发布求助
文献互助 智能选刊 最新文献

2019 92nd ARFTG Microwave Measurement Conference (ARFTG)最新文献

筛选
英文 中文
Evaluation of Measurement Resolution for Scanning Microwave Microscopy 扫描微波显微镜测量分辨率的评价
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 1900-01-01 DOI: 10.1109/ARFTG.2019.8637223
M. Horibe, S. Kon, I. Hirano
{"title":"Evaluation of Measurement Resolution for Scanning Microwave Microscopy","authors":"M. Horibe, S. Kon, I. Hirano","doi":"10.1109/ARFTG.2019.8637223","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637223","url":null,"abstract":"Here we investigated the measurement resolution of a scanning microwave microscope (SMM) based on an atomic force microscope (AFM) for the characterization of several types of sample. Then, we proposed uncertainty/accuracy evaluation of SMM systems in laboratories. Dielectric material samples with high permittivity was able to be quantitatively evaluated by SMM measurement. The SMM has been detect the difference of permittivity with uncertainty. However, possibility of evaluation is now unknown for materials with small difference of electrical characteristics. This paper presents investigation results and consideration of SMM resolution by comparing with measurement uncertainty of vector network analyzers. Here, we show SMM measurement results with uncertainty for GaN epitaxial film, Graphene films, Si-dopant multi-later film and surface mount device (SMD). As the result, SMM has capable of quantitatively measuring SMD.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129673656","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Preliminary Study on WM-380 Waveguide TRL Calibration Line Standards at the UK's National Physical Laboratory 英国国家物理实验室WM-380波导TRL校准线标准的初步研究
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 1900-01-01 DOI: 10.1109/ARFTG.2019.8637214
X. Shang, N. Ridler, Wenjuan Sun, P. Cooper, Alan Wilson
{"title":"Preliminary Study on WM-380 Waveguide TRL Calibration Line Standards at the UK's National Physical Laboratory","authors":"X. Shang, N. Ridler, Wenjuan Sun, P. Cooper, Alan Wilson","doi":"10.1109/ARFTG.2019.8637214","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637214","url":null,"abstract":"NPL has launched a comprehensive study on its primary waveguide TRL calibration 3/4-wave Line standards, in order to establish traceability in S-parameter measurements at terahertz frequencies. The WM-380 band (500–750 GHz) has been chosen to demonstrate the approach that is being taken. High precision dimensional measurements have been carried out on these Line standards and the waveguide sections that are used as measuring instrument test ports. Electromagnetic modeling and simulations have been performed to quantify the impact of the dimensional errors on the electromagnetic performance of these devices. In this paper, some preliminary results are reported and discussed.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129464676","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
首页 上一页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信
小红书