Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94最新文献_第2页

QFD at Loral Aeronutronic Loral航空电子公司的QFD

Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94 Pub Date : 1994-10-17 DOI: 10.1109/IEMC.1994.379950

D. Braun, J.P. Chihorek

引用次数: 0

An interactive project prioritization model implementation 交互式项目优先级模型实现

Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94 Pub Date : 1994-10-17 DOI: 10.1109/IEMC.1994.379928

I. Iyigun, Y. Tanes

引用次数: 2

In-process inspection and correction facilities subject to errors 过程中检查和纠正设施的错误

Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94 Pub Date : 1994-10-17 DOI: 10.1109/IEMC.1994.379922

D. Irianto

{"title":"In-process inspection and correction facilities subject to errors","authors":"D. Irianto","doi":"10.1109/IEMC.1994.379922","DOIUrl":"https://doi.org/10.1109/IEMC.1994.379922","url":null,"abstract":"Inspection error is one important cause of consumer dissatisfaction particularly in consumer products. For decades, inspection for quality of product has been performed mostly at the end of production line. Therefore, any nonconformance from product's specification is known at the time they are inspected. One solution is applying in or between process's inspection. This becomes available by the use of sensor technology that is no longer expensive for specific purposes. Moreover, necessary in or between process's correction can be performed before parts or components are manufactured by the next process. In this study, an in-process inspection and correction facility is considered. Two sequences are compared, the first consists of process and inspection, where correction is performed by the same process. The second includes an additional correction facility and any nonconformance is corrected separately. Process, inspection and correction costs are considered as an economical measure of the accepted product for both sequences. On the other hand, an accepted product is not always perfect, it varies around its target value due to variation of process or correction and inspection error, finally resulting in loss to the consumer. A model of the sum of these costs and losses is used to determine the best sequence.<<ETX>>","PeriodicalId":200747,"journal":{"name":"Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128864266","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Artificial neural networks for real-time process control 实时过程控制的人工神经网络

Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94 Pub Date : 1994-10-17 DOI: 10.1109/IEMC.1994.379923

A. Gulati, D. Jacobs

引用次数: 0

An estimation procedure to detect and remove unintentional judgemental bias (UJB) in the analytic hierarchy process methodology 一种在层次分析法中检测和消除无意识判断偏差(UJB)的估计程序

Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94 Pub Date : 1994-10-17 DOI: 10.1109/IEMC.1994.379924

G. C. Mcmeekin

{"title":"An estimation procedure to detect and remove unintentional judgemental bias (UJB) in the analytic hierarchy process methodology","authors":"G. C. Mcmeekin","doi":"10.1109/IEMC.1994.379924","DOIUrl":"https://doi.org/10.1109/IEMC.1994.379924","url":null,"abstract":"This paper provides an estimation procedure to detect and to remove unintentional judgmental bias (UJB) in the analytical hierarchy process (AHP) methodology for multicriteria decision making (MCDM). UJB reflects a \"cyclical hierarchy\" because of the existence of a structural dependence of alternatives on criteria. This violates the principle of hierarchic composition embodied in the AHP method. The judgment data for comparing the different sources of risk are susceptible to the \"framing effect\" bias. The reference AHP and the supermatrix approach can be used to detect for the presence of UJB in the original AHP data. The estimation and removal of UJB can be achieved by an L2 norm estimation procedure using the Stein estimator. This involves use of the generalized inverse theory and methodology. The feedback data matrices provide a \"dual\" formulation for the original AHP hierarchy. The supermatrix approach is based on a stationary Markov system involving the feedback matrix and the original AHP matrix local priorities at each level of the hierarchy. Once the original AHP judgment data has been revised to remove the UJB influence, it can then be used to provide the correct AHP sensitivity analysis.<<ETX>>","PeriodicalId":200747,"journal":{"name":"Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133684844","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

United view on ISO 9001 model and SEI CMM ISO 9001模型与SEI CMM的统一观点

Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94 Pub Date : 1994-10-17 DOI: 10.1109/IEMC.1994.379951

I. Rozman, R. Vajde Horvat, J. Gyorkos

引用次数: 6

Strategic business management in a competitive environment 竞争环境下的战略企业管理

Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94 Pub Date : 1994-10-17 DOI: 10.1109/IEMC.1994.379913

K. Murthy, R. Kadur, N. Nagaraju

{"title":"Strategic business management in a competitive environment","authors":"K. Murthy, R. Kadur, N. Nagaraju","doi":"10.1109/IEMC.1994.379913","DOIUrl":"https://doi.org/10.1109/IEMC.1994.379913","url":null,"abstract":"Technological improvements in consumer products have been happening at an unprecedented pace, especially in the latter part of this century. This exponential technological progress is bound to continue for many more decades to come through the year 2000 and beyond. Many American industry giants and conglomerates have resorted to manufacturing in the far Eastern and Pacific rim countries, whereas many Japanese and European industry leaders have opened manufacturing and marketing locations in the US, to comply with the globalization trend of the business and economic environment. Companies are taking a global management approach to exploit this trend and to increase and maintain their market share. Many recent historic events like the unification of Germany, demise of the USSR and EEC-92 are examples of the changes prompting as well as justifying management approach befitting for survival in the global business environment. Any company developing and manufacturing products should be equipped to survive in this internationally competitive environment. Because high technology products become obsolete quickly, owing to the pace of the technological progress, product development and manufacturing techniques combined with long-term product planning as well as judicious product introduction schemes have to be employed, while maintaining a quality edge over competitors.<<ETX>>","PeriodicalId":200747,"journal":{"name":"Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122387558","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

A quality system for project management 项目管理的质量体系

Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94 Pub Date : 1994-10-17 DOI: 10.1109/IEMC.1994.379960

A. Connelly

引用次数: 0

Quality build-in computer aided process control for the electronic industry 电子工业质量内置计算机辅助过程控制

Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94 Pub Date : 1994-10-17 DOI: 10.1109/IEMC.1994.379921

P. Saengpongpaew

引用次数: 1

Technology transfer through cultural barriers in three continents 三大洲文化障碍下的技术转移

Proceedings of 1994 IEEE International Engineering Management Conference - IEMC '94 Pub Date : 1994-10-17 DOI: 10.1109/IEMC.1994.379945

S. Kitsopoulos

引用次数: 0