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2019 92nd ARFTG Microwave Measurement Conference (ARFTG)最新文献

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Transient and Steady-State Thermal Measurements of GaN-on-SiC HEMT Transistors Under Realistic Microwave Drive 实际微波驱动下GaN-on-SiC HEMT晶体管的瞬态和稳态热测量
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637241
Jonas Urbonas, C. Matei, P. Aaen
{"title":"Transient and Steady-State Thermal Measurements of GaN-on-SiC HEMT Transistors Under Realistic Microwave Drive","authors":"Jonas Urbonas, C. Matei, P. Aaen","doi":"10.1109/ARFTG.2019.8637241","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637241","url":null,"abstract":"A new thermoreflectance and load-pull measurement set-up is presented, which enables steady-state and transient thermal imaging of RF and microwave transistors and PAs under realistic excitations. The functionality of the system is demonstrated by measuring the steady-state and transient thermal distributions of a commercially available 25-W 20-finger gallium nitride (GaN) on silicon carbide (SiC) transistor operating at 3.5 GHz. Temperature distributions and profiles are presented with the device operating under DC bias, and when it is tuned for maximum efficiency and maximum output power conditions. Transient thermal images reveal different thermal rise times on a per-channel basis.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130795217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Low-Temperature Front-Side BEOL Technology with Circuit Level Multiline Thru-Reflect-Line Kit for III-V MOSFETs on Silicon 低温前端BEOL技术和电路级多线通反射线套件，用于硅上的III-V型mosfet
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637222
S. Andrić, L. Ohlsson, Lars-Erik Wenrersson
{"title":"Low-Temperature Front-Side BEOL Technology with Circuit Level Multiline Thru-Reflect-Line Kit for III-V MOSFETs on Silicon","authors":"S. Andrić, L. Ohlsson, Lars-Erik Wenrersson","doi":"10.1109/ARFTG.2019.8637222","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637222","url":null,"abstract":"A multiline Thru-Reflect-Line (mTRL) calibration and parasitic pad removal kit is presented, intended for mm-wave III-V nanowire MOSFET characterization. Multiline TRL is implemented in a low-temperature BEOL process with substrate decoupled microstrip transmission lines. The transmission line characteristic impedance needed for accurate mTRL calibration is modelled. Simulated transmission line parameters show a good fit with measured transmission line data, including line characteristic impedance variation. Line loss less than 0.5 dB/mm up to 50 GHz is obtained. Finally, interconnect via section is calibrated and modelled, showing mTRL's ability to obtain small parasitic parameters.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125937363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Non-Probe Testing of Printed Circuits 印刷电路的非探头测试
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637228
JungHo Kang, Kyungsoo Chae
{"title":"Non-Probe Testing of Printed Circuits","authors":"JungHo Kang, Kyungsoo Chae","doi":"10.1109/ARFTG.2019.8637228","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637228","url":null,"abstract":"Conventionally used contact probes for testing printed circuit boards will have physical limitations that can pose serious issues with increasing circuit density. Also as the test scheme requires that the fabrication of a product be finished before testing, malfunctioning process parameters cannot be tuned in real time. This study proposes a novel solution to these issues employing a modified coupled-strip transmission line structure that has a potential to be used in a production-level instrument for testing printed circuits after stacking each layer. The experiment shows that common circuit defects such as opens, shorts, and via opens can be detected in a non-contact manner that can solve all the issues imposed by current contact-probe method.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132645869","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
3D Reflectometer Design for Embedded RF Vector Measurement 嵌入式射频矢量测量的三维反射计设计
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637220
Hana S. Mohamed, A. Kouki
{"title":"3D Reflectometer Design for Embedded RF Vector Measurement","authors":"Hana S. Mohamed, A. Kouki","doi":"10.1109/ARFTG.2019.8637220","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637220","url":null,"abstract":"A novel 3D 4-port non-directional reflectometer for measuring complex reflection coefficients is proposed. The proposed reflectometer features two optimized non-directional sniffers positioned below a transmission line with buried lines to carry the sniffed signals to power detectors in LTCC technology. Vertical transitions from the buried lines to surface microstrip lines are designed and optimized. 3D electromagnetic field simulations are used to optimize the proposed design. A prototype of the proposed reflectometer is fabricated and used to measure 45 different complex loads. The obtained results show excellent agreement with VNA measurements showing errors below 0.3 dB for amplitude and below 3° for phase.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116072667","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Presenter Biographies 主持人传记
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/arftg.2019.8637247
Rebecca Ferrini, Jessica Harback, Kimberly Harrell, Amy Holden
{"title":"Presenter Biographies","authors":"Rebecca Ferrini, Jessica Harback, Kimberly Harrell, Amy Holden","doi":"10.1109/arftg.2019.8637247","DOIUrl":"https://doi.org/10.1109/arftg.2019.8637247","url":null,"abstract":"Alun is founder and Director of Horizon Scanning Ltd, a London-based strategy startup helping public and private sector clients develop robust strategies and ambitious plans for the future. In 2005 he was part of the team that set up the UK’s Horizon Scanning Centre, based at the Foresight unit in the Government Office for Science. He worked at the Centre until 2011, running projects such as International Futures, The Future of World Trade, and Technology and Innovation Futures, on behalf of the major government departments. The International Futures project was described by the Permanent Secretaries Strategy Group as “emblematic of how horizon scanning could be used to develop strategic thinking”. He commissioned and edited The Sigma Scan, a unique repository of horizon scanning articles relevant to public policy, and published a Guidance note on scenario planning in government. He has run a series of 2-day courses on horizon scanning and scenario planning for the European Commission, and has been invited to speak on his scenario work at IFRI in Paris and SWP in Berlin.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132544719","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Microwave Measurement Needs for 5G Panel Session 5G分组会议的微波测量需求
