, R. Tsukamoto

引用次数: 0

Series pyroelectric ceramics used for small area IR detector 系列热释电陶瓷，用于小面积红外探测器

Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics Pub Date : 1994-08-07 DOI: 10.1109/ISAF.1994.522500

R.B. Liu, S. Lin, C. Qu, C. Yao, Y.H. Jin, Y.S. Lin, Y.R. Zhang

引用次数: 1

Photorefractive properties of Cr/Mo co-doped SBN:60 Cr/Mo共掺杂SBN:60的光折变特性

Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics Pub Date : 1994-08-07 DOI: 10.1109/ISAF.1994.522486

G. Wood, B. P. Ketchel, R. Neurgaonkar

引用次数: 0

Breakdown in lead zirconate titanate (PZT) thin film capacitors 锆钛酸铅薄膜电容器的击穿

Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics Pub Date : 1994-08-07 DOI: 10.1109/ISAF.1994.522422

I. Yoo, S. Desu

引用次数: 0

Transmission electron microscopy study of strontium barium niobate relaxors 铌酸锶钡松弛剂的透射电镜研究

Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics Pub Date : 1994-08-07 DOI: 10.1109/ISAF.1994.522439

Z. Xu, Weng-Hsing Huang, D. Viehland, R. Neurgaonkar

引用次数: 0

Lower temperature crystallization and ordering in sol-gel derived Pb(Sc/sub 0.5/Ta/sub 0.5/)O/sub 3/ powders and thin layers 溶胶-凝胶法制备Pb(Sc/sub 0.5/Ta/sub 0.5/)O/sub 3/粉末和薄层的低温结晶和有序

Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics Pub Date : 1994-08-07 DOI: 10.1109/ISAF.1994.522395

Donhang Liu, D. Payne

引用次数: 1

The origins of electromechanical response in polyurethane elastomers 聚氨酯弹性体机电响应的起源

Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics Pub Date : 1994-08-07 DOI: 10.1109/ISAF.1994.522333

H. Wang, Q.M. Zhang, L. E. Cross, R. Ting, C. Coughlin, K. Rittenmyer

引用次数: 15

Development of new piezoelectric ceramics with bismuth perovskites 新型铋钙钛矿压电陶瓷的研制

Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics Pub Date : 1994-08-07 DOI: 10.1109/ISAF.1994.522288

T. Takenaka, M. Yamada, T. Okuda

{"title":"Development of new piezoelectric ceramics with bismuth perovskites","authors":"T. Takenaka, M. Yamada, T. Okuda","doi":"10.1109/ISAF.1994.522288","DOIUrl":"https://doi.org/10.1109/ISAF.1994.522288","url":null,"abstract":"A new solid solution, (1-x)Bi(Ni/sub 0.5/Ti/sub 0.5/)O/sub 3/x(Pb/sub a/Ba/sub b/)TiO/sub 3/ (a+b=1) (NTPB [100x-100a/100b])is studied. The dielectric, ferroelectric, piezoelectric and mechanical properties indicate a new group of piezoelectric ceramics. One of the end member of the solid solution, BINT(a=b=0, x=0) is a mixture of a bismuth layered structure consisting of Bi/sub 4/Ti/sub 3/O/sub 12/, NiO and Bi/sub 2/O/sub 3/. When x is increased, the crystal structure changes from a mixture of bismuth layered and perovskite structures to a single phase of the perovskite structure at x=0.2-0.25, being independent of the ratio of PbTiO/sub 3/ to BaTiO/sub 3/. The crystal phase with x/spl ges/0.25 of the solid solution is a perovskite structure. The electrical properties are mainly investigated for the specimens of the perovskite structure (x/spl ges/0.25) with 0.02 wt% added MnCO/sub 3/. The electromechanical coupling factors k/sub 33/, k/sub t/ and k/sub p/ of NTPB[40-100/0]+Mn (0.02 wt%) are 0.51, 0.47 and 0.32, respectively. The mechanical bending strength of NTPB[44.5-100/0]+Mn (0.02 wt%) is about 150 MPa.","PeriodicalId":20488,"journal":{"name":"Proceedings of 1994 IEEE International Symposium on Applications of Ferroelectrics","volume":"99 1","pages":"21-24"},"PeriodicalIF":0.0,"publicationDate":"1994-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78375489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2