Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)最新文献_第2页

Problems in the Production of Microelectronic Equipments 微电子设备生产中的问题

Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) Pub Date : 1998-07-17 DOI: 10.1109/NAECON.1998.710122

L. Hallman

引用次数: 0

An automated testing methodology based on self-checking software 一种基于自检软件的自动化测试方法

Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) Pub Date : 1998-07-13 DOI: 10.1109/NAECON.1998.710118

Reinhart, Carolyn Boettcher, Hal Wasserman

引用次数: 7

Project amber: re-engineering a legacy ground radar modeling system into a standards based object oriented architecture amber项目:将传统的地面雷达建模系统重新设计为基于标准的面向对象体系结构

Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) Pub Date : 1998-07-13 DOI: 10.1109/NAECON.1998.710135

J. Bacso, R. F. Moody

引用次数: 5

Terrain map data treatment for low altitude penetration 低空穿透地形图数据处理

Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) Pub Date : 1998-07-13 DOI: 10.1109/NAECON.1998.710142

Li Qing, Guo Pan, Shen Chunlin

引用次数: 0

Reduction of decision error in track identification by utilization of data fusion 利用数据融合减少航迹识别中的决策误差

Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) Pub Date : 1998-07-13 DOI: 10.1109/NAECON.1998.710173

R. J. Martel, J. J. Sudano

{"title":"Reduction of decision error in track identification by utilization of data fusion","authors":"R. J. Martel, J. J. Sudano","doi":"10.1109/NAECON.1998.710173","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710173","url":null,"abstract":"System response times are too long and decision error too high in today's computer-missile combat systems. One of the most serious shortfalls of current combat system operations is time to perform identification tasks with reliable level of certainty when, predictably, reliable decisions are most needed time is too short and system demands are high. Automated methods of reliable information generation can reduce operator workload and the probability of decision error. Multisensor data fusion concept models that address this problem have been developed. The potential advantage of multisensor data fusion is its ability to process more kinds of sensor data and more complex variables at greater speed and with less error than human decision makers. Automation speeds the identification process and frees the operator to perform higher levels of decision making. This paper attempts to bring together a concept model of multisensor data fusion with a concept model of human-computer interaction that mutually support the system engineering effort to reduce decision error in combat system identification processes.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121784545","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

System efficiency/merit (a total system evaluation) 系统效率/优点(整体系统评估)

Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) Pub Date : 1998-07-13 DOI: 10.1109/NAECON.1998.710096

F. Oliveto

引用次数: 7

Parallel simulation of VHDL-AMS models VHDL-AMS模型的并行仿真

Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) Pub Date : 1998-07-13 DOI: 10.1109/NAECON.1998.710200

H. Hirsch, P. Chawla, H. Carter

引用次数: 1

System performance of PSI technique as a function of key parameters 系统性能是PSI技术关键参数的函数

Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) Pub Date : 1998-07-13 DOI: 10.1109/NAECON.1998.710211

I. Younus, J. Loomis, G. Al-Salehi

引用次数: 0

A missile capture scheme based on conical-like scan method 一种基于锥形扫描法的导弹捕获方案

Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) Pub Date : 1998-07-13 DOI: 10.1109/NAECON.1998.710150

Jian-Ming Qu, Chen-yang Yang, S. Mao, Shao-hong Li

引用次数: 1

Packaging of low cost electronic multichip module-laminate (MCM-L) assemblies for hermetic-equivalent performance in high reliability avionics applications 封装低成本的电子多芯片模块层压板(MCM-L)组件，在高可靠性航空电子应用中具有密封等效性能

Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185) Pub Date : 1998-07-13 DOI: 10.1109/NAECON.1998.710222

M. O’Keefe, J. Hagge, R. Camilletti, G. Rinne, L. White, J. Rates

{"title":"Packaging of low cost electronic multichip module-laminate (MCM-L) assemblies for hermetic-equivalent performance in high reliability avionics applications","authors":"M. O’Keefe, J. Hagge, R. Camilletti, G. Rinne, L. White, J. Rates","doi":"10.1109/NAECON.1998.710222","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710222","url":null,"abstract":"This paper discusses the results of comparative reliability testing of electronic MultiChip Modules (MCMs) fabricated with laminate substrates (MCM-L) and protected with various bare-die coatings. The demonstration MCMs included flip-chip and wire-bond design versions of the digital portion of a Global Positioning System (GPS) Receiver MCM and an analog MCM far use in general aviation applications. Standard encapsulants and new inorganic coatings, Dow Corning's ChipSeal/sup (R)/ hermetic coating materials, were evaluated using environmental stress exposures for high reliability avionics applications. Full wafer probe testing was performed before and after the Supplemental ChipSeal/sup (R)/ processing and flip-chip processing steps. ChipSeal/sup (R)/ and flip-chip processing steps were shown to cause no device yield degradation on the five different semiconductor wafer lots tested. Environmental test results demonstrated that low cost MCM-L units with bare die packaging can be designed for very robust, high reliability applications such as military and commercial avionics.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133318992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0