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/arftg.2019.8637227
{"title":"Microwave Measurement Needs for 5G Panel Session","authors":"","doi":"10.1109/arftg.2019.8637227","DOIUrl":"https://doi.org/10.1109/arftg.2019.8637227","url":null,"abstract":"","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125263739","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Next Generation Microwave and Millimeter-Wave Measurement Techniques 下一代微波和毫米波测量技术
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637248
K. Remley
{"title":"Next Generation Microwave and Millimeter-Wave Measurement Techniques","authors":"K. Remley","doi":"10.1109/ARFTG.2019.8637248","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637248","url":null,"abstract":"New wireless technology includes highly integrated, multiple-antenna arrays, making over-the-air (OTA) test and measurement a necessity. Industry and standards groups are facing challenges from the need for accurate, repeatable OTA measurements at both microwave and millimeter-wave frequencies. We focus on current and proposed approaches for characterizing wireless devices having integrated multiple-element arrays, including the use of reference fields in which the source chain is fully characterized. Such reference fields can be used to characterize receivers and, ultimately, to assess OTA test methods, eliminating ambiguities as to the origin of various impairments.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"241 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123341709","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Load Pull Bias Tee 负载拉偏三通
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/arftg.2019.8637238
G. Bouisse, Julien Gonzalez
{"title":"Load Pull Bias Tee","authors":"G. Bouisse, Julien Gonzalez","doi":"10.1109/arftg.2019.8637238","DOIUrl":"https://doi.org/10.1109/arftg.2019.8637238","url":null,"abstract":"Load-Pull measurement of high power devices requires the insertion of broadband impedance transformer jig between the connectorised set-up and the device under test. For stability and baseband impedance reasons, the biasing scheme is also implemented on the DUT side of these transformer circuits, and requires surface mount device format inductors and capacitors. The combined presence of the transformer and biasing circuit leads to some de-embedding inaccuracies as the broadband characterization of the transformer is altered by the biasing circuit. This paper describes how to improve the situation by splitting biasing and impedance transformation through the insertion of a load pull specific bias tee, which design is presented as well as its performance.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126887373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Causal Characteristic Impedance Determination Using Calibration Comparison and Propagation Constant 利用校准比较和传播常数确定因果特性阻抗
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637225
S. Amakawa, A. Takeshige, S. Hara, R. Dong, Sangyeop Lee, T. Yoshida, M. Fujishima, K. Masu, Hiroyuki Ito
{"title":"Causal Characteristic Impedance Determination Using Calibration Comparison and Propagation Constant","authors":"S. Amakawa, A. Takeshige, S. Hara, R. Dong, Sangyeop Lee, T. Yoshida, M. Fujishima, K. Masu, Hiroyuki Ito","doi":"10.1109/ARFTG.2019.8637225","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637225","url":null,"abstract":"It is common to determine the characteristic impedance <tex>${Z}_{0}$</tex> of a low-loss transmission line using the measured propagation constant <tex>$gamma$</tex> through <tex>${Z}_{0}=gamma/({G}+mathrm{j}omega {C})$</tex>, assuming that the parallel conductance <tex>${G}=0$</tex> and that the parallel capacitance <tex>$C$</tex> is constant. However, if the line is a coplanar waveguide or a microstrip, two dielectrics (substrate and air) are involved and its effective dielectric constant is frequency-dependent, which makes <tex>$C$</tex> also frequency-dependent. If so, the assumption <tex>$G=0$</tex> is inconsistent with causality constraints. This paper presents an attempt at determining <tex>${Z}_{0}$</tex> by augmenting the above method in a way consistent with causality. A method of calibration comparison with 2nd-tier multiline TRL is used to extract <tex>${Z}_{0,text{meas}}$</tex> and <tex>$gamma_{text{meas}}$</tex>, following 1st-tier probe-tip calibration that is assumed to be valid at least up to 67 GHz. Then, a causal model, <tex>${Y}_{mathrm{p},mathrm{model}}$</tex>, of parallel admittance <tex>${G}(omega)+mathrm{j}omega {C}(omega)$</tex> is built from <tex>${Y}_{mathrm{p}}^{prime}=gamma_{text{meas}}/{Z}_{0,text{meas}} (underset{sim}{<} 67$</tex> GHz) by network synthesis. <tex>${Y}_{mathrm{p},mathrm{model}}$</tex> and <tex>$gamma_{text{meas}}$</tex> are then used to determine <tex>${Z}_{0}$</tex> including <tex>$underset{sim}{>} 67$</tex> GHz. The method is applied to a CMOS transmission line from 20 MHz to 220 GHz. A well-built model gives well-behaved and plausible estimate of causal <tex>${Z}_{0}$</tex> over the entire measurement frequency range.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129329347","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Three-Port Vector-Network-Analyzer Calibrations Using the NIST Microwave Uncertainty Framework 使用NIST微波不确定度框架的三端口矢量网络分析仪校准
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637226
J. Jargon, Dylan F. Williams, A. Sanders
{"title":"Three-Port Vector-Network-Analyzer Calibrations Using the NIST Microwave Uncertainty Framework","authors":"J. Jargon, Dylan F. Williams, A. Sanders","doi":"10.1109/ARFTG.2019.8637226","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637226","url":null,"abstract":"We have implemented methods for calibrating three-port vector network analyzers (VNAs) and propagating correlated uncertainties using the NIST Microwave Uncertainty Framework. We describe our calibration procedures, which utilize measured wave-parameters rather than scattering parameters to account for switch-term corrections, and present results for a three-port power splitter. We compare our calibrated measurements with those performed using the firmware of a commercial VNA, and show the results agree to within our confidence intervals at most frequencies.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130628602","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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