系统性能是PSI技术关键参数的函数

I. Younus, J. Loomis, G. Al-Salehi
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引用次数: 0

摘要

相位阶进干涉测量(PSI)技术使用电荷耦合器件(CCD)相机进行强度图像采集,并允许近实时的全视野物体位移测量。由于该技术处理的是纳米级位移,因此精度是该方法的一个重要因素。该技术的系统参数控制着测量的精度,从而决定了系统的性能。本文试图解释关键参数的特点及其在决定系统性能中的作用。经过仔细观察,确定了各参数的最优值。为了说明关键参数对系统性能的重要性,给出了参数值的仿真结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
System performance of PSI technique as a function of key parameters
Phase stepped interferometry (PSI) technique uses a charge coupled device (CCD) camera for intensity image acquisition and allow for near real-time full field object displacement measurements. Since this technique deals with nanometer level displacements, accuracy is a big factor for this method. System parameters of this technique control the accuracy of the measurement and hence determine the system's performance. In this paper an effort is made to explain the characteristics of the key parameters and their role in determining system's performance. The optimum value of the parameters have been chosen after a careful observation. A simulated result has also been presented using the valve of the parameters in order to show the importance of key parameters on system's performance.
